According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.

Common-mode transient immunity circuit and modulation-demodulation circuit, common-mode transient immunity circuit is applied to connecting with modulation circuit or demodulation circuit, comprising first isolation circuit, common-mode bias circuit, reference circuit and comparison circuit. Common-mode bias circuit provides common-mode bias voltage for first isolation circuit; first isolation circuit transmits common-mode bias voltage to comparison circuit; reference circuit provides reference voltage for comparison circuit; comparison circuit compares common-mode bias voltage with reference voltage, when common-mode bias voltage is larger than reference voltage, comparison circuit outputs enable signal to modulation circuit or demodulation circuit, and modulation circuit is driven to stop outputting modulation signal or demodulation circuit is driven to stop receiving modulation signal. According to invention, when common-mode transient occurs, enable signal is output to drive modulation circuit or demodulation circuit to stop working, so that influence of common-mode transient on output signal is avoided.

An apparatus for performing baseline wander correction (BLWC) with the aid of differential wander current sensing includes filters and a correction circuit. The filters are positioned in a front-end circuit of a receiver and coupled to a set of input terminals of the receiver, and filter a set of input signals on the set of input terminals to generate a set of differential signals on a set of secondary terminals, for further usage by the receiver. The correction circuit is positioned in the frontend circuit and electrically connected to the set of input terminals and the set of secondary terminals, and performs BLWC on the set of differential signals according to the set of input signals. In the correction circuit, amplifiers and resistors form a differential wander current sensor to sense differential wander current, and a set of current mirrors generate corresponding baseline wander compensation current to perform BLWC.

According to an embodiment, a semiconductor device includes a differential input circuit suitable for receiving first and second input signals respectively inputted to first and second input transistors, and outputting an output signal; a comparison circuit suitable for generating a first judge signal by comparing the output signal with a first comparison voltage, and generating a second judge signal by comparing the output signal with a second comparison voltage, in a calibration mode; an offset control circuit suitable for adjusting coarse codes and fine codes, according to the first and second judge signals; and an offset adjusting circuit suitable for adjusting a drivability of each of the first and second input transistors by a first strength, according to the coarse codes, and adjusting the drivability of each of the first and second input transistors by a second strength smaller than the first strength, according to the fine codes.

An apparatus for performing baseline wander correction (BLWC) with the aid of differential wander current sensing includes filters and a correction circuit. The filters are positioned in a front-end circuit of a receiver and coupled to a set of input terminals of the receiver, and filter a set of input signals on the set of input terminals to generate a set of differential signals on a set of secondary terminals, for further usage by the receiver. The correction circuit is positioned in the frontend circuit and electrically connected to the set of input terminals and the set of secondary terminals, and performs BLWC on the set of differential signals according to the set of input signals. In the correction circuit, amplifiers and resistors form a differential wander current sensor to sense differential wander current, and a set of current mirrors generate corresponding baseline wander compensation current to perform BLWC.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

A circuit includes a peak detector, a diode, a dynamic clamp circuit, and an offset correction circuit. The peak detector generates a voltage on the peak detector output proportional to a lowest voltage on the peak defector input. The anode of the diode is coupled to the peak detector input. The dynamic clamp circuit is coupled to the peak detector input and is configured to clamp a voltage on the peak detector input responsive to a voltage on the diode's anode being greater than the lowest voltage on the peak detector's input. The offset correction circuit is coupled to the peak detector output and is configured to generate an output signal whose amplitude is offset from an amplitude of the peak detector output.

In accordance with the present disclosure, a data sensing circuit of a semiconductor apparatus includes a sensing portion configured to sense and amplify an input signal provided through an activated data line between a first data line and a second data line. The data sensing circuit also includes an offset sampling portion configured to generate a second offset voltage by sampling a first offset voltage of one to be activated between the first data line and the second data line and configured to store the second offset voltage into a parasitic capacitor of the other one between the first data line and the second data line.