An image sensor and an operating method of the image sensor are provided. An image sensor includes a pixel array including a plurality of pixels, a ramp signal generator configured to generate a first ramp signal, a buffer including an amplifier of a super source follower structure and outputting a second ramp signal obtained by buffering the first ramp signal, and an analog-to-digital conversion circuit configured to compare a pixel signal output from the pixel array with the second ramp signal and converting the pixel signal to a pixel value.

The present application provides a capacitance detection circuit, which could reduce the influence of screen noise on capacitance detection. The capacitance detection circuit includes: an amplification circuit connected to the capacitor to be detected, and configured to convert a capacitance signal of the capacitor to be detected into a voltage signal, the voltage signal being associated with the capacitance of the capacitor to be detected; and a control circuit connected to the amplification circuit, and configured to control an amplification factor of the amplification circuit to be a first amplification factor in a first period, and to control the amplification factor of the amplification circuit to be a second amplification factor in a second period, where noise generated by the screen in the first period is less than noise generated by the screen in the second period, and the first amplification factor is greater than the second amplification factor.

The present invention provides a circuit having a filter with an amplifier circuit for filtering and amplifying an input signal to generate an output signal, wherein a corner frequency of the filter is adjustable to control a settling time of the output signal.

A circuit includes a binary weighted divider having a first set of switches coupled in series between an input node and a feedback node. The first set of switches is configured to set a feedback voltage at the feedback node in response to activating or deactivating respective switches in the first set of switches. A set of compensation switches is coupled to the first set of switches. The set of compensation switches is configured to reduce resistance of one or more of the respective switches in the first set of switches that are activated by activating one or more switches in the set of compensation switches to provide one or more respective parallel current paths for each of the switches in the first set of switches that are activated.

Amplifier systems for measuring a wide range of current are provided herein. In certain embodiments, an amplifier system includes a controllable sensing circuit, a first amplifier including an output configured to drive a device under test (DUT) through the controllable sensing circuit, and a second amplifier including an input coupled to the controllable sensing circuit and operable to generate a measurement signal indicating an amount of measured current of the DUT. The amplifier system further includes a control circuit operable to control a configuration or mode of the controllable sensing circuit suitable for a particular type of DUT.

A resolver signal processing circuit for amplifying two phase signals output from a resolver includes first and second amplifier circuits configured to adjust an input in-phase voltage range to output an intended voltage even when a short-circuit arises in the resolver. The resolver signal processing circuit further includes first and second short-circuit detection circuits configured to detect the short-circuit arising in the resolver and short-circuits in first and second signal input paths from the resolver to the first and the second amplifier circuits, respectively, and first and second voltage adjusting units configured to adjust input in-phase voltage ranges of the first and second amplifier circuits when the first and second short-circuit detection circuits detect short-circuits, respectively. The first and second amplifier circuits are configured to adjust the input in-phase voltage ranges, respectively.

The present application discloses an amplifier circuit, a chip and an electronic device, which generates a positive output signal and a negative output signal according to a positive input signal and a negative input signal, wherein the positive input signal and the negative input signal have a corresponding input differential-mode voltage and input common-mode voltage, and the positive output signal and the negative output signal have a corresponding output differential-mode voltage and output common-mode voltage, and the amplifier circuit includes: an amplifying unit, configured to receive the positive input signal and the negative input signal and generate the positive output signal and the negative output signal; and an attenuation unit, including: a positive common-mode capacitor and a negative common-mode capacitor, configured to attenuate the input common-mode voltage below a first specific frequency.

The present disclosure provides an inductive magnetic sensor, which includes a signal pre-amplifying measurement circuit, a feedback loop, a magnetic core and coil group, a low-noise autozero processing circuit, and an output protection module. The magnetic core and coil group is electrically connected between the signal pre-amplifying measurement circuit and the feedback loop, the signal pre-amplifying measurement circuit comprises the low-noise autozero processing circuit, and the feedback loop and the low-noise autozero processing circuit are electrically connected to the output protection module respectively. By introducing the resonant notch filter, it may extend the passband to the low frequency, and extend the low-frequency characteristic of the magnetic sensor, to obtain a better low-frequency magnetic sensor. The present disclosure further provides an electromagnetic prospecting equipment.

A provided impedance measuring semiconductor circuit can suppress the influence of sensors on the measurements of other sensors in the measurements of the sensors. According to an embodiment, an impedance measuring semiconductor circuit includes a first resistance element, an operational amplifier having a positive input terminal and an output terminal, the positive input terminal receiving a predetermined set voltage, the output terminal being coupled to one end of the first resistance element, a first output-side switch that electrically couples or decouples a first sensor and the other end of the first resistance element, a second output-side switch that electrically couples or decouples a second sensor and the other end of the first resistance element, a first input-side switch that electrically couples or decouples the first sensor and a negative input terminal, and a second input-side switch that electrically couples or decouples the second sensor and the negative input terminal.

Provided are a semiconductor device and a sensor system capable of achieving improvement of noise resistance. Thus, an output circuit 106a in the semiconductor device includes: input terminals 207n, 207p; and an output terminal 208; an output amplifier 201 connecting the input terminals 207n, 207p to the output terminal 208; a feedback element 203 returning the output terminal 208 to the input terminal 207n; a switching transistor 204; and a resistance element 206. A drain of the switching transistor 204 is connected to the input terminal 207n. The resistance element 206 is provided between a back gate of the switching transistor 204 and a power source Vdd and has impedance of a predetermined value or more for suppressing noise of a predetermined frequency generated at the input terminal 207n.