Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.

In some embodiments, an analog-to-digital converter (ADC) comprises a loop filter configured to produce an error signal based on a difference between an analog input signal and a feedback signal. The ADC also comprises a main comparator set comprising one or more main comparators, the main comparator set configured to digitize the error signal and further configured to drive a main digital-to-analog converter (DAC). The ADC further comprises an auxiliary comparator set comprising a plurality of auxiliary comparators, the auxiliary comparator set configured to digitize the error signal when the ADC is in a runaway state and further configured to drive an auxiliary DAC to bring the error signal into a predetermined range.

Analog-to-digital converter (ADC) circuitry to convert an analog signal to a digital signal is disclosed herein. The ADC circuitry can utilize pipelined-interpolation analog-to-digital converters (PIADCs) with adaptation circuitry to correct regenerative amplification cells of the PIADCs. The PIADCs can implement a rotational shuffling scheme for correction of the regenerative amplification cells, where the correction implemented by the regenerative amplification cells allows for offsetting of latches of the regenerative amplification cells.

Described is an apparatus which comprises: a digital-to-analog converter (DAC) having a DAC cell with p-type and n-type current sources and an adjustable strength current source which is operable to correct non-linearity of the DAC cell caused by both the p-type and n-type current sources; and measurement logic, coupled to the DAC, having a reference DAC cell with p-type and n-type current sources, wherein the measurement logic is to monitor an integrated error contributed by both the p-type and n-type current sources of the DAC cell, and wherein the measurement logic is to adjust the strength of the adjustable strength current source according to the integrated error and currents of the p-type and n-type current sources of the reference DAC cell.

Multi-step ADCs performs multi-step conversion by generating a residue for a subsequent stage to digitize. To generate a residue, a stage in the multi-step ADC would reconstruct the input signal to the stage using a feedforward digital to analog converter (DAC). Non-linearities in the DAC can directly affect the overall performance of the multi-step ADC. To reduce power consumption and complexity of analog circuit design, digital background calibration schemes are implemented to address the non-linearities. The non-linearities that the calibration schemes address can include reference, DAC, and quantization non-linearities.

An analog-to-digital converter (ADC) circuit (400) and method of operation are disclosed. In some aspects, the ADC circuit (400) may include a plurality of channels (500), a gain calibration circuit (420), and a time-skew calibration circuit (430). Each of the plurality of channels (500) may include an ADC (520), a switch (510) configured to provide a differential input signal to the ADC (520), a calibration device (530), a multiplier (540), and a pseudorandom bit sequence (PRBS) circuit (550) to provide a pseudorandom number (PN) to the switch (510), to the calibration device (530), and to the multiplier (540). In some embodiments, the calibration device (530) may include first and second offset calibration circuits (531-532) coupled in parallel between a de-multiplexer (D1) and a multiplexer (M1) that alternately route signals to the first and second offset calibration circuits (531-532) based on the pseudorandom number (PN).

A digital to time converter (DTC) system is disclosed. The DTC system comprises a DTC circuit configured to generate a DTC output clock signal at a DTC output frequency, based on a DTC code. In some embodiments, the DTC system further comprises a calibration circuit comprising a period error determination circuit configured to determine a plurality of period errors respectively associated with a plurality consecutive edges of the DTC output clock signal. In some embodiments, each period error of the plurality of period errors comprises a difference in a measured time period between two consecutive edges of the DTC output clock signal from a predefined time period. In some embodiments, the calibration circuit further comprises an integral non-linearity (INL) correction circuit configured to determine a correction to be applied to the DTC code based on a subset of the determined period errors.

An interleaved digital-to-analog converter (DAC) system may include a first sub-DAC and a second sub-DAC and may be configured to provide both a converter output signal and a calibration output signal. The converter output signal may be provided by adding the first sub-DAC output signal and the second sub-DAC output signal. The calibration output signal may be provided by subtracting one of the first and second sub-DAC output signals from the other. The calibration output signal may be used as feedback to adjust the phase of one of the sub-DACs relative to the other, to promote phase matching their output signals.

A successive approximation register, SAR, analog-to-digital converter, ADC, (400) is described. The SAR ADC (400) includes: an analog input signal (410); an ADC core (414) configured to receive the analog input signal (410) and comprising: a digital to analog converter, DAC (430) located in a feedback path; and a SAR controller (418) configured to control an operation of the DAC (430), wherein the DAC (430) comprises a number of DAC cells, arranged to convert a digital code from the SAR controller (418) to an analog form; a digital signal reconstruction circuit (450) configured to convert the digital codes from the SAR controller (418) to a binary form; and an output coupled to the digital signal reconstruction circuit (450) and configured to provide a digital data output (460). The DAC (430) is configurable to support at least two mapping modes, including a small signal mapping mode of operation; and the SAR controller (418) is configured to identify when the received analog signal is a small signal level, and in response thereto re-configure the DAC (430) and the digital signal reconstruction circuit (450) to implement a small signal mapping mode of operation.

A digital to time converter (DTC) system is disclosed. The DTC system comprises a DTC circuit configured to generate a DTC output clock signal at a DTC output frequency, based on a DTC code. In some embodiments, the DTC system further comprises a calibration circuit comprising a period error determination circuit configured to determine a plurality of period errors respectively associated with a plurality consecutive edges of the DTC output clock signal. In some embodiments, each period error of the plurality of period errors comprises a difference in a measured time period between two consecutive edges of the DTC output clock signal from a predefined time period. In some embodiments, the calibration circuit further comprises an integral non-linearity (INL) correction circuit configured to determine a correction to be applied to the DTC code based on a subset of the determined period errors.