A method and apparatus for generating an improved reference voltage for use, for example, in a system requiring accurate low power operation. In particular, our reference voltage generator is adapted to output VREF as a function of the voltage difference between V1 and V2. The reference voltage generator is further adapted to include our reference voltage tuner to compensate for predetermined sensitivities of the reference voltage VREF, and to adjust the absolute value of VREF. During manufacturing and system test, a driver may be used to drive a buffered or unbuffered version of VREF to off-chip test functionality. Also, a configuration memory may be used to store the trim settings during normal operation, and make such settings available to outside resources.

An improved reference current generator for use in an integrated circuit. A voltage difference generator generates two voltages that are separated by a relatively small electrical potential. The two closely separated voltages are applied across a resistive element with relatively large impedance value resulting in a small and stable reference current. The stable reference current is mirrored and, if desired, amplified for use on the integrated circuit. A driver selectively drives state information off chip for assisting in post-silicon correction of unwanted sensitivities. A configuration memory stores values used to adjust effective device widths and lengths for correcting unwanted sensitivities.

An improved reference current generator for use in an integrated circuit. A voltage difference generator generates two voltages that are separated by a relatively small electrical potential. The two closely separated voltages are applied across a resistive element with relatively large impedance value resulting in a small and stable reference current. The stable reference current is mirrored and, if desired, amplified for use on the integrated circuit. A driver selectively drives state information off chip for assisting in post-silicon correction of unwanted sensitivities. A configuration memory stores values used to adjust effective device widths and lengths for correcting unwanted sensitivities.

A circuit arrangement for charge integration may include an input for applying a signal representing charge pulses, an output for providing an integrated signal, and an integrating circuit connected between the input and the output, comprising a resistive circuit and a capacitor and having an RC time constant which is a function of the resistive circuit and the capacitor. The circuit arrangement may include a feedback control circuit connected at its input, to the output of the circuit arrangement and providing, at its output, a control signal, where at least one of the resistive circuit and the capacitor has a variable value based on the control signal.

A physical quantity measurement apparatus includes a first resonator, a second oscillator, and an integrated circuit device. The integrated circuit device includes a first oscillation circuit that causes the first resonator to oscillate, and thus generate a first clock signal having a first clock frequency, a second oscillation circuit that causes the second oscillator to oscillate, and thus generate a second clock signal having a second clock frequency which is different from the first clock frequency, and a measurement unit that is provided with a time-to-digital conversion circuit which converts time into a digital value by using the first clock signal and the second clock signal.

A multi-modulus frequency divider includes a frequency division module, a frequency selection module, and a retiming module. The frequency division module is configured to receive an input signal and perform mufti-mode frequency processing on the input signal, so as to generate and output a plurality of divided signals to the frequency selection module. The frequency selection module is configured to receive the plurality of divided signals from the frequency division module, select a divided signal having a desired frequency from among the plurality of divided signals, and output the selected divided signal to the retiming module. The retiming module is configured to receive the selected divided signal from the frequency selection module, perform a retiming operation on the selected divided signal, and output a retimed selected divided signal.

In accordance with an embodiment, a method includes receiving a first differential logic signal using a first branch of a circuit that extends from a voltage supply of the circuit as far as an earth terminal of the circuit and has at least one first differential transistor pair, receiving a second differential logic signal using a second branch of the circuit that extends from the voltage supply to the earth terminal and has at least one second differential transistor pair, conducting a current flow between the first branch and the second branch, and outputting an output signal by the second branch.

The present technology relates to a signal processing apparatus and method capable of increasing a harmonic rejection ratio while suppressing an increase in power consumption.

In one aspect of the present technology, two local signals having a 1/3 duty ratio and phases mutually shifted by a 1/2 period are mixed with each signal of a differential signal, and a difference between results of the mixing of the two local signals is calculated. The present technology can be applied to, for example, a signal processing apparatus, a transmission apparatus, a reception apparatus, a communication apparatus, an electronic apparatus having a transmission function, a reception function, or a communication function, or a computer that controls those apparatuses.

A counter configured to perform counting at both edges of an input clock to output an additional value or a subtraction value for a previous count value and a next count value includes a first latch circuit that latches the input clock, a second latch circuit that latches an output from the first latch circuit, a holding section that holds data of the 0th bit of a count value, and a correction section that performs count correction on data of the first and subsequent bits of the count value on the basis of an output of the second latch circuit.

A monitoring circuit includes first and second oscillators, first and second frequency dividers, first and second counters, a determination portion, and an identification portion. The first and second frequency dividers respectively divide frequencies of first and second clock signals outputted from the first and second oscillators, respectively. The first and second counters respectively count the numbers of clocks of the second and first clock signals at first and second numbers of periods of first and second frequency-divided signals outputted from the first and second frequency dividers, respectively. The determination portion determines, based on results of counting by the first and second counters, whether or not an abnormality has occurred in either of the first and second clock signals. The identification portion identifies, at the occurrence of an abnormality in either of the first and second clock signals, which of the first and second clock signals is in an abnormal state.