An integrating Analog-to-digital converter has a global counter that outputs a counter code signal including a multiphase signal. It also has a column circuit including: a ramp wave generation circuit outputting a ramp wave voltage; a comparator comparing the ramp wave voltage with a pixel voltage; and a latch circuit latching the counter code signal at output inversion timing of the comparator. An output value of the latch circuit is used as a digital conversion output value per the column circuit. The counter has a phase division circuit outputting, as an LSB of the digital conversion output value of the integrating analog-to-digital converter, a phase division signal to the latch circuit, the phase division signal dividing a phase of the counter code signal. The phase division circuit is arranged to a plurality of column circuits, and the LSB is shared by a plurality of phase division circuits.

An Analog-to-Digital Converter (ADC) includes a plurality of ADC channels connected to an in-service signal input via an isolated power combiner; an on-chip circuit including a calibration source connected to the isolated power combiner; and one or more switches configured to switch the ADC between an in-service mode and a calibration mode. The one or more switches are set such that, in the calibration mode, the in-service signal input is disconnected and the on-chip circuit is connected to the isolated power combiner, and, in the in-service mode, the in-service signal input is connected and the on-chip circuit is disconnected to the isolated power combiner. In the calibration mode, the on-chip circuit is configured to provide a test signal to the plurality of ADC channels for a determination of interleave errors in the plurality of ADC channels.

An Analog-to-Digital Converter (ADC) includes a plurality of ADC channels connected to an in-service signal input via an isolated power combiner; an on-chip circuit including a calibration source connected to the isolated power combiner; and one or more switches configured to switch the ADC between an in-service mode and a calibration mode. The one or more switches are set such that, in the calibration mode, the in-service signal input is disconnected and the on-chip circuit is connected to the isolated power combiner, and, in the in-service mode, the in-service signal input is connected and the on-chip circuit is disconnected to the isolated power combiner. In the calibration mode, the on-chip circuit is configured to provide a test signal to the plurality of ADC channels for a determination of interleave errors in the plurality of ADC channels.

An apparatus and method for carrier frequency estimation include a carrier frequency estimator having: a frequency input terminal disposed to receive a frequency-domain input signal comprising a plurality of symbols; a plurality of candidate pipelines, each comprising a frequency adder coupled to the frequency input terminal, a bit converter coupled to the frequency adder, a multi-bit buffer coupled to the bit converter; and a correlator coupled to the multi-bit buffer, respectively; and a candidate pipeline selector coupled to the correlators.

An error correction method and a time-interleaved analog-to-digital converter (TIADC) are provided. The method is applied to a TIADC that includes a plurality of analog-to-digital converters (ADCs), and the method includes: determining whether a current value of a codeword of a first ADC in the plurality of ADCs is within a preset range; when the current value of the codeword of the first ADC is not within the preset range, adjusting a plurality of codewords that are in a one-to-one correspondence with the plurality of ADCs; and controlling a clock frequency division circuit to generate, by using a plurality of adjusted codewords, a plurality of sampling clocks that are in a one-to-one correspondence with the plurality of ADCs. In embodiments of this application, a sampling time-period skew existing between ADCs may be adjusted by adjusting codewords corresponding to the ADCs.

An analogue-to-digital converter (ADC), comprising: an adaptive whitening filter configured to filter an analogue input signal and output a whitened analogue input signal; a first converter configured to receive said whitened analogue input signal and output a whitened digital signal; a controller configured to adapt the whitening filter based on the received analogue input signal.

An AD conversion circuit provided in a solid-state image sensor includes a counter circuit that performs count processing and a first latch circuit that holds at least one of a discrimination result of a first comparison circuit and a first output result of the counter circuit.

The present disclosure provides a circuitry. The circuitry includes a comparator and a signal correlated circuit. The comparator includes a first input terminal, a second input terminal, and an output terminal. The signal correlated circuit includes a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first input terminal is coupled to receive a first input signal. The second input terminal is coupled to receive a second input signal independent from the first input signal. The first output terminal is configured to generate a first output signal and to send the first output signal to the first input terminal of the comparator. The second output terminal is configured to generate a second output signal and to send the second output signal to the second input terminal of the comparator. The first output signal and the second output signal are correlated.

The present disclosure provides a circuitry. The circuitry includes a comparator and a signal correlated circuit. The comparator includes a first input terminal, a second input terminal, and an output terminal. The signal correlated circuit includes a first input terminal, a second input terminal, a first output terminal, and a second output terminal. The first input terminal is coupled to receive a first input signal. The second input terminal is coupled to receive a second input signal independent from the first input signal. The first output terminal is configured to generate a first output signal and to send the first output signal to the first input terminal of the comparator. The second output terminal is configured to generate a second output signal and to send the second output signal to the second input terminal of the comparator. The first output signal and the second output signal are correlated.

A device for processing digital signals is provided. The device comprises a digital signal source and a converter circuit having a current supply. The digital signal source outputs a codeword. The converter circuit receives the codeword from the digital signal source, receives a current at the current supply, and generates an output signal based on the codeword. The current is generated in accordance with the codeword.