Embodiments of the present disclosure include a microcontroller with a processor, memory, and peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

A reference voltage sub-system that allows fast power up after spending extended periods in an ultra-low power standby mode. The reference voltage sub-system includes a reference voltage buffer, a reference voltage keeper, an active calibration facility for selectively adjusting the reference voltage keeper output to match the reference voltage buffer output, and a selection means for selecting between the reference voltage buffer output and the reference voltage keeper output.

Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines, a circuit including a set of delay elements included in the differential digital delay lines, and another circuit including another set of delay elements included in the differential digital delay lines. The first circuit is configured to generate data representing an analog to digital conversion of an input. The second circuit is configured to calibrate a source to the differential digital delay lines.

Techniques for generating signals with arbitrary noise shaping are discussed. One example apparatus configured to be employed within a transmitter can comprise a noise shaper configured to: receive an input signal x.sub.q; and apply noise shaping to the input signal x.sub.q to generate a noise shaped output signal y.sub.q, wherein an in-band noise of the noise shaped output signal y.sub.q is below an in-band noise threshold of a spectral mask associated with the noise shaper, wherein an out-of-band noise of the noise shaped output signal y.sub.q is below an out-of-band noise threshold of the spectral mask, and wherein a noise of the output signal y.sub.q in each of a plurality of bandpass regions is below an associated noise threshold for that bandpass region of the spectral mask.

Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

Embodiments of the present disclosure include a microcontroller with a processor core, memory, and a plurality of peripheral devices including a differential digital delay line analog-to-digital converter (ADC). The ADC includes differential digital delay lines and circuit comprising a set of delay elements included in the differential digital delay lines configured to generate data representing an analog to digital conversion of an input. The microcontroller also includes a digital comparator coupled with an output of the ADC and an associated register, wherein at least one output of the digital comparator is configured to directly control another peripheral of the plurality of peripherals.

Methods, systems and devices for dynamically controlling resolution of an analog-to-digital converter (ADC). The ADC receives an analog input signal and outputs digital data. A statistical unit coupled to the ADC obtains samples of the output signal and transmits a control signal to the ADC to adjust the resolution of the ADC. The control signal is generated by the statistical unit based on a comparison of at least one performance indicator with a target performance level. The at least one performance indicator is calculated using the samples.

An apparatus for interpolating between a first signal edge and a second signal edge is provided. The apparatus includes a plurality of interpolation cells coupled to a common node. At least one of the plurality of interpolation cells is configured to supply, based on a control word, the first signal edge and/or the second signal edge to the common node. Further, the apparatus includes a control circuit configured to activate all of the plurality interpolation cells in a first mode of operation, and to deactivate part of the plurality of interpolation cells in a second mode of operation.

A receiver includes a variable resolution analog-to-digital converter (ADC) and variable resolution processing logic/circuitry. The processing logic may use feed-forward equalization (FFE) techniques to process the outputs from the ADC. When receiving data from a channel having low attenuation, distortion, and/or noise, the ADC and processing logic may be configured to sample and process the received signal using fewer bits, and therefore less logic, than when configured to receiving data from a channel having a higher attenuation, distortion, and/or noise. Thus, the number of (valid) bits output by the ADC, and subsequently processed (e.g., for FFE equalization) can be reduced when a receiver of this type is coupled to a low loss channel. These reductions can reduce power consumption when compared to operating the receiver using the full (i.e., maximum) number of bits the ADC and processing logic is capable of processing.

A first analog block includes a first plurality of switched capacitors and a second analog block includes a second plurality of switched capacitors. A switch associated with the first plurality of switched capacitors as well as a switch associated with the second plurality of switched capacitors may be configured based on one or more analog functions. The configuring of the first analog and the second analog block may include the configuring of the switch associated with the first plurality of switched capacitors when the analog function is associated with a first single ended signal and the configuring of both the switch associated with the first plurality of switched capacitors and the switch associated with the second plurality of switched capacitors when the analog function is associated with a differential signal.