H03K2005/00019

MEASURING PIN-TO-PIN DELAYS BETWEEN CLOCK ROUTES
20220209760 · 2022-06-30 ·

A delay measurement circuit includes a first skew circuit disposed proximate to a first bonding pad configured to receive a first clock signal having a first frequency. The delay measurement circuit includes a second skew circuit disposed proximate to a second bonding pad configured to receive a second clock signal having a second frequency. The first and second skew circuits each have a first mode of operation as zero-delay-return path and a second mode of operation as a synchronized pass path. The delay measurement circuit includes a pair of conductive traces coupled to the first skew circuit, another pair of conductive traces coupled to the second skew circuit, a time-to-digital converter circuit, and a switch circuit configured to selectively couple the time-to-digital converter circuit to the first skew circuit via the pair of conductive traces and the second skew circuit via the other pair of conductive traces.

CLOCK SWEEPING SYSTEM

A clock sweeping system includes multiple delay elements and a selection circuit. The delay elements are configured to generate multiple delayed clock signals. Each delay element is configured to receive an input signal and delay the input signal to generate a corresponding first delayed clock signal. The input signal is one of a first clock signal, a second clock signal, and a corresponding output signal generated by a previous delay element. The selection circuit is configured to select and output, based on a first select signal for a plurality of times, a corresponding second delayed clock signal as a first output clock signal. The selection circuit is further configured to select and output, based on a second select signal, one of the first and second clock signals as a second output clock signal. The first output clock signal is asynchronous with respect to the second output clock signal.

GAIN MISMATCH CORRECTION FOR VOLTAGE-TO-DELAY PREAMPLIFIER ARRAY

A method of using an analog-to-digital converter system includes receiving a sampled voltage corresponding to one of an input voltage and a known voltage, causing preamplifiers to generate output signals based on the sampled voltage, generating first and second signals based on the output signals, causing a delay-resolving delay-to-digital backend to generate a single-bit digital signal representing an order of receipt of the first and second signals, and adjusting one or more of the preamplifiers based on the digital signal. The disclosure also relates to a system which includes a voltage-to-delay frontend and a delay-resolving backend, and to a method which includes causing a delay comparator to generate a single-bit digital signal representing an order of receipt of input signals, causing the comparator to transmit a residue delay signal to a succeeding comparator, and transmitting a signal to adjust one or more of the preamplifiers based on the digital signal.

Semiconductor apparatus including power gating circuits
11374568 · 2022-06-28 · ·

A semiconductor apparatus may include logic circuits and a control logic. The control logic may be configured to monitor characteristics of the logic circuits to allow the semiconductor apparatus to perform at different operating speeds.

Sensor device
11372036 · 2022-06-28 · ·

A sensor device includes a sensor unit that generates a detection signal having the same detection frequency as an entered sinusoidal analog signal and matching a physical quantity to be detected; a reference signal generating unit that generates a reference signal having the detection frequency, according to the entered analog signal; converting units that convert the detection signal and reference signal to digital signals in synchronization with a clock signal; a demodulating unit that multiplies the digital detection signal by each of two sinusoidal synchronization signals having the detection frequency, the phases of the two synchronization signals being shifted from each other by one-fourth of a cycle, and generates two demodulated signals free from a harmonic component; and a correcting unit that corrects the demodulated signals according to the digital reference signal so as to suppress variations, in the demodulated signals, caused by variations in the clock signal phase.

Systems and methods for synchronizing multiple test and measurement instruments

A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.

Analog delay cell having continuous adjustable delay time

A delay cell includes a cascode transistor and an inverter. The cascode transistor is used to receive a control voltage to generate a bias current, and includes a source terminal, a drain terminal, and a gate terminal receiving the control voltage. The inverter is coupled to the cascode transistor and used to generate an output signal according to the bias current in response to an input signal.

Data path dynamic range optimization

Systems and methods are disclosed for full utilization of a data path's dynamic range. In certain embodiments, an apparatus may comprise a circuit including a first filter to digitally filter and output a first signal, a second filter to digitally filter and output a second signal, a summing node, and a first adaptation circuit. The summing node combine the first signal and the second signal to generate a combined signal at a summing node output. The first adaptation circuit may be configured to receive the combined signal, and filter the first signal and the second signal to set a dynamic amplitude range of the combined signal at the summing node output by modifying a first coefficient of the first filter and a second coefficient of the second filter based on the combined signal.

Circuit and method for adaptively eliminating ringing in signals driving capacitive loads

A control signal may be produced in response to an assertion of a switch signal by asserting the control signal, waiting an adaptive delay after the assertion of the switch signal, de-asserting the control signal in response to the expiration of the adaptive delay, and re-asserting the control signal in response to a current generated according to the control signal becoming zero. The adaptive delay may be adjusted according to a voltage generated using the current. A circuit may include an XOR gate producing the control signal from a switch signal and an output of a Set-Reset Flip-Flop (SRFF), a zero-detect circuit that resets the SRFF when a current generated using the control circuit becomes zero, and a delay circuit to set the SRFF an adaptive delay after assertion of the switch signal and to adjust the adaptive delay according to a voltage generated by the current.

Signal generation circuit having minimum delay, semiconductor apparatus using the same, and signal generation method
11349457 · 2022-05-31 · ·

A signal generation circuit includes a first delay circuit, a second delay circuit, and a duty control circuit. The first delay circuit delays a first input signal to generate a first output signal. The second delay circuit delays a second input signal to generate a second output signal. The duty control circuit compares phases of the first and second output signals and changes the value of the second delay control signal, and then decreases the times, by which the first and second input signals are delayed, by the same value.