The present disclosure provides a binary weighted current source and a digital-to-analog converter, which include: a driving voltage generating circuit, generating a driving voltage based on a preset current; a current dividing circuit, connected to an output terminal of the driving voltage generating circuit; a current steering circuit, connected to the current dividing circuit. The current dividing circuit divides the driving voltage through resistors in series, and drives each of a plurality of current output transistors to output a current in response to a voltage across the current output transistor. Currents output by the plurality of current output transistor are binary weighted currents, each two of the binary weighted currents have a binary relationship, and the binary weighted currents are produced by successive binary divisions of the preset current.

In some examples, a device comprises a first driver coupled to a first node, the first node to couple to a first load external to the device. The device comprises a second driver coupled to a second node, the second node coupled to a second load internal to the device. The device comprises a comparison circuit having an inverting input coupled to the first node and a non-inverting input coupled to the second node. Sizes of the second driver and the second load are configured proportionately to sizes of the first driver and the first load, respectively.

A digital-to-analog converter includes an array of capacitors, an array of capacitor switches, positive and negative high-bandwidth reference buffers, positive and negative low-bandwidth reference buffers, and a reference-voltage-selection switch. Each capacitor switch electrically couples a respective capacitor to either a positive or a negative reference voltage line. The reference-voltage-selection switch electrically couples the positive and negative reference voltage lines to either positive and negative high-bandwidth voltages or to positive and negative low-bandwidth voltages. The positive and negative high-bandwidth voltages are produced by the positive and negative high-bandwidth reference buffers. The positive and negative low-bandwidth voltages are produced by the positive and negative low-bandwidth reference buffers.

A digital-to-analog converter includes an array of capacitors, an array of capacitor switches, positive and negative high-bandwidth reference buffers, positive and negative low-bandwidth reference buffers, and a reference-voltage-selection switch. Each capacitor switch electrically couples a respective capacitor to either a positive or a negative reference voltage line. The reference-voltage-selection switch electrically couples the positive and negative reference voltage lines to either positive and negative high-bandwidth voltages or to positive and negative low-bandwidth voltages. The positive and negative high-bandwidth voltages are produced by the positive and negative high-bandwidth reference buffers. The positive and negative low-bandwidth voltages are produced by the positive and negative low-bandwidth reference buffers.

This application relates to computing circuitry (200, 500, 600) for analogue computing. A plurality of current generators (201) are each configured to generate a defined current (I.sub.D1, I.sub.D2, . . . I.sub.Dj) based on a respective input data value (D.sub.1, D.sub.2, . . . D.sub.j). A memory array (202), having at least one set (204) of programmable-resistance memory cells (203), is arranged to receive the defined currents from each of the current generators at a respective signal line (206). Each set (204) of programmable-resistance memory cells (203) includes a memory cell associated with each signal line that, in use, can be connected between the relevant signal line and a reference voltage so as to generate a voltage on the signal line. An adder module (207) is coupled to each of the signal lines to generate a voltage at an output node (210) based on the sum of the voltages on each of the signal lines.

A semiconductor circuit and a method of operating the same are provided. The semiconductor circuit comprises a first digital-to-analog converter configured to generate a first output current in response to a first binary code, and a second digital-to-analog converter configured to generate a second output current in response to a second binary code associated with the first binary code. The semiconductor circuit further comprises a first current-to-voltage converter configured to generate a first candidate voltage based on the first output current, and a second current-to-voltage converter configured to generate a second candidate voltage based on the second output current. The semiconductor circuit further comprises a multiplexer configured to output the target voltage based on the first candidate voltage or the second candidate voltage. The target voltage includes a configurable range associated with the second binary code.

The system may include a digital-to-analog converter configured to convert a digital signal to an analog signal. The system may include sample/hold circuits configured to receive and store the analog signal. The system may include an address controller configured to regulate which sample/hold circuits propagate the analog signal. The sample/hold circuits may be configured to feed the analog signal to devices of a memory array. The system may include an output circuit configured to program the devices by comparing currents of the devices to a target current. In response to one or more of the currents of the devices being within a threshold range, the output circuit may discontinue programming the corresponding devices. In response to one or more of the currents of the devices not being within the threshold range, the output circuit may continue programming the corresponding devices.

The system may include a digital-to-analog converter configured to convert a digital signal to an analog signal. The system may include sample/hold circuits configured to receive and store the analog signal. The system may include an address controller configured to regulate which sample/hold circuits propagate the analog signal. The sample/hold circuits may be configured to feed the analog signal to devices of a memory array. The system may include an output circuit configured to program the devices by comparing currents of the devices to a target current. In response to one or more of the currents of the devices being within a threshold range, the output circuit may discontinue programming the corresponding devices. In response to one or more of the currents of the devices not being within the threshold range, the output circuit may continue programming the corresponding devices.

A number of unit cells of a digital-to-analog converter (DAC) may be simultaneously activated to generate an analog signal. However, while each unit cell may be generally the same, there may be variations such as non-linearity or noise in the analog output depending on which unit cells are activated for a given digital signal value. For example, as additional unit cells are activated for increased values of the analog signal, the fill order in which the unit cells are activated may affect the linearity/noise of the DAC. The decision units may be programmable to select which branches of the fractal DAC to activate, changing the fill order based on a fill-selection signal. The fill order may be set by a fill controller via the fill-selection signal to account for manufacturing variations, gradients in the supply voltage, output line routing, and/or environmental factors such as temperature.

A number of unit cells of a digital-to-analog converter (DAC) may be simultaneously activated to generate an analog signal. However, while each unit cell may be generally the same, there may be variations such as non-linearity or noise in the analog output depending on which unit cells are activated for a given digital signal value. For example, as additional unit cells are activated for increased values of the analog signal, the fill order in which the unit cells are activated may affect the linearity/noise of the DAC. The decision units may be programmable to select which branches of the fractal DAC to activate, changing the fill order based on a fill-selection signal. The fill order may be set by a fill controller via the fill-selection signal to account for manufacturing variations, gradients in the supply voltage, output line routing, and/or environmental factors such as temperature.