Methods, apparatus, systems and articles of manufacture are described to parallelize transistors. An example apparatus includes a first transistor on a first die and a second transistor on a second die. The example apparatus includes a parallel feedback terminal coupled to the first die and the second die and a current sensor including a first contact and a second contact. The example apparatus includes a resistor coupled to the current sensor and at least one of the switched terminal or a ground terminal. The example apparatus includes an active drive controller including a first input coupled to the resistor, a second input coupled to the parallel feedback terminal, and an output coupled to the parallel feedback terminal. The example apparatus includes an edge delay controller adapted to be coupled to a gate driver and an error amplifier, and a control contact adapted to be coupled to the gate driver.

Circuits and methods allowing virtually any number of batteries to be connected in parallel without the supply voltage being substantially reduced, while allowing their capacities to add directly as well as increasing the current capability of the batteries by placing the batteries' internal resistances in parallel.

An embodiment of a semiconductor device comprises a transistor cell array in a semiconductor body. The transistor cell array comprises transistor cell units. Each of the transistor cell units comprises a control terminal and first and second load terminals, respectively. The transistor cell units are electrically connected in parallel, and the control terminals of the transistor cells units are electrically connected. A first group of the transistor cell units includes a first threshold voltage. A second group of the transistor cell units includes a second threshold voltage larger than the first threshold voltage. A channel width of a transistor cell unit of the first group is smaller than a channel width of a transistor cell unit of the second group.

The present invention discloses a signal output apparatus. Each of two output circuits includes an inverter including an input terminal and an output terminal, and a resistor coupled between the output terminal and a differential output terminal. Each of MOS capacitors is coupled between the output terminals. Under a first operation mode, two current supplying circuits are disabled. The input terminals respectively receive a high and a low state input voltages and the output terminals generate a low and a high state output voltages. The capacitances become larger than a predetermined level. Under a second operation mode, one of the current supplying circuits is enabled to output a supplying current to the differential output terminal. The input terminals receive the high state input voltage. The output terminals generate the low state output voltage. The capacitances become not larger than the predetermined level.

An integrated circuit with a power-on-reset circuit includes an inverter circuit connected between the first and second supply node, a cascode-connected series of transistors MCn, for n going from 1 to N, connected between the first supply node and the input node of the inverter, and a resistive element connected between the input node of the inverter and the second supply node. The transistors in the cascode-connected series of transistors MCn pull up the input node voltage above a trip point voltage when the voltage between the input node and the first supply node is more than a threshold of the cascode-connected series. A circuit connected between the first and second supply nodes is responsive to a POR pulse output by the inverter.

A semiconductor assembly includes a first FET integrated within the semiconductor assembly and comprising gate, source and drain terminals. The semiconductor assembly further includes a low voltage switching device integrated within the semiconductor assembly and being configured to electrically short a gate-source capacitance of the first FET responsive to a control signal.

A circuit for comparing a voltage with a threshold, including: first and second nodes of application of the voltage; a first branch including a first transistor series-connected with a first resistor between first and second nodes; a second branch parallel to the first branch, including second and third series-connected resistors forming a voltage dividing bridge between the first and second nodes, the midpoint of the dividing bridge being connected to a control node of the first transistor; and a third branch including a second transistor in series with a resistive and/or capacitive element, between the control node of the first transistor and the first or second node, a control node of the second transistor being connected to the junction point of the first transistor and of the first resistor.

Methods, systems, and apparatus to facilitate a fault triggered diode emulation mode of a transistor. An example apparatus includes a driver to output a control signal to a gate terminal of a transistor of a power converter; and a diode emulation control circuit to, in response to determining a fault corresponding to the transistor, enable the transistor when current flows in a direction from a source terminal of the transistor to a drain terminal of the transistor.

An integrated device includes at least one MOS transistor having a plurality of cells. In each of one or more of the cells a disabling structure is provided. The disabling structure is configured to be in a non-conductive condition when the MOS transistor is switched on in response to a control voltage comprised between a threshold voltage of the MOS transistor and an intervention voltage of the disabling structure, or to be in a conductive condition otherwise. A system comprising at least one integrated device as above is also proposed. Moreover, a corresponding process for manufacturing this integrated device is proposed.

A gate control circuit includes a first pulse generator that outputs a first pulse signal when an input signal changes from a first logical level to a second logical level, a first gate controlling portion that controls a gate voltage of a first transistor based on a first control signal when the input signal is at the second logical level, a second pulse generator that outputs a second pulse signal when the input signal changes from the second logical level to the first logical level, and a second gate controlling portion that controls the gate voltage of the first transistor based on a second control signal when the input signal is at the first logical level. The first gate controlling portion includes a first overcurrent controlling portion that controls a voltage level of the first control signal after an expiration of an output period of the first pulse signal.