A pseudo-resistor structure, comprises: a first and a second PMOS transistor or PN diode configured as two-terminal devices, wherein the positive terminal of the first PMOS transistor or PN diode is connected to the positive terminal of the second PMOS transistor or PN diode, and wherein the negative terminal of the first PMOS transistor or PN diode is connected to an input (A) of the pseudo-resistor structure and wherein the negative terminal of the second PMOS transistor or PN diode is connected to an output (C) of the pseudo-resistor structure, and a dummy transistor or dummy diode connected to the input (A), wherein the dummy transistor or dummy diode is further connected to a bias voltage for compensating a leakage current through the first and the second PMOS transistors or PN diodes. A closed-loop operational amplifier circuit comprising the pseudo-resistor structure is provided. Also, a bio-potential sensor comprising the closed-loop operational amplifier circuit is provided.

A current integrator includes an operational amplifier, an integration capacitor and an offset cancelation capacitor. The operational amplifier includes a first input stage and a second input stage. The first input stage is coupled to an input terminal of the current integrator. The integration capacitor is coupled between the first input stage of the operational amplifier and an output terminal of the current integrator. The offset cancelation capacitor is coupled to the second input stage of the operational amplifier.

An impedance measurement circuit for determining a sense current of a guard-sense capacitive sensor operated in loading mode. The circuit includes a periodic signal voltage source for providing a periodic measurement voltage, a sense current measurement circuit, a differential amplifier that is configured to sense a complex voltage difference between the sense electrode and the guard electrode, a demodulator for obtaining, with reference to the periodic measurement voltage, an in-phase component and a quadrature component of the sensed complex voltage difference, and control loops for receiving the in-phase component and the quadrature component, respectively. An output signal of the first control loop and an output signal of the second control loop are usable to form a complex voltage that serves as a complex reference voltage for the sense current measurement circuit.

A feedback stage for an integrator circuit is provided. The integrator receives a first input current and a second input current that include respective measurement current components and an offset current component. The integrator integrates the first input current and the second input current and generates a first output voltage and a second output voltage. The feedback stage including a transconductance amplifier detects a difference between the first output voltage and the second output voltage and sinks or sources a first output current and a second output current based on the difference between the first output voltage and the second output voltage. The first output current is additively combined with the first input current and the second output current is additively combined with the second input current to mitigate the offset current component at an input of the integrator.

A pixel circuit includes a differential amplifier. The differential amplifier includes a non-inverting input terminal, an inverting input terminal, and an output terminal. The differential amplifier includes an input differential pair including first and second NMOS transistors, a current mirror pair including PMOS transistors, and a constant current source including a fifth NMOS transistor. A threshold voltage of each of the first and second NMOS transistors is higher than a threshold voltage of the fifth NMOS transistor. Further, the threshold voltage of each of the first and second NMOS transistors is higher than a threshold voltage of another NMOS transistor.

A circuit arrangement comprises a first input node, a first output node, a sampling capacitor means and a first switching means being switchable between a first switching state and a second switching state. The first switching means is coupled to the sampling capacitor means, the first input node and the first output node in such a way that the sampling capacitor means is conductively connected to the first input node and disconnected from the first output node in the first switching state and the sampling capacitor means is disconnected from the first input node and conductively connected to the first output node in the second switching state. A first charge-storing element is coupled via a second switching means to the first input node in such a way that the charge-storing element is charged in the first switching state and discharged in the second switching state, thereby at least partly compensating current flow for charging the sampling capacitor means in the first switching state.

A feedback stage for an integrator circuit is provided. The integrator receives a first input current and a second input current that include respective measurement current components and an offset current component. The integrator integrates the first input current and the second input current and generates a first output voltage and a second output voltage. The feedback stage including a transconductance amplifier detects a difference between the first output voltage and the second output voltage and sinks or sources a first output current and a second output current based on the difference between the first output voltage and the second output voltage. The first output current is additively combined with the first input current and the second output current is additively combined with the second input current to mitigate the offset current component at an input of the integrator.

An amplifier arrangement has a first differential stage with a first transistor pair, a second differential stage with a first and a second transistor pair, each pair having a common source connection. The amplifier arrangement further has a first complementary differential stage with a transistor pair having opposite conductivity type, and a second complementary differential stage with a first and a second transistor pair of the complementary conductivity type. The first and the second complementary differential stage are connected symmetrically compared to the first and the second differential stage. The transistors of the second differential stage and the second complementary differential stage are symmetrically connected to form respective first, second, third and fourth current paths. A pair of output terminals is coupled to the first and the fourth current path. Gate terminals of the transistors are coupled to a respective pair of input terminals.

A circuit includes a plurality of first stage integrators. Each of the plurality of first stage integrators includes a first input, a second input, a third input and an output. The first input of each of the plurality of first stage integrators is coupled to a different one of circuit inputs, the second input is coupled to a first reference input, the third input is coupled to a second reference input and the output of each of the plurality of first stage integrators is coupled to the first input of such first stage integrator. The circuit includes a second stage integrator which includes a first input coupled to each of the first inputs of the plurality of first stage integrators, a second input coupled to the first reference input, and an output coupled to the first input of the second stage integrator.

An apparatus for reducing a temperature influence in measuring a switching current based on stray inductance. The apparatus includes a current detector configured to output a voltage derived from a differential component of a current so as to detect a switching current of a power module, a filter configured to filter the voltage output from the current detector, an integrator configured to integrate a voltage output from the filter, an ADC configured to convert an analog voltage output from the integrator into a digital voltage and sample the digital voltage, a scaler configured to convert a sampled integrator output value output from the ADC into a scaled current value, and a compensator configured to remove a temperature dependent DCR effect from the scaled current value.