A delay measurement circuit includes a first skew circuit disposed proximate to a first bonding pad configured to receive a first clock signal having a first frequency. The delay measurement circuit includes a second skew circuit disposed proximate to a second bonding pad configured to receive a second clock signal having a second frequency. The first and second skew circuits each have a first mode of operation as zero-delay-return path and a second mode of operation as a synchronized pass path. The delay measurement circuit includes a pair of conductive traces coupled to the first skew circuit, another pair of conductive traces coupled to the second skew circuit, a time-to-digital converter circuit, and a switch circuit configured to selectively couple the time-to-digital converter circuit to the first skew circuit via the pair of conductive traces and the second skew circuit via the other pair of conductive traces.

The independent claims of this patent signify a concise description of embodiments. An emulation control block enables a user to view an entire design in the same phase so that the used can observe and control a halted design in the same logical reference cycle. Both the clock cone and design flops are provided in the state which occurs after the evaluation of cycle K of the reference time. During cycle K+1 of an emulation, the values of derived clocks for cycle K+1 are computed. Moreover, during cycle K+1 of the emulation, the values of the sequential elements are computed based cycle K values of the clocks. When the emulation is halted due to a break, the clock cone is reverted to its previous state. This Abstract is not intended to limit the scope of the claims.

A microelectronic circuit comprises a plurality of logic units and register circuits arranged into a plurality of processing paths. At least one monitor circuit (404) is associated with a first register circuit (301), said monitor circuit (404) being configured to produce a timing event observation signal as a response to a change in a digital value at an input (D) of the first register circuit (301) that took place later than an allowable time limit defined by a triggering signal (CP) to said first register circuit (301). A first processing path goes through a first logic unit (501) to said first register circuit (301) and is a delay critical processing path due to an amount of delay that it is likely to generate. The microelectronic circuit comprises a controllable data event injection point (503) for controllably generating a change of a digital value propagating to said first logic unit (501) irrespective of what other data is processed on said first processing path. Said microelectronic circuit is configured to freeze a first digital value stored in said first register circuit (301) for a time during which the change generated through said controllable data event injection point (503) propagates to said first register circuit.

A power module, including a high-side switching element and a low-side switching element connected to form a half bridge circuit, a high-side drive circuit which drives the high-side switching element, a low-side drive circuit which drives the low-side switching element, and a high-side current detection circuit which detects a current of the high-side switching element. The high-side drive circuit includes a high-side variable delay circuit which adjusts, according to a value detected by the high-side current detection circuit, a length of a high-side delay time from a time when a signal is inputted to the high-side drive circuit to a time when the high-side switching element is driven.

A power module, including a high-side switching element and a low-side switching element connected to form a half bridge circuit, a high-side drive circuit which drives the high-side switching element, a low-side drive circuit which drives the low-side switching element, and a high-side current detection circuit which detects a current of the high-side switching element. The high-side drive circuit includes a high-side variable delay circuit which adjusts, according to a value detected by the high-side current detection circuit, a length of a high-side delay time from a time when a signal is inputted to the high-side drive circuit to a time when the high-side switching element is driven.

A system-on-chip (SoC) includes a processor, a built-in self-testing (BIST) circuitry, and an adaptive masking circuitry. The processor generates a sweep enable (SWEN) signal to initiate a self-testing operation of the SoC. The BIST circuitry receives the SWEN signal and generates a set of sweep events, such that a transition of the processor from a low power (LP) mode to an active mode is initiated based on the generation of each sweep event. The BIST circuitry further receives a status signal, and identifies a subset of sweep events at which the transition of the processor from the LP mode to the active mode failed, for generating sweep failure data. The adaptive masking circuitry receives the sweep failure data and generates a mask signal, to prevent a transition of the first processor from the LP mode to the active mode, during a non-testing operation of the SoC.

A system-on-chip (SoC) includes a processor, a built-in self-testing (BIST) circuitry, and an adaptive masking circuitry. The processor generates a sweep enable (SWEN) signal to initiate a self-testing operation of the SoC. The BIST circuitry receives the SWEN signal and generates a set of sweep events, such that a transition of the processor from a low power (LP) mode to an active mode is initiated based on the generation of each sweep event. The BIST circuitry further receives a status signal, and identifies a subset of sweep events at which the transition of the processor from the LP mode to the active mode failed, for generating sweep failure data. The adaptive masking circuitry receives the sweep failure data and generates a mask signal, to prevent a transition of the first processor from the LP mode to the active mode, during a non-testing operation of the SoC.

The present disclosure relates to an edge detection circuit configured to receive an input signal comprising one or more falling or falling edges and provide an output signal comprising pulses or spikes corresponding to the one or more rising or falling edges. The edge detection circuit comprises a passive differentiator circuit configured to receive an input and provide a differentiator output signal that that is proportional to the rate of change of the input, and a comparator circuit operably connected to a voltage source. The comparator circuit is configured to receive the differentiator output signal, compare the differentiator output signal to a threshold voltage; and output a pulse or spike signal based on the comparison to the threshold voltage.

The present disclosure relates to an edge detection circuit configured to receive an input signal comprising one or more falling or falling edges and provide an output signal comprising pulses or spikes corresponding to the one or more rising or falling edges. The edge detection circuit comprises a passive differentiator circuit configured to receive an input and provide a differentiator output signal that that is proportional to the rate of change of the input, and a comparator circuit operably connected to a voltage source. The comparator circuit is configured to receive the differentiator output signal, compare the differentiator output signal to a threshold voltage; and output a pulse or spike signal based on the comparison to the threshold voltage.

Methods, apparatus, systems, and articles of manufacture are disclosed for cross-conduction detection. An example apparatus includes a cross detector circuit including a first transistor and a second transistor, the first transistor coupled to a load, a third transistor coupled to a first controlled delay circuit and the first transistor, a fourth transistor coupled to a second controlled delay circuit and to the third transistor at a phase node, and a control circuit coupled to the first controlled delay circuit, the second controlled delay circuit, and the load.