Patent classifications
H03M1/1009
Analog-to-digital converter system, transceiver, base station and mobile device
An Analog-to-Digital Converter, ADC, system is provided. The ADC system comprises a plurality of ADC circuits and a first input for receiving a transmit signal of a transceiver. One ADC circuit of the plurality of ADC circuits is coupled to the first input and configured to provide first digital data based on the transmit signal. The ADC system further comprises a second input for receiving a receive signal of the transceiver. The other ADC circuits of the plurality of ADC circuits are coupled to the second input, wherein the other ADC circuits of the plurality of ADC circuits are time-interleaved and configured to provide second digital data based on the receive signal. Additionally, the ADC system comprises a first output configured to output digital feedback data based on the first digital data, and a second output configured to output digital receive data based on the second digital data.
Multistage analog-to-digital converters for crossbar-based circuits
In accordance with some embodiments of the present disclosure, an apparatus including a crossbar circuit is provided. The crossbar circuit may include a plurality of cross-point devices with programmable conductance, a transimpedance amplifier (TIA), and an analog-to-digital converter (ADC). The TIA is configured to produce an output voltage based on an input current corresponding to a summation of current from a first plurality of the cross-point devices. The ADC is configured to generate a digital output corresponding to a digital representation of the output voltage of the TIA. To generate the digital output, the ADC is to generate, using a comparator, a first plurality of bits (e.g., MSBs) of the digital output by performing a coarse conversion process and a second plurality of bits (e.g., LSBs) of the digital output by performing a fine conversion process on a sample-and-hold voltage produced in the coarse conversion process.
Dynamic integration time adjustment of a clocked data sampler using a static analog calibration circuit
Methods and systems are described for generating a process-voltage-temperature (PVT)-dependent reference voltage at a reference branch circuit based on a reference current obtained via a band gap generator and a common mode voltage input, generating a PVT-dependent output voltage at an output of a static analog calibration circuit responsive to the common mode voltage input and an adjustable current, adjusting the adjustable current through the static analog calibration circuit according to a control signal generated responsive to comparisons of the PVT-dependent output voltage to the PVT-dependent reference voltage, and configuring a clocked data sampler with a PVT-calibrated current by providing the control signal to the clocked data sampler.
PIPELINE ANALOG TO DIGITAL CONVERTER AND SIGNAL CONVERSION METHOD
A pipeline analog to digital converter includes converter circuitries and a calibration circuitry. The converter circuitries sequentially convert an input signal into first digital codes. A first converter circuitry in the converter circuitries performs a quantization according to a first signal to generate a first corresponding digital code in the first digital codes, and the first signal is a signal, which is processed by the first converter circuitry, of the input signal and a previous stage residue signal. The calibration circuitry combines the first digital codes to output a second digital code, detects whether the quantization is completed to generate first and second valid signals, and determines whether to set the second digital code to be a first predetermined digital code or a second predetermined digital code according to the first and the second valid signals. The second valid signal is a delay signal of the first valid signal.
Analog to digital converter and a method for analog to digital conversion
An analog to digital converter (ADC) receives first and second analog input signals. A charge sampling demultiplexer includes multiple capacitors that sample the first and second analog input signals, and generates multiple input samples representative of charge stored on the capacitors. A plurality of sub-ADCs each include first and second charge-to-time converters, which receive from the charge sampling demultiplexer respective first and second input sample of the first and second analog input signals and output respective first and second pulse-width-modulated (PWM) signals responsively to the respective first and second input samples. Temporal processing circuitry processes the PWM signals to generate a digital value indicative of a temporal difference between the first and second PWM signals. Output reordering circuitry receives the digital value from each of the sub-ADCs and generates a digital output indicative of a difference between the first and second analog input signals.
Analog to digital converter and a method for analog to digital conversion
An analog to digital converter (ADC) receives first and second analog input signals. A charge sampling demultiplexer includes multiple capacitors that sample the first and second analog input signals, and generates multiple input samples representative of charge stored on the capacitors. A plurality of sub-ADCs each include first and second charge-to-time converters, which receive from the charge sampling demultiplexer respective first and second input sample of the first and second analog input signals and output respective first and second pulse-width-modulated (PWM) signals responsively to the respective first and second input samples. Temporal processing circuitry processes the PWM signals to generate a digital value indicative of a temporal difference between the first and second PWM signals. Output reordering circuitry receives the digital value from each of the sub-ADCs and generates a digital output indicative of a difference between the first and second analog input signals.
RAMP SIGNAL CALIBRATION DEVICE
A ramp signal calibration device includes a ramp generator circuit, a detector circuitry, and a calibration circuit. The ramp generator circuit is configured to output a ramp signal according to a set signal and a calibration signal. The detector circuitry is configured to detect the ramp signal or at least one pulse signal associated with the ramp signal, in order to generate at least one control signal. The calibration circuit is configured to generate a calibration signal in response to the at least one control signal, in order to adjust at least one of a falling slope or a rising slope of the ramp signal, or to adjust a duty cycle of the at least one pulse signal.
Image sensor having high resolution analog to digital converter
An image sensor includes ADCs, each including a comparator receiving a ramp signal and an image signal, and generating a comparator output. Each ADC also includes a counter ceasing to change a digital count value in response to a change in the comparator output. The digital count value has a first resolution. Each ADC also includes a delay line circuit including a delay line generating a first digital value encoding a duration of a period of the counter clock and generating a second digital value encoding a first portion of the period of the counter clock. Each ADC also includes a delay to digital circuit generating a digital output value based on the first and digital values. The digital output value encodes a second value of the ramp signal, where the digital count value has a second resolution that is greater than the first resolution.
ANALOG-TO-DIGITAL CONVERTOR PSEUDO PERIODIC IL ESTIMATION
Aspects of the description provide for an analog-to-digital converter (ADC) operable to convert an analog input signal to an output signal at an output of the ADC. In some examples, the ADC includes multiple sub-ADCs coupled in parallel, each of the multiple sub-ADCs coupled to the output of the ADC and operable to receive the analog input signal. The ADC is configured to operate the sub-ADCs in a consecutive operation loop including a transition phase in which the ADC operates each of the sub-ADCs sequentially for a first number of sequences, an estimation phase in which the ADC operates each of the sub-ADCs sequentially for a second number of sequences following the first number of sequences, and a randomization phase in which the ADC operates subsets of the sub-ADCs for a third number of sequences following the second number of sequences.
Ramp voltage generator and image sensor
A ramp voltage generator includes: a ramping cell array including a plurality of ramping current cells; a calibration cell array including a plurality of calibration current cells; and a current-voltage converter suitable for converting a current supplied from activated ramping current cells among the ramping current cells and activated calibration current cells among the calibration current cells into a voltage to generate a ramp voltage.