The present disclosure relates to an oscillator including a charge and discharge circuit which generates a first oscillation signal according to a clock signal using a first constant current and a second oscillation signal according to an inverted clock signal using a second constant current, an integrating circuit which generates a first comparison voltage reflecting an amount of change in the first oscillation signal based on a comparison reference voltage and a second comparison voltage reflecting an amount of change in the second oscillation signal based on the comparison reference voltage, and a comparison circuit which generates the clock signal and the inverted clock signal according to a result of comparison between the first oscillation signal and the first comparison voltage and a result of comparison between the second oscillation signal and the second comparison voltage.

The present disclosure relates to an oscillator including a charge and discharge circuit which generates a first oscillation signal according to a clock signal using a first constant current and a second oscillation signal according to an inverted clock signal using a second constant current, an integrating circuit which generates a first comparison voltage reflecting an amount of change in the first oscillation signal based on a comparison reference voltage and a second comparison voltage reflecting an amount of change in the second oscillation signal based on the comparison reference voltage, and a comparison circuit which generates the clock signal and the inverted clock signal according to a result of comparison between the first oscillation signal and the first comparison voltage and a result of comparison between the second oscillation signal and the second comparison voltage.

Provided is a semiconductor integrated circuit including an oscillation circuit configured to output an oscillation signal, a heater configured to heat the oscillation circuit, a temperature sensor configured to detect a temperature of the oscillation circuit, and a nonvolatile memory configured to store temperature correction data. The oscillation circuit controls a frequency of the oscillation signal based on an output signal of the temperature sensor and the temperature correction data.

Provided is a semiconductor integrated circuit including an oscillation circuit configured to output an oscillation signal, a heater configured to heat the oscillation circuit, a temperature sensor configured to detect a temperature of the oscillation circuit, and a nonvolatile memory configured to store temperature correction data. The oscillation circuit controls a frequency of the oscillation signal based on an output signal of the temperature sensor and the temperature correction data.

An apparatus comprises a first circuit, a second circuit, a first transistor, a second transistor, a third transistor, a first programmable resistance, and a second programmable resistance. The first circuit may be configured to generate a reference signal and a bias signal in response to a supply voltage and a first input signal. The first circuit generally provides supply noise rejection to variations in the supply voltage. The second circuit may be connected to the first circuit and a ring oscillator. The first transistor may be connected to the first circuit and configured to set a first reference current of the first circuit based on the first input signal and the first programmable resistance. The second transistor may be connected in parallel with the first transistor. The second transistor is generally diode-connected. The third transistor may be connected to the first circuit and configured to set a second reference current of the first circuit based on the first input signal and the second programmable resistance. The first circuit generally forms a current mirror with the second circuit. The second circuit may be configured to provide a programmable current ratio for the current mirror based on a value of a second input signal.

An apparatus comprises a first circuit, a second circuit, a first transistor, a second transistor, a third transistor, a first programmable resistance, and a second programmable resistance. The first circuit may be configured to generate a reference signal and a bias signal in response to a supply voltage and a first input signal. The first circuit generally provides supply noise rejection to variations in the supply voltage. The second circuit may be connected to the first circuit and a ring oscillator. The first transistor may be connected to the first circuit and configured to set a first reference current of the first circuit based on the first input signal and the first programmable resistance. The second transistor may be connected in parallel with the first transistor. The second transistor is generally diode-connected. The third transistor may be connected to the first circuit and configured to set a second reference current of the first circuit based on the first input signal and the second programmable resistance. The first circuit generally forms a current mirror with the second circuit. The second circuit may be configured to provide a programmable current ratio for the current mirror based on a value of a second input signal.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

Analog calibration (ACAL) circuits supporting iterative measurement of an input signal from a measured circuit, and related methods are disclosed. The ACAL circuit includes a voltage reference generation circuit and a comparator circuit. The voltage reference generation circuit is configured to provide an input reference voltage. The comparator circuit is configured to compare the input reference voltage to an input circuit voltage of a measured circuit and generate a digital measurement signal based on the comparison. To provide for the ACAL circuit to more precisely measure the input circuit voltage, the voltage reference generation circuit is programmable and is configured to a generate the input reference voltage based on a programmed reference voltage selection. In this manner, the ACAL circuit can be used to measure the input circuit voltage in an iterative manner based on different programmed input reference voltages for a more precise measurement of the input circuit voltage.

A galvanically isolated gate driver for a power transistor is disclosed. The gate driver provides various temperature protection features that are enabled by (i) diagnostic circuitry to generate fault signals and monitoring signals, (ii) signal processing to enable communication over a shared communication channel across an isolation barrier, (iii) signal processing to reduce operating current needed for real-time thermal monitoring, and (iv) a disable circuit for unused temperature sensing pins.

A galvanically isolated gate driver for a power transistor is disclosed. The gate driver provides various temperature protection features that are enabled by (i) diagnostic circuitry to generate fault signals and monitoring signals, (ii) signal processing to enable communication over a shared communication channel across an isolation barrier, (iii) signal processing to reduce operating current needed for real-time thermal monitoring, and (iv) a disable circuit for unused temperature sensing pins.