An integrated self-test mechanism for monitoring an analog-to-digital converter (ADC), a reference voltage (V.sub.ref) source associated with the ADC, a low-dropout regulator (LDO), or a power supply is provided. In one example, an ADC that is associated with an integrated circuit (IC) can monitor its own V.sub.ref, the voltage (V.sub.LBO) of an LDO associated with the IC, or the voltage (AVDD) provided to an electrical coupling mechanism in the IC that is coupled to a power supply associated with the IC. The ADC can generate a digital output code based, at least in part, on the V.sub.ref and one or more of the V.sub.LBO and the AVDD. The digital output code can be used to determine whether one or more of the ADC, the V.sub.ref source, the LDO, and the power supply is malfunctioning or nonoperational.

An analog to digital (A/D) converter includes a capacitor array having respective first terminals selectively coupled to a reference voltage or ground via a plurality of switches and having respective second terminals coupled to a sample and hold (S/H) output. The A/D converter also includes a voltage comparator having a first input coupled to the S/H output and having a second input coupled to a bias voltage. The voltage comparator is configured to output a comparison voltage responsive to a sampled charge at the S/H output and the bias voltage. The A/D converter also includes a successive approximation register coupled to receive the comparison voltage and configured to output an approximate digital code responsive to the comparison voltage, wherein the approximate digital code is varied by controlling an equivalent capacitance of the capacitor array.

Techniques regarding error detection in one or more generated signals based on one or more signal-to-noise ratios are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a memory that can store computer executable components. The system can also comprise a processor, operably coupled to the memory, and that can execute the computer executable components stored in the memory. The computer executable components can comprise a signal analysis component that can determine a signal-to-noise ratio associated with a generated signal, wherein the signal-to-noise ratio incorporates a signal value based on a reference signal and a noise value based on a difference between the reference signal and an acquired signal.

A circuit for analog-digital conversion, which includes a first connection and a second connection and a third connection and a fourth connection for connecting a sensor, an analog-digital converter (ADC), whose first input is connected to the first connection and whose second input is connected to the second connection, a first current source circuit for outputting a first output current, a first switching device for the switchable connection of the first current source circuit to the first connection or to the third connection, a current source/sink circuit for outputting a second output current, a second switching device for the switchable connection of the current source/sink circuit to a reference potential or to the second connection, and a third switching device for the switchable connection of the reference potential to the second connection or to the fourth connection.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A diagnostic system for a vehicle electrical system having first and second voltage regulators outputting first and second voltages, respectively, is provided. The diagnostic system includes a microcontroller having an analog-to-digital converter, a first application, and a first diagnostic handler application. The first application sets a first analog-to-digital converter status flag equal to a first fault value when a difference between a first corrected voltage value and a second corrected voltage value is greater than a threshold difference value indicating that the analog-to-digital converter is malfunctioning. The first diagnostic handler application commanding a digital input-output device to generate control signals if the first analog-to-digital converter status flag is equal to the first fault value.

In accordance with an embodiment, a method for operating an analog-to-digital converter (ADC) includes: determining a trip point of a comparator of the ADC by applying a first signal having a first slope to an input of the ADC, and monitoring an output state of the comparator in response to the first signal; and after applying the first signal, applying a second signal having a second signal level based on the determined trip point of the comparator, monitoring values of an output code of the ADC in response to the second signal, and generating statistical information based on the monitored values of the output code, where the second signal is a static signal or has as second slope less than the first slope.

A semiconductor integrated circuit includes a digital-to-analog converter and a built-in self-test circuit. The digital-to-analog converter performs a normal conversion operation to generate an analog output signal by converting a digital input signal corresponding to an external digital signal that is provided from an external device outside the semiconductor integrated circuit and provide the analog output signal to the external device. The built-in self-test circuit, while the digital-to-analog converter performs the normal conversion operation, performs a real-time monitoring operation to generate a comparison alarm signal based on the digital input signal and the analog output signal such that the comparison alarm signal indicates whether the digital-to-analog converter operates normally. Performance and reliability of the digital-to-analog converter and the semiconductor integrated circuit including the digital-to-analog converter may be enhanced by monitoring in real-time abnormality of the digital-to-analog converter using the on-time monitor.

An analog-to-digital converter (ADC) includes a coarse ADC that receives an analog input voltage, generates a first digital signal based on the analog input voltage using a successive approximation register (SAR) method, and outputs a residual voltage remaining after the first digital signal is generated. The ADC further includes an amplifier that receives the residual voltage and a test voltage, generates a residual current by amplifying the residual voltage by a predetermined gain, and generates a test current by amplifying the test voltage by the gain. The ADC further includes a fine ADC that receives the residual current and generates a second digital signal based on the residual current using the SAR method, and an auxiliary path that receives the test current and generates a gain correction signal based on the test current. The gain of the amplifier is adjusted based on the gain correction signal.

A semiconductor circuit includes: an analog circuit that inputs a measured signal; and a digital circuit that outputs a digital output signal. The analog circuit includes: a correction element group including one or more correction elements each for correcting an offset that is an amount of shift caused by a variation in characteristics of the analog circuit to occur in a path for transmitting the measured signal; and a test element group including one or more test elements for testing the one or more correction elements. The digital circuit tests the correction element group using the test element group.