A digital-to-analog conversion circuit includes: a decoder that, if set to a first selection state, selects two different reference voltages from a reference voltage group on the basis of a digital data signal and outputs the two reference voltages as first and second selection voltages, and if set to a second selection state, selects two reference voltages from the reference voltage group in a manner allowing redundancy and outputs the two reference voltages as the first and second selection voltages; and an amplifier circuit that amplifies and outputs a voltage obtained by averaging a combination of the first and second selection voltages with weighting factors set in advance.

In some examples, a system includes an integrated circuit comprising a transistor, a first amplifier coupled to the transistor, a second amplifier having an output and coupled to the transistor and the first amplifier, and an R-2R resistor ladder having multiple rungs. Each rung is switchably coupled to a terminal of the transistor and to the output of the second amplifier. The R-2R resistor ladder includes a resistor coupled to either the transistor or the output of the second amplifier.

In some examples, a system includes an integrated circuit comprising a transistor, a first amplifier coupled to the transistor, a second amplifier having an output and coupled to the transistor and the first amplifier, and an R-2R resistor ladder having multiple rungs. Each rung is switchably coupled to a terminal of the transistor and to the output of the second amplifier. The R-2R resistor ladder includes a resistor coupled to either the transistor or the output of the second amplifier.

An analog-to-digital conversion system may include an analog-to-digital converter configured to convert an analog input signal into an equivalent digital input signal, a first filtering path configured to filter the equivalent digital input signal to generate a first filtered digital signal, wherein the first filtering path comprises a zero-overshoot monotonic step response filter, a second filtering path configured to filter the equivalent digital input signal to generate a second filtered digital signal, wherein the second filtering path comprises a frequency-selective filter; and a mixer configured to either: (i) select between the first filtered digital signal and the second filtered digital signal in order to generate an output digital signal; or (ii) combine selected proportions of each of the first filtered digital signal and the second filtered digital signal in order to generate the output digital signal.

A semiconductor device performs sequential comparison of an analog input signal and a reference voltage to digitally convert the analog input signal. The semiconductor device includes an upper DAC generating a high-voltage region of the reference voltage based on a predetermined code, a lower DAC generating a low-voltage region of the reference voltage based on the code, and an injection DAC having the same configuration as that of the lower DAC and adjusting the low-voltage region of the reference voltage.

The present invention includes: a first decoder that outputs mutually different two voltages as first and second selection voltages based on a first bit group of a digital data signal in a first selection state, and outputs one or both of the two voltages as the first and the second selection voltages in a second selection state; a second decoder that outputs mutually different two voltages as third and fourth selection voltages based on a second bit group of the digital data signal in the first selection state and outputs one voltage based on the second bit group as the third and the fourth selection voltages in the second selection state; and an amplifier circuit that averages a combination of the first and the second selection voltages or the third and the fourth selection voltages with predetermined weighting ratios and outputs the averaged voltage.

A voltage ladder is used to generate reference voltages. The voltage ladder is used by multiple digital-to-analog converters (DACs). In particular, the voltage ladder is used by multiple pulse-width modulation (PWM) DACs. Having multiple DACs utilize a common voltage ladder for their reference voltages reduces mismatched output voltages between DACs. Having multiple DACs utilize the common voltage ladder helps ensure that the reference voltages used by different DACs are not affected by process, voltage, and/or temperature variations in the reference voltages that would occur when using different voltage ladders for each DAC.

A voltage ladder is used to generate reference voltages. The voltage ladder is used by multiple digital-to-analog converters (DACs). In particular, the voltage ladder is used by multiple pulse-width modulation (PWM) DACs. Having multiple DACs utilize a common voltage ladder for their reference voltages reduces mismatched output voltages between DACs. Having multiple DACs utilize the common voltage ladder helps ensure that the reference voltages used by different DACs are not affected by process, voltage, and/or temperature variations in the reference voltages that would occur when using different voltage ladders for each DAC.

Disclosed in some examples are systems, methods, devices, and machine-readable mediums for improved communications between a software-defined radio front-end device and a network-based computing device. Rather than packetize samples together, same bit positions from multiple ADC samples may be packetized together. If a Quality of Service (QoS) metric of the network connection between the RF front-end device and the network-based processing computing drops below a threshold, the RF front-end device may prioritize sending packets with the more significant bits over packets with less significant bits. In other examples, the RF front-end device may prioritize samples corresponding to certain data types over other data types.

Disclosed in some examples are systems, methods, devices, and machine-readable mediums for improved communications between a software-defined radio front-end device and a network-based computing device. Rather than packetize samples together, same bit positions from multiple ADC samples may be packetized together. If a Quality of Service (QoS) metric of the network connection between the RF front-end device and the network-based processing computing drops below a threshold, the RF front-end device may prioritize sending packets with the more significant bits over packets with less significant bits. In other examples, the RF front-end device may prioritize samples corresponding to certain data types over other data types.