There is provided a wafer processing method for dividing a wafer having a plurality of devices formed in regions partitioned by a plurality of crossing division lines on a front surface of a substrate having a birefringent crystal structure, into individual device chips. The wafer processing method includes a detection step of detecting the division line formed on the front surface of the wafer by an imaging unit from the back side of the wafer. In the detection step, a polarizer disposed on an optical axis connecting an imaging element and an image forming lens provided in the imaging unit intercepts extraordinary light appearing due to birefringence in the substrate and guides ordinary light to the imaging element.

Trim layers that are configured to adjust one or more operating parameters for surface acoustic wave (SAW) devices are disclosed. A SAW device may include an interdigital transducer (IDT) and a piezoelectric material that are configured to generate an acoustic wave and a trim layer that has an acoustic velocity and a density that correspond to a velocity of the acoustic wave. In this manner, the trim layer may be configured to adjust an electromechanical coupling of the SAW device without significantly impacting a resonance frequency of the SAW device. The SAW device may also include an additional trim layer that is configured to adjust a coupling percentage and the resonance frequency of the SAW device. A SAW device may include a trim layer that is configured to adjust certain operating parameters by greater amounts than other operating parameters.

Methods and apparatuses for measuring a phase noise level in an input signal are disclosed. An input signal can be delayed to generate a delayed version of the input signal. Next, a phase difference can be detected between the input signal and the delayed version of the input signal. A phase noise level in the input signal can then be determined based on the detected phase difference. The measured phase noise level can then be used to suppress phase noise in the input signal.

The invention relates to an acousto-optic deflector comprising a bulk of acousto-optic medium and acoustic wave generator coupled to the bulk, characterised by that the acoustic wave generator comprises at least two different electro-acoustic transducers for generating acoustic waves in the bulk.

A filter component with a passive element includes a filter substrate, an elastic wave filter including an elastic wave resonator in a predetermined region of one main surface of the filter substrate, and a support substrate on another main surface of the filter substrate, wherein a passive element is provided in or on a support substrate, the passive element includes a wiring electrode and is electrically connected to the elastic wave filter.

For a reactance filter constructed from serial and parallel resonators, in order to improve the linearity, it is proposed to connect a capacitor in series or in parallel either with a parallel resonator or a cascade of parallel resonators or with a series resonator or a cascade of series resonators.

An electroacoustic transducer has reduced loss due to acoustic waves emitted in the transverse direction. For this purpose, a transducer comprises a central excitation area, inner edge areas flanking the central excitation area, outer edge areas flanking the inner edge areas, and areas of the busbar flanking the outer edge areas. The longitudinal speed of the areas can be set so that the excitation profile of a piston mode is obtained.

An acoustic wave device includes: a first chip that includes a first substrate, and a first filter formed on a first surface of the first substrate; and a second chip that includes a second substrate, and a second filter formed on a second surface of the second substrate, the second surface being located in a plane different from the first surface.

Methods and apparatuses for measuring a phase noise level in an input signal are disclosed. An input signal can be delayed to generate a delayed version of the input signal. Next, a phase difference can be detected between the input signal and the delayed version of the input signal. A phase noise level in the input signal can then be determined based on the detected phase difference. The measured phase noise level can then be used to suppress phase noise in the input signal.

At least one of a transmission filter and a reception filter of a duplexer includes a piezoelectric substrate, an elastic wave filter electrode portion on the piezoelectric substrate and including ground terminals to be connected to a ground potential, a support layer provided on the piezoelectric substrate, a cover provided on the support layer to seal a cavity in the support layer, and via hole electrodes penetrating the support layer and the cover and including first and second ends. The ground terminals are commonly connected on the piezoelectric substrate, and the ground terminals are electrically connected to the respective first ends of the plurality of via hole electrodes. The second ends of the via hole electrodes are connected to the ground potential outside of the at least one of the transmission filter and the reception filter.