A 10BASE-T transmitter includes a Manchester encoder circuit, a waveform shaper circuit, and digital-to-analog converter (DAC) circuit. The Manchester encoder circuit applies Manchester encoding to an input data to generate an encoded data. The waveform shaper circuit converts the encoded data into a plurality of digital codes. The DAC circuit generates a transmit (TX) waveform according to the plurality of digital codes. The waveform shaper circuit controls a portion of the plurality of digital codes for applying pre-compensation of inter-symbol interference (ISI) to the TX waveform.

A detector for measuring a resistance of a variable resistance sensor (VRS) that varies with respect to a time-varying stimulus (e.g., temperature) includes a voltage reference having variation with respect to operating conditions and a linearized digital-to-analog converter (LIDAC) having a known transconductance that uses the voltage reference to generate a current for pumping into the VRS to cause the VRS to generate a voltage sensed by the detector. The sensed voltage includes error due to the variation of the voltage reference. The detector also includes a programmable gain amplifier (PGA) that gains up the sensed voltage to generate an output signal, an ADC that converts the output signal to a digital value, and a digital processor that computes the resistance of the VRS using the digital value and the known transconductance. The PGA is non-varying with respect to the time-varying stimulus.

A signal processing system includes an analog-to-digital converter (ADC) that is used to convert a first analog value into a first digital value and convert a second analog value into a second digital value. The ADC includes a first digital-to-analog converter (DAC) circuit and a second DAC circuit operating in different voltage domains. A first bit segment and a second bit segment of each digital value are determined via the first DAC circuit and the second DAC circuit, respectively. An analog injection value is injected to the second analog value, the analog injection value is converted from a digital injection value formed by a subset of bits of the second bit segment of the first digital value, and the second bit segment of the second digital value is derived from injecting the digital injection value to a digital value determined by the second DAC circuit.

In one embodiment an analog-to-digital converter circuit has an input for receiving a first analog signal level and a second analog signal level, a ramp generator adapted to provide a ramp signal, a comparison unit coupled to the input and the ramp generator, a control unit coupled to the comparison unit the control unit having a counter, the control unit being prepared to enable the counter as a function of a comparison of the ramp signal with the first analog signal level and the second analog signal level, and an output for providing an output digital value as a function of a relationship between the first analog signal level and the second analog signal level. Therein the ramp signal has at least one linearly rising and at least one linearly falling portion and an adjustable shift at a reversal point between the rising and the falling portion of the ramp signal, the shift depending on the number of rising and falling portions of the ramp signal.

A circuit arrangement includes charge stores logically arranged in an array configuration having logical columns of charge stores including at least first, second, third and fourth columns of charge stores. A control circuit is configured to control a switching network operably coupled to the charge stores, and to affect a first circuit configuration in a first time segment and a second circuit configuration in a second time segment, the circuit configurations being different from one another. In the first circuit configuration, the first and third columns of charge stores receive a first polarity component of a differential signal, and the second and fourth columns of charge stores receive a second polarity component of the differential signal. In the second circuit configuration, the first and second columns of charge stores receive the first polarity component, and the third and fourth columns of charge stores receive the second polarity component.

An analog to digital converter (ADC) device includes ADC circuitries, a calibration circuitry, and a skew adjustment circuitry. The ADC circuitries are configured to convert an input signal according to interleaved clock signals, in order to generate first quantization outputs. The calibration circuitry is configured to perform at least one calibration operation according to the first quantization outputs, in order to generate second quantization outputs. The skew adjustment circuitry is configured to determine maximum value signals, to which the second quantization outputs respectively correspond during a predetermined interval, and to average the maximum value signals to generate a reference signal, and to compare the reference signal with each of the maximum value signals to generate adjustment signals, in order to reduce a clock skew of the ADC circuitries.

A signal processing system includes an analog-to-digital converter (ADC) that is used to convert a first analog value into a first digital value and convert a second analog value into a second digital value. The ADC includes a first digital-to-analog converter (DAC) circuit and a second DAC circuit operating in different voltage domains. A first bit segment and a second bit segment of each digital value are determined via the first DAC circuit and the second DAC circuit, respectively. An analog injection value is injected to the second analog value, the analog injection value is converted from a digital injection value formed by a subset of bits of the second bit segment of the first digital value, and the second bit segment of the second digital value is derived from injecting the digital injection value to a digital value determined by the second DAC circuit.

An analog to digital converter (ADC) device includes ADC circuitries, a calibration circuitry, and a skew adjustment circuitry. The ADC circuitries are configured to convert an input signal according to interleaved clock signals, in order to generate first quantization outputs. The calibration circuitry is configured to perform at least one calibration operation according to the first quantization outputs, in order to generate second quantization outputs. The skew adjustment circuitry is configured to determine maximum value signals, to which the second quantization outputs respectively correspond during a predetermined interval, and to average the maximum value signals to generate a reference signal, and to compare the reference signal with each of the maximum value signals to generate adjustment signals, in order to reduce a clock skew of the ADC circuitries.

A circuit arrangement includes charge stores logically arranged in an array configuration having logical columns of charge stores including at least first, second, third and fourth columns of charge stores. A control circuit is configured to control a switching network operably coupled to the charge stores, and to affect a first circuit configuration in a first time segment and a second circuit configuration in a second time segment, the circuit configurations being different from one another. In the first circuit configuration, the first and third columns of charge stores receive a first polarity component of a differential signal, and the second and fourth columns of charge stores receive a second polarity component of the differential signal. In the second circuit configuration, the first and second columns of charge stores receive the first polarity component, and the third and fourth columns of charge stores receive the second polarity component.

An integrated circuit including a segmented successive approximation register (SAR) analog-to-digital converter (ADC) includes a first capacitive structure with a first plurality of capacitive structure subcomponents that each include a first terminal selectively connected to one of a plurality of input voltage nodes and a second terminal connected to a common conductor, and second capacitive structure with a second plurality of capacitive structure subcomponents that each include a first terminal selectively connected to one of the plurality of input voltage nodes and a second terminal connected to the common conductor. The first and second plurality of capacitive structure subcomponents are arranged in an array in which none of the first plurality of capacitive structure subcomponents are directly adjacent to one another and none of the second plurality of capacitive structure subcomponents are directly adjacent to one another in a first row in the array.