A switched capacitor amplifier circuit includes an operational amplifier, a first capacitor and a second capacitor each having one end connected to a negative input terminal of the operational amplifier, a first switching circuit configured to connect the other end of the first capacitor and a signal source during a first operation, a second switching circuit configured to connect the other end of the second capacitor and the output terminal of the operational amplifier so as to connect the output terminal and the negative input terminal of the operational amplifier through the second capacitor during the second operation, and an impedance converter circuit configured to convert an output impedance of the signal source into a specified impedance, the impedance converter circuit being connected between the first switching circuit and the other end of the first capacitor.

A circuit includes a first transconductance stage having an output. The circuit further includes an output transconductance stage, and a first source-degenerated transistor having a first control input and first and second current terminals. The first control input is coupled to the output of the first transconductance stage. The circuit also includes a second transistor having a second control input and third and fourth current terminals. The third current terminal is coupled to the second current terminal and to the output transconductance stage.

In examples, an apparatus for sensing current comprises a power transistor; a sense transistor coupled to the power transistor; and an offset addition circuit coupled to the power transistor and the sense transistor, the offset addition circuit comprising a first pair of transistors and a differential amplifier. The apparatus also comprises a cascode amplifier circuit coupled to the offset addition circuit, the cascode amplifier circuit comprising a second pair of transistors, and a gain trim circuit coupled to the cascode amplifier circuit, the gain trim circuit including another differential amplifier and a third transistor. The apparatus further includes an analog-to-digital converter (ADC) coupled to the gain trim circuit and storage coupled to the ADC.

A circuit includes a first transistor having a first control input and first and current terminals. The circuit also includes a second transistor having a second control input and third and fourth current terminals. The third current terminal couples to the first current terminal at a first node. An output stage has a first input, a second input, and an output stage output. The first input couples to the fourth current terminal, and the second input couples to the second current terminal. A resistor has first and second resistor terminals. The first resistor terminal couples to the output stage output, and the second resistor terminal couples to the second control input. A third transistor has a third control input, a fifth current terminal, and a sixth current terminal. The fifth current terminal couples to the first resistor terminal, and the sixth current terminal couples to the second resistor terminal.

A superposition operation circuit and a float-voltage digital-to-analog conversion circuit to superpose analog elements according to an indirect current superposition principle, where a voltage follower is implemented using a first operational amplifier such that an output end of the voltage follower is clamped to a voltage that is input to a positive-phase input end, namely, a to-be-superposed analog element. Then a current generation circuit converts a voltage signal to a current signal, a voltage drop for the current signal is generated on a first resistor coupled to an output end of the first operational amplifier, and the voltage drop is superposed on a voltage signal output by the first operational amplifier.

A power detector with wide dynamic range. The power detector includes a linear detector, followed by a voltage-to-current-to-voltage converter, which is then followed by an amplification stage. The current-to-voltage conversion in the converter is performed logarithmically. The power detector generates a desired linear-in-dB response at the output. In this power detector, the distribution of gain along the signal path is optimized in order to preserve linearity, and to minimize the impact of offset voltage inherently present in electronic blocks, which would corrupt the output voltage. Further, the topologies in the sub-blocks are designed to provide wide dynamic range, and to mitigate error sources. Moreover, the temperature sensitivity is designed out by either minimizing temperature variation of an individual block such as the v-i-v detector, or using two sub-blocks in tandem to provide overall temperature compensation. In one aspect, active resistors are used in order to compensate for temperature variations.

Radio Frequency (RF) amplifier design with RFIC suffers gain variations from gain variations due to wafer process variations, temperature changes, and supply voltage changes. Three methods are proposed to achieve constant amplifier gain, either through on-chip wafer calibration, or self-calibration. Through automatic adjustment of amplifier bias current, the proposed methods maintain constant amplifier gain over process, temperature, supply voltage variations. Under the proposed Method 1, a constant transconductance Gm with enhanced gain accuracy is maintained via wafer calibration. Under the proposed Method 2, a constant transconductance Gm is maintained by time-domain averaging through different transistors. Under the proposed Method 3, a constant Gm*R or RF gain is maintained considering the impedance of a matching network of the RF amplifier.

Included are a loop filter, a quantization circuit section, and a current steering digital-analog conversion section. The quantization circuit section converts a loop filter output into a digital value. The current steering digital-analog conversion section is provided in a feedback loop that feeds back the output of the quantization circuit section to the loop filter. Then, each of the analog-digital converters includes a first input signal current path, a second input signal current path, a first feedback current path, and a second feedback current path. The first input signal current path feeds a first input signal current to an input end of a first stage integrator of the loop filter. The second input signal current path feeds a second input signal current, a current opposite in sign to the first input signal current, to an input end of a second stage integrator of the loop filter. The first feedback current path connects one feedback output end of the current steering digital-analog conversion section to the input end of the first stage integrator of the loop filter. The second feedback current path connects other feedback output end of the current steering digital-analog conversion section to the input end of the second stage integrator of the loop filter.

The invention provides a Low-voltage Differential Signaling (LVDS) receiver circuit that comprises a folded-cascode operational transconductance amplifier (OTA) that includes a pair of input branches and a pair of output branches. The pair of input branches of the folded-cascode OTA includes a p-channel metal-oxide semiconductor (PMOS) input transistor pair connected to a first supply voltage domain. The pair of output branches includes an output circuit connected to a second supply voltage domain. The LVDS receiver circuit further includes a common-mode feedback circuit connected to the pair of output branches of the folded-cascode OTA that controls the second supply voltage domain. The LVDS receiver circuit further includes a regenerative buffer circuit connected to the pair of output branches of the folded-cascode OTA and an output generated from the pair of output branches of the folded-cascode OTA directly operates the regenerative buffer circuit to produce a distortion-free output signal.

A phased-locked loop (PLL) includes a first oscillator supplying a first oscillator signal with a first jitter component and a second oscillator supplying a second oscillator signal with a second jitter component. The second jitter component is higher than the first jitter component. A selector circuit selects either the first oscillator signal or the second oscillator signal as the PLL output signal. The first oscillator signal and the second oscillator signal may have different frequencies with the lower frequency signal having more jitter. The oscillator producing the signal with less jitter utilizes more power. A continuous time delta-sigma modulator analog-to-digital converter (ADC) receives the PLL output signal as an input clock signal. A high gain setting of an amplifier supplying an input signal to the ADC selects a lower jitter signal input clock signal and a lower gain setting selects a higher jitter input clock signal.