A capacitive sensor includes a first conductive structure and a second conductive structure that form a first capacitor having a first capacitance that changes in response to an external force acting thereon and includes a MEMS output configured to output a first sense signal representative of the first capacitance; a second capacitor coupled to the MEMS output and configured to output a second sense signal based on the first sense signal; an amplifier comprising an amplifier input and configured to output an amplified signal based on the second sense signal; and a diagnostic circuit configured to receive two measurement signals, generate an offset measurement based on the two measurement signals, and detect a fault on a condition that the offset measurement is outside of a threshold range.

A device receives a 1-bit amplitude-modulated input signal. The device includes a differential amplifier circuit with first and second differential inputs, wherein the first input is configured to receive the input signal and the second input is configured to receive a common-mode signal having a variable value. The device also includes a circuit for modifying the value of the common-mode signal as a function of the value of an output signal of the receiver device obtained from an output signal of the differential amplifier circuit.