Embodiments of the present disclosure include a differential digital delay line analog-to-digital converter (ADC), comprising differential digital delay lines including series coupled delay cells, wherein a delay time of a first delay line is controlled by a first input of the ADC and a delay time of a second delay line is controlled by a second input of the ADC. The ADC includes a pair of bypass multiplexers coupled at a predefined node location in the series coupled delay cells, latches each coupled with the series coupled delay cells, a converter circuit coupled with the plurality of latches configured to convert data from the latches into an output value of the ADC, and logic circuits configured to select data from the series coupled delay cells to the latches depending on a selected resolution of the differential digital delay line analog-to-digital converter.

A device for digitizing an analogue signal, wherein a distortion signal outlet of a distortion signal generator is only coupled to an analogue digital converter by passive components.

In one embodiment, an apparatus includes: a first voltage controlled oscillator (VCO) analog-to-digital converter (ADC) unit to receive a first portion of a differential analog signal and convert the first portion of the differential analog signal into a first digital value; a second VCO ADC unit to receive a second portion of the differential analog signal and convert the second portion of the differential analog signal into a second digital value; a combiner to form a combined digital signal from the first and second digital values; a decimation circuit to receive the combined digital signal and filter the combined digital signal into a filtered combined digital signal; and a cancellation circuit to receive the filtered combined digital signal and generate a distortion cancelled digital signal, based at least in part on a coefficient value.

A method for calibrating a phase nonlinearity of a digital-to-time converter is provided. The method includes generating, based on a control word, a reference signal using a phase-locked loop. A frequency of the reference signal is equal to a frequency of an output signal of the digital-to-time converter. Further, the method includes measuring a temporal order of a transition of the output signal from a first signal level to a second signal level, and a transition of the reference signal from the first signal level to the second signal level. The method additionally includes adjusting a first entry of a look-up table based on the measured temporal order.

A voltage-controlled oscillator-based delta-sigma analog-to-digital converter (VCO-based ΔΣ ADC) includes a VCO-based quantizer that includes delay elements to provide VCO outputs based on an analog input signal and combining logic to combine the VCO outputs so as to provide quantized outputs. Detection logic detects saturation of the VCO-based quantizer based on the quantized outputs and at least a portion of the VCO outputs. The VCO-based ΔΣ ADC also includes correction logic to modify the quantized outputs and provide modified quantized outputs in response to the detection logic detecting the saturation of the VCO-based quantizer and to provide the quantized outputs unmodified in the absence of saturation being detected.

An analog-to-digital conversion (ADC) system is operated with a duty cycle. During the ON period, the ADC circuits perform analog-to-digital conversions of an analog input signal. During the Standby period, the ADC system is in either a standby state or a foreground calibration state. The ADC system operates in a reduced-power mode in the standby state. In the foreground calibration state, the ADC system performs a portion of a foreground calibration cycle during a calibration time slot. The foreground calibration cycle is performed over multiple calibration time slots. The foreground calibration cycle and the calibration time slots are configurable by changing the values of control registers that represent calibration parameters.

An integrated circuit (IC) chip includes an on-chip analog signal monitoring circuit for monitoring a set of analog signals generated by one or more mixed signal cores within the IC chip, converting the analog signals into digital signals, storing the digital signals in an on-chip memory, and providing the digital signals to a test equipment upon request. The analog signal monitoring signal includes an on-chip reference generator for generating precise voltages and/or currents, a switching network for routing a selected reference signal to an analog-to-digital converter (ADC) for calibration purpose and for routing a selected analog signal from one of the mixed signal cores to the ADC for digitizing purposes. The IC chip further includes an on-chip memory for storing the digitized analog signals for subsequent accessing by a test equipment for analysis. The IC chip includes a digital analog test point (ATP) for outputting the digitized analog signals.

Methods and apparatus for reducing non-linearity in analog to digital converters are disclosed. An example apparatus includes an analog-to-digital converter to convert an analog signal into a digital signal; and a non-linearity corrector coupled to the analog-to-digital converter to determine a derivative of the digital signal; determine cross terms including a combination of the digital signal and the derivative of the digital signal; and determine a non-linearity term corresponding to a combination of the cross terms.

A signal calibration circuit and a signal calibration method are provided. The signal calibration circuit includes: an analog-to-digital conversion circuit, coupled to an output terminal of the circuit to be tested, obtaining an analog signal output by the circuit to be tested and transforming the analog signal into a digital signal; a calibration signal generation circuit, generating a calibration signal, modifying the calibration signal according to a first signal, and outputting a modified calibration signal; and a calibration circuit, coupled to the analog-to-digital conversion circuit and the calibration signal generation circuit, obtaining the digital signal and the calibration signal, calibrating the digital signal according to the modified calibration signal and outputting a calibrated digital signal. The first signal is a predetermined signal or the calibrated digital signal output by the calibration circuit.

There is disclosed herein analogue-to-digital converter circuitry, comprising a set of sub-ADC units each for carrying out analogue-to-digital conversion operations, the set comprising a given number of core sub-ADC units for carrying out said given number of core conversion operations. Also provided is control circuitry operable, when a said sub-ADC unit is determined to be a defective sub-ADC unit, to cause the core conversion operations to be carried by the sub-ADC units of the set sub-ADC units other than the defective sub-ADC unit.