Patent classifications
H03M1/34
Analog Signal Analog-to-Digital Converter
An apparatus and method for processing signals in the analog domain. A signal is derived from analog circuit properties that is shift and scale invariant. Although the circuit properties are not quantized as in traditional digital signal processing, the signal is immune from effects of the properties, such as common mode noise, absolute voltage or current level, finite settling time, etc., as a digital signal would be. The shift and scale invariance allows for mathematical operations of addition, subtraction, multiplication and division of signals. By combining these operations, various circuits may be constructed, including a voltage controlled amplifier, a time gain amplifier, and an analog-to-digital converter. The circuits are constructed using almost no non-linear, active devices, and will thus use less power for a given speed than comparable digital devices, and will often be faster as there are no delay elements and no need to wait for the circuit properties to settle.
Analog Signal Analog-to-Digital Converter
An apparatus and method for processing signals in the analog domain. A signal is derived from analog circuit properties that is shift and scale invariant. Although the circuit properties are not quantized as in traditional digital signal processing, the signal is immune from effects of the properties, such as common mode noise, absolute voltage or current level, finite settling time, etc., as a digital signal would be. The shift and scale invariance allows for mathematical operations of addition, subtraction, multiplication and division of signals. By combining these operations, various circuits may be constructed, including a voltage controlled amplifier, a time gain amplifier, and an analog-to-digital converter. The circuits are constructed using almost no non-linear, active devices, and will thus use less power for a given speed than comparable digital devices, and will often be faster as there are no delay elements and no need to wait for the circuit properties to settle.
Multiple data rate counter, data converter including the same, and image sensor including the same
A counter includes a buffer unit and a ripple counter. The buffer unit generates at least one least significant signal of a count by buffering at least one clock signal until a termination time point. The ripple counter generates at least one most significant signal of the count by sequentially toggling in response to at least one of the least significant signal. The counter performs multiple data rate counting with enhanced operation speed and reduced power consumption.
Dual-path analog to digital converter
Methods and apparatus for processing a signal comprise at least one circuit configured to generate a measured signal during a measured time period and a reference signal during a reference time period. Also included is at least one dual- or multi-path analog-to-digital converter comprising at least a first processing circuit configured to process the measured signal, at least a second processing circuit configured to process the reference signal, and a third processing circuit configured to process both the measured signal and the reference signal.
Dual-path analog to digital converter
Methods and apparatus for processing a signal comprise at least one circuit configured to generate a measured signal during a measured time period and a reference signal during a reference time period. Also included is at least one dual- or multi-path analog-to-digital converter comprising at least a first processing circuit configured to process the measured signal, at least a second processing circuit configured to process the reference signal, and a third processing circuit configured to process both the measured signal and the reference signal.
High speed data transfer for analog-to-digital converters
This disclosure describes techniques for transferring data from an analog-to-digital converter (ADC) to a host device. The techniques may determine whether an ADC is operating in a quiet conversion time period, and selectively deactivate a digital data output of the ADC when the ADC is operating in the quiet conversion time period. This may allow an ADC to transfer data during both the conversion and acquisition phases of the ADC (rather than just during the acquisition phase), thereby increasing the data throughput of the ADC for a given transfer clock speed. The techniques may further allow data to be transferred during the conversion phase of an ADC without requiring a host device to be aware of the quiet conversion time period requirements of the ADC. In this way, the data throughput of an ADC data transfer may be increased with relatively little additional complexity added to a host device.
High speed data transfer for analog-to-digital converters
This disclosure describes techniques for transferring data from an analog-to-digital converter (ADC) to a host device. The techniques may determine whether an ADC is operating in a quiet conversion time period, and selectively deactivate a digital data output of the ADC when the ADC is operating in the quiet conversion time period. This may allow an ADC to transfer data during both the conversion and acquisition phases of the ADC (rather than just during the acquisition phase), thereby increasing the data throughput of the ADC for a given transfer clock speed. The techniques may further allow data to be transferred during the conversion phase of an ADC without requiring a host device to be aware of the quiet conversion time period requirements of the ADC. In this way, the data throughput of an ADC data transfer may be increased with relatively little additional complexity added to a host device.
SAR analog-to-digital converter selective synchronization
A successive approximation routine (SAR) analog-to-digital converter integrated circuit can include multiple analog-to-digital converters (ADCs) sharing a reference voltage that can be perturbed by a capacitor array of a digital-to-analog converter (DAC) sampling the reference voltage, which can limit conversion accuracy. Synchronizing every bit trial across the ADCs can improve accuracy but can slow the conversion. Synchronizing a subset of at least one, but fewer than N, bit trials across ADCs can help obtain both speed and robustness. This selected subset can include bit trials corresponding to pro-defined critical events, such as those events for which a stable reference voltage node is particularly desirable.
Photoelectric conversion apparatus and image capturing system
In a first sensitivity level, an AD converter performs AD conversion selectively using, in accordance with the level of the analog signal, any one of a first reference signal and a second reference signal that have mutually different slopes, and in a second sensitivity level that is different from the first sensitivity level, the AD converter performs AD conversion only using a third reference signal.
Photoelectric conversion apparatus and image capturing system
In a first sensitivity level, an AD converter performs AD conversion selectively using, in accordance with the level of the analog signal, any one of a first reference signal and a second reference signal that have mutually different slopes, and in a second sensitivity level that is different from the first sensitivity level, the AD converter performs AD conversion only using a third reference signal.