A capacitive trans-impedance amplifier comprising a voltage amplifier having an inverting input terminal for connection to an input current source. A feed-back capacitor is coupled between the inverting input terminal and the output terminal to accumulate charges received from the input current source and to generate a feed-back voltage accordingly. A calibration unit includes a calibration capacitor electrically coupled, via a calibration switch, to the inverting input terminal and electrically coupled to the feed-back capacitor. The calibration unit is operable to switch the calibration switch to a calibration state permitting a discharge of a quantity of charge from the calibration capacitor to the feed-back capacitor. The capacitive trans-impedance amplifier is arranged to determine a voltage generated across the feed-back capacitor while the calibration switch is in the calibration state and to determine a capacitance value (C=Q/V) for the feed-back capacitor according to the value of the generated voltage (V) and the quantity of charge (Q).

An internal voltage offset between a positive input and a negative input of a first operational amplifier is compensated. The negative input and the positive input of the first operational amplifier are coupled at the same voltage level. A comparison current generated at an output of the first operational amplifier has a sign that is representative of a sign of the internal voltage offset. The output of the first operational amplifier is biased to a threshold voltage using a current-to-voltage converter. A control voltage is generated from a sum of the threshold voltage and a voltage conversion of the comparison current. Compensation for the internal voltage offset between the positive and negative inputs of the first operational amplifier is made dependent on the control voltage.

Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.

The present invention provides a detection circuit for a connection impedance and an electronic device. The detection circuit includes: a detection operational amplifier module, wherein the detection operational amplifier module includes: a first buffer, a switch unit, and a main operational amplifier; a first input terminal of the first buffer is connected to a first acquisition electrode through a first front-end circuit, an output terminal of the main operational amplifier is connected to a back-end circuit, and an output terminal of the first buffer is connected to a second input terminal of the first buffer; a first terminal of the switch unit is directly or indirectly connected to the first front-end circuit, and a second terminal of the switch unit is connected to the back-end circuit; and the switch unit is configured to: control the first front-end circuit to be directly connected to the back-end circuit, to form a straight-through channel.

The present invention relates to a sensing circuit with signal compensation, which comprises a first sensing element, a second sensing element and a differential amplifying circuit, the differential amplifying circuit generates an output signal through a differential compensation according to a common mode voltage, a first sensing signal and a second sensing signal. Hereby, reducing the noise of the sensing circuit is achieved, and the interference of the display driving signal may be effectively improved.

A capacitive trans-impedance amplifier comprising a voltage amplifier having an inverting input terminal for connection to an input current source. A feed-back capacitor is coupled between the inverting input terminal and the output terminal to accumulate charges received from the input current source and to generate a feed-back voltage accordingly. A calibration unit includes a calibration capacitor electrically coupled, via a calibration switch, to the inverting input terminal and electrically coupled to the feed-back capacitor. The calibration unit is operable to switch the calibration switch to a calibration state permitting a discharge of a quantity of charge from the calibration capacitor to the feed-back capacitor. The capacitive trans-impedance amplifier is arranged to determine a voltage generated across the feed-back capacitor while the calibration switch is in the calibration state and to determine a capacitance value (C=Q/V) for the feed-back capacitor according to the value of the generated voltage (V) and the quantity of charge (Q).

A readout circuit, an image sensor and an electronic device are provided, which could effectively reduce an area and power consumption of the image sensor. The readout circuit includes a plurality of capacitors, a switch circuit and an output circuit; where the plurality of capacitors are connected to the output circuit through the switch circuit; the plurality of capacitors are configured to store output signals of a plurality of pixel circuits, respectively; and the output circuit is configured to output signals stored by the plurality of capacitors through the switch circuit one-by-one.

According to an aspect, an auto-zero amplifier includes a main amplifier, a secondary amplifier connected to the main amplifier, a plurality of switching including a first switch and a second switch, and a leakage control circuit.

Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.

Aspects of the technology described herein relate to built-in self-testing (BIST) of circuitry (e.g., a pulser or receive circuitry) and/or transducers in an ultrasound device. A BIST circuit may include a transconductance amplifier coupled between a pulser and receive circuitry, a capacitor network coupled between a pulser and receive circuitry, and/or a current source couplable to the input terminal of receive circuitry to which a transducer is also couplable. The collapse voltages of transducers may be characterized using BIST circuitry, and a bias voltage may be applied to the membranes of the transducers based at least in part on their collapse voltages. The capacitances of transducers may also be measured using BIST circuitry and a notification may be generated based on the sets of measurements.