A circuit includes a power management circuit configured to receive at least a first or a second control signal, and to supply at least a first, second or a third supply voltage. The first control signal has a first voltage swing. The second control signal has a second voltage swing. The power management circuit includes a first level shifter circuit configured to generate a first level shifted signal in response to the first control signal, and a first header circuit coupled to at least the first level shifter circuit, a first voltage supply and a second voltage supply. The first header circuit is configured to supply the first supply voltage of the first voltage supply to the first node in response to the first control signal, and to supply the second supply voltage of the second voltage supply to the second node in response to the first level shifted signal.

Systems, methods, and apparatus for use in biasing and driving high voltage semiconductor devices using only low voltage transistors are described. The apparatus and method are adapted to control multiple high voltage semiconductor devices to enable high voltage power control, such as power amplifiers, power management and conversion (e.g. DC/DC) and other applications wherein a first voltage is large compared to the maximum voltage handling of the low voltage control transistors. According to an aspect, timing control of edges of a control signal to the high voltage semiconductor devices is provided by a basic edge delay circuit that includes a transistor, a current source and a capacitor. An inverter can be selectively coupled, via a switch, to an input and/or an output of the basic edge delay circuit to allow for timing control of a rising edge or a falling edge of the control signal.

A semiconductor device includes a latch circuit including a first inverter configured to output a first signal based on an input signal, a second inverter configured to output a first clock signal based on a first strobe signal, a third inverter configured to output a second clock signal based on a second strobe signal, a first clock generation circuit configured to generate a third clock signal having transitions that are delayed with respect to the first clock signal, a second clock generation circuit configured to generate a fourth clock signal having transitions that are delayed with respect to the second clock signal, a fourth inverter configured to output an inversion signal of the first signal in accordance with the third and fourth clock signals, and a data latch circuit configured to latch an output signal of the fourth inverter.

An application specific integrated circuit (ASIC) chip includes: a systolic array of cells; and multiple controllable bus lines configured to convey data among the systolic array of cells, in which the systolic array of cells is arranged in multiple tiles, each tile of the multiple tiles including 1) a corresponding sub array of cells of the systolic array of cells, 2) a corresponding subset of controllable bus lines of the multiple controllable bus lines, and 3) memory coupled to the subarray of cells.

Disclosed are a Miller Clamp protection circuit, a driving circuit, a driving chip and an intelligent IGBT module, which are connected to a device to be driven. The Miller Clamp protection circuit comprises a main driving circuit configured to provide a driving signal; a Miller switch configured to reduce a voltage glitch; a Miller switch control circuit configured to automatically control an on and off of the Miller switch according to an intermediate signal of the main driving circuit. The main driving circuit is connected to a power supply, the Miller switch control circuit, one end of the Miller switch and the device to be driven, and another end of the Miller switch is grounded.

A power supply monitor includes a delta-sigma modulator including an input receiving a binary number and an output providing a pulse-density modulated signal, the delta-sigma modulator operable to scale the pulse-density modulated signal based on the binary number. A fast droop detector circuit includes a level shifter providing the modulated signal referenced to a clean supply voltage. A lowpass filter is coupled between the level shifter and a comparator. The comparator produces a droop detection signal at said output responsive to a monitored supply voltage dropping below a predetermined level relative to the filtered signal.

A semiconductor device includes a memory cell array including a plurality of memory blocks, a control logic, a level shifter configured to generate a first internal voltage and a second internal voltage lower than the first internal voltage using a received external voltage on the basis of a control signal from the control logic, and a row decoder configured to provide the first and second internal voltages generated by the level shifter to the memory cell array. The level shifter generates the first internal voltage using the external voltage, generates the second internal voltage using the generated first internal voltage in a power-up mode of the semiconductor device, and generates the second internal voltage using the external voltage in a standby mode of the semiconductor device.

A method and associated systems for using direct sums and invariance groups to optimize the testing of partially symmetric quantum-logic circuits is disclosed. A test system receives information that describes the architecture of a quantum-logic circuit to be tested. The system uses this information to organize the circuit's inputs into two or more mutually exclusive subsets of inputs. The system computes a direct sum of a set of groups associated with the subsets in order to generate an invariance group that contains one or more invariant permutations of the circuit's inputs. These invariant permutations can be used to reduce the number of tests required to fully verify the circuit for all possible input vectors. Once one specific input vector has been verified, there is no need to test other vectors that can be generated by performing any one of the invariant permutations upon the previously verified vector.

A power supply circuit includes: a regulator configured to receive a first power supply voltage and a third power supply voltage higher than the first power supply voltage and output a regulated voltage between the first power supply voltage and the third power supply voltage based on the third power supply voltage; and an output control circuit configured to select the first power supply voltage or the regulated voltage to output as a second power supply voltage. The output control circuit outputs the first power supply voltage as the second power supply voltage when the third power supply voltage is lower than a threshold voltage, whereas the output control circuit outputs the regulated voltage as the second power supply voltage when the third power supply voltage is higher than or equal to the threshold voltage.

A stack of series coupled transistors comprising, at least two sub-portions of the stack of series coupled transistors, and at least one logic decoder coupled to the at least two sub-portions to turn ON at least one sub-portion.