A measurement system includes a gain chain configured to amplify an analog input signal; a range selector configured to select a gain between the analog input signal and a plurality of analog-to-digital converter (ADC) outputs from a plurality of ADCs, wherein each ADC output has a path, and a gain of each output path is made up of a plurality of gain stages in the gain chain; and a mixer configured to combine the plurality of ADC outputs into a single mixed output.

A time-interleaved analog to digital converter (TI-ADC) includes a first sub-ADC configured to sample and convert an input analog signal to generate a first digital signal and a second sub-ADC configured to sample and convert said input analog signal to generate a second digital signal. Sampling by the second sub-ADC occurs with a time skew mismatch. A multiplexor interleaves the first and second digital signals to generate a third digital signal. A time skew mismatch error determination circuit processes the first and second digital signals to generate a time error corresponding to the time skew mismatch. A slope value of said third digital signal is determined and multiplied by the time error to generate a signal error. The signal error is summed with the third digital signal to generate a digital output signal which eliminates the error due to the time skew mismatch. This correction is performed in real time.

An AD converter includes: an accumulation conversion unit that performs a comparison of magnitudes of an input voltage V2 and an accumulated voltage V1 obtained by accumulating a unit voltage and outputs a comparison signal representing a result of the comparison; an accumulation comparison determination unit that repeatedly compares an accumulated voltage V1, obtained by repeating the comparison until the comparison signal changes and corresponding to an accumulated voltage V1 at which the comparison signal changes, and the input voltage V2 a predetermined number of times to determine an equivalent-state accumulation number in which a state probability that the comparison signal changes is equal to a threshold; and a control unit that determines conversion data of the input voltage using the equivalent-state accumulation number.

An AD converter includes: an accumulation conversion unit that performs a comparison of magnitudes of an input voltage V2 and an accumulated voltage V1 obtained by accumulating a unit voltage and outputs a comparison signal representing a result of the comparison; an accumulation comparison determination unit that repeatedly compares an accumulated voltage V1, obtained by repeating the comparison until the comparison signal changes and corresponding to an accumulated voltage V1 at which the comparison signal changes, and the input voltage V2 a predetermined number of times to determine an equivalent-state accumulation number in which a state probability that the comparison signal changes is equal to a threshold; and a control unit that determines conversion data of the input voltage using the equivalent-state accumulation number.

Herein disclosed are some examples of metastability detectors and compensator circuitry for successive-approximation-register (SAR) analog-to-digital converters (ADCs) within delta sigma modulator (DSM) loops. A metastability detector may detect metastability at an output of a SAR ADC and compensator circuitry may implement a compensation scheme to compensate for the metastability. The identification of the metastability and/or compensation for the metastability can avoid detrimental effects and/or errors to the DSM loops that may be caused by the metastability of the SAR ADCS.

A flicker detection circuit is provided. The flicker detection circuit may include a flicker detection correlated double sampling (FD CDS) circuit including first to sixth switches turned on or off based on a control signal, and first to fourth capacitors, the FD CDS circuit being configured to receive a flicker pixel signal output from at least one pixel, summate with an output offset signal, and amplify the summation based on a gain to form a flicker detection signal; and an analog-to-digital converter (ADC) configured to quantize the flicker detection signal.

This application relates to ADC circuitry. An ADC circuit (200) has first and second conversion paths (201a, 201b) for converting analogue signals to digital and is operable in first and second modes. In the first mode, the first and second conversion paths are connected to respective first and second input nodes (202a, 202b) to receive and convert full scale first and second analogue input signals (Ain1, Ain2) to separate digital outputs (Dout1, Dout2). In the second mode, the first and second conversion paths are both connected to the first input node (202a), to convert the first analogue input signal (Ain1) to respective first and second digital signals, and the first and second conversion paths are configured for processing different signal levels of the first analogue input signal. A selector (207) select the first digital signal or the second digital to be output as an output signal based on an indication of amplitude of the first analogue input signal.

This application relates to ADC circuitry. An ADC circuit (200) has first and second conversion paths (201a, 201b) for converting analogue signals to digital and is operable in first and second modes. In the first mode, the first and second conversion paths are connected to respective first and second input nodes (202a, 202b) to receive and convert full scale first and second analogue input signals (Ain1, Ain2) to separate digital outputs (Dout1, Dout2). In the second mode, the first and second conversion paths are both connected to the first input node (202a), to convert the first analogue input signal (Ain1) to respective first and second digital signals, and the first and second conversion paths are configured for processing different signal levels of the first analogue input signal. A selector (207) select the first digital signal or the second digital to be output as an output signal based on an indication of amplitude of the first analogue input signal.

The present disclosure provides a circuitry. The circuitry includes a comparator and a signal correlated circuit. The comparator includes a first input terminal, a second input terminal, and an output terminal, The signal correlated circuit includes a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first input terminal is coupled to receive a first input signal. The second input terminal is coupled to receive a second input signal independent from the first input signal. The first output terminal is configured to generate a first output signal and to send the first output signal to the first input terminal of the comparator. The second output terminal is configured to generate a second output signal and to send the second output signal to the second input terminal of the comparator. The first output signal and the second output signal are correlated.

The present disclosure provides a circuitry. The circuitry includes a comparator and a signal correlated circuit. The comparator includes a first input terminal, a second input terminal, and an output terminal, The signal correlated circuit includes a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first input terminal is coupled to receive a first input signal. The second input terminal is coupled to receive a second input signal independent from the first input signal. The first output terminal is configured to generate a first output signal and to send the first output signal to the first input terminal of the comparator. The second output terminal is configured to generate a second output signal and to send the second output signal to the second input terminal of the comparator. The first output signal and the second output signal are correlated.