An impedance calibration circuit includes a first code generation circuit connected to a first reference resistor, and configured to generate a first code for forming a resistance based on the first reference resistor, by using the first reference resistor; a second code generation circuit configured to form a resistance of a second reference resistor less than the resistance of the first reference resistor, based on the first code, and generate a second code by using the second reference resistor; and a target impedance code generation circuit configured to generate a target impedance code based on the first code, the second code, and a target impedance value, and form an impedance having the target impedance value in a termination driver connected to the impedance calibration circuit, based on the target impedance code.

Methods and apparatus relating to an adaptive multibit bus for energy optimization are described. In an embodiment, a 1-bit interconnect of a processor is caused to select between a plurality of operational modes. The plurality of operational modes comprises a first mode and a second mode. The first mode causes transmission of a single bit over the 1-bit interconnect at a first frequency and the second mode causes transmission of a plurality of bits over the 1-bit interconnect at a second frequency based at least in part on a determination that an operating voltage of the 1-bit interconnect is at a high voltage level and that the second frequency is lower than the first frequency. Other embodiments are also disclosed and claimed.

An integrated circuit, and method of forming the same. The integrated circuit includes standard logic cells and a combined logic cell over a semiconductor substrate. Each standard logic cell includes a standard height, a width that is an integer multiple of a unit width, first and second power rails, and at least one transistor and interconnections configured to implement a logic function that produces a single logic output. The combined logic cell includes the standard height, a width that is an integer multiple of the unit width, the first and second power rails, and at least two transistors and interconnections configured to implement a first logic function and a second logic function. The first and second logic functions produce first and second logic outputs, respectively. The interconnections are configured to direct the first logic output and the second logic output to destinations outside the combined logic cell.

An integrated circuit, and method of forming the same. The integrated circuit includes standard logic cells and a combined logic cell over a semiconductor substrate. Each standard logic cell includes a standard height, a width that is an integer multiple of a unit width, first and second power rails, and at least one transistor and interconnections configured to implement a logic function that produces a single logic output. The combined logic cell includes the standard height, a width that is an integer multiple of the unit width, the first and second power rails, and at least two transistors and interconnections configured to implement a first logic function and a second logic function. The first and second logic functions produce first and second logic outputs, respectively. The interconnections are configured to direct the first logic output and the second logic output to destinations outside the combined logic cell.

A circuit receives an input signal having a first level and a second level. A logic circuit includes a finite state machine circuit, an edge detector circuit, and a timer circuit. The finite state machine circuit is configured to set a mode of operation of the circuit. The edge detector circuit is configured to detect a transition between the first and second level. The timer circuit is configured to determine whether the first or second level is maintained over an interval, which starts from a transition detected by the edge detector circuit. The finite state machine circuit is configured to change the mode of operation based on the timer circuit determining that the first or second level has been maintained over the interval.

An integrated circuit, and method of forming the same. The integrated circuit includes standard logic cells and a combined logic cell over a semiconductor substrate. Each standard logic cell includes a standard height, a width that is an integer multiple of a unit width, first and second power rails, and at least one transistor and interconnections configured to implement a logic function that produces a single logic output. The combined logic cell includes the standard height, a width that is an integer multiple of the unit width, the first and second power rails, and at least two transistors and interconnections configured to implement a first logic function and a second logic function. The first and second logic functions produce first and second logic outputs, respectively. The interconnections are configured to direct the first logic output and the second logic output to destinations outside the combined logic cell.

An integrated circuit, and method of forming the same. The integrated circuit includes standard logic cells and a combined logic cell over a semiconductor substrate. Each standard logic cell includes a standard height, a width that is an integer multiple of a unit width, first and second power rails, and at least one transistor and interconnections configured to implement a logic function that produces a single logic output. The combined logic cell includes the standard height, a width that is an integer multiple of the unit width, the first and second power rails, and at least two transistors and interconnections configured to implement a first logic function and a second logic function. The first and second logic functions produce first and second logic outputs, respectively. The interconnections are configured to direct the first logic output and the second logic output to destinations outside the combined logic cell.

An object is to provide a semiconductor device that automatically adjusts the luminance of a display device. The semiconductor device includes an illuminometer, a threshold detector, a timing controller, a digital-to-analog converter circuit, a first display panel, and a second display panel. The illuminance of external light is measured with the illuminometer, and the threshold value of digital video data is determined by the threshold detector in accordance with the illuminance. The timing controller generates a signal for the first display panel or a signal for the second display panel on the basis of the threshold value and video data transmitted from the outside. The signal for the first display panel and the signal for the second display panel are input to one digital-to-analog converter circuit and converted into digital signals, and the obtained digital signals are input to a corresponding one of the first display panel and the second display panel.

A circuit with a plurality of analog circuit blocks, each configured to provide at least one analog function and a programmable interconnect coupled of the analog circuit blocks and configurable to interconnect combinations of the analog circuit blocks to one another. The circuit is formed in an integrated circuit (chip) and the programmable interconnect comprises a plurality of switches coupled between the analog circuit blocks and ports that provide signal connections for the chip.

A 3D field programmable gate array (FPGA) system, and method of manufacture therefor, includes: a field programmable gate array (FPGA) die having a configurable power on reset (POR) unit; a heterogeneous integrated circuit die coupled to the FPGA die; and a 3D power on reset (POR) output configured by the configurable POR unit for initializing the FPGA die and the heterogeneous integrated circuit die.