A radiographic apparatus includes a plurality of pixel groups, bias sources, and a sensing unit, wherein each pixel group includes a pixel including a conversion element for converting radiation into a charge. Each bias source supplies a bias potential to the conversion element of a pixel via a bias line. The sensing unit samples a first signal value indicating a current flowing through a first bias line connected to a first pixel group including a pixel of which a switch element is turned on and a second signal value indicating a current flowing through a second bias line connected to a second pixel group where the switch element is off at timings overlapping at least in part and determines presence or absence of radiation irradiation based on the first signal value and the second signal value. The first and second bias lines have substantially same time constants.

A photoelectric conversion apparatus includes a pixel including a photoelectric conversion circuit configured to output a signal corresponding to photon incidence. The photoelectric conversion apparatus further includes a first measurement circuit, a second measurement circuit, a selection circuit, and an output circuit. The first measurement circuit is configured to measure the signal output from the pixel. The second measurement circuit is configured to measure a time from when the first measurement circuit starts measuring the signal to when a measured value of the first measurement circuit reaches a first threshold value. The selection circuit is configured to switch a first measurement circuit to be connected to the second measurement circuit among a plurality of the first measurement circuits. The output circuit is configured to output a value of the measured time of the second measurement circuit.

A photoelectric conversion apparatus includes a pixel including a photoelectric conversion circuit configured to output a signal corresponding to photon incidence. The photoelectric conversion apparatus further includes a first measurement circuit, a second measurement circuit, a selection circuit, and an output circuit. The first measurement circuit is configured to measure the signal output from the pixel. The second measurement circuit is configured to measure a time from when the first measurement circuit starts measuring the signal to when a measured value of the first measurement circuit reaches a first threshold value. The selection circuit is configured to switch a first measurement circuit to be connected to the second measurement circuit among a plurality of the first measurement circuits. The output circuit is configured to output a value of the measured time of the second measurement circuit.

A radiation detector according to an embodiment includes a housing, an array substrate that is located inside the housing and includes multiple detecting parts detecting radiation directly or in collaboration with a scintillator, a circuit board that is located inside the housing and electrically connected with the array substrate, and a conductive part located between a ground and a plate-shaped body inside the housing, wherein the ground is film-shaped and is located in the circuit board, and the plate-shaped body is conductive and is located in the housing. The conductive part is conductive and includes a softer material than a material of the ground.

A radiation detector according to an embodiment includes a housing, an array substrate that is located inside the housing and includes multiple detecting parts detecting radiation directly or in collaboration with a scintillator, a circuit board that is located inside the housing and electrically connected with the array substrate, and a conductive part located between a ground and a plate-shaped body inside the housing, wherein the ground is film-shaped and is located in the circuit board, and the plate-shaped body is conductive and is located in the housing. The conductive part is conductive and includes a softer material than a material of the ground.

A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

A volume interrogation system can use an accelerated beam of charged particles to interrogate objects using charged-particle attenuation and scattering tomography to screen items such as portable electronic devices, packages, baggage, industrial products, or food products for the presence of materials of interest inside. The exemplary systems and methods in this patent document can be employed in checkpoint applications to scan items. Such checkpoint applications can include border crossings, mass transit terminals (subways, buses, railways, ferries, etc.), and government and private-sector facilities.

An imaging region including a plurality of detection elements each including a conversion element configured to convert radiation into an electric signal, a first signal line, and a signal processing circuit configured to process a signal output via the first signal line, wherein the plurality of detection elements include a first detection element and a second detection element which are connected to the first signal line, a sensitivity of the first detection element to radiation is set to be different from a sensitivity of the second detection element to radiation, and the signal processing circuit generates information related to irradiation of radiation to the imaging region based on signals from the first detection element and the second detection element which are connected to the first signal line.

Disclosed herein is a method of using an image sensor comprising N sensing areas for capturing images of a scene, the N sensing areas being physically separate from each other, the method comprising: for i=1, . . . , P, and j=1, . . . , Q(i), positioning the image sensor at a location (i,j) and capturing a partial image (i,j) of the scene using the image sensor while the image sensor is at the location (i,j), thereby capturing in total R partial images, wherein R is the sum of Q(i), i=1, . . . , P, wherein P>1, wherein Q(i), i=1, . . . , P are positive integers and are not all 1, wherein for i=1, . . . , P, a location group (i) comprises the locations (i,j), j=1, . . . , Q(i), and wherein a minimum distance between 2 locations of 2 different location groups is substantially larger than a maximum distance between two locations of a same location group; and determining a combined image of the scene based on the R partial images.

A photoelectric conversion panel includes multiple thin-film transistors (TFTs), multiple photodiodes respectively connected the TFTs, a bias line, and a light shielding layer that is formed in a position overlapping at least one of the photodiodes in a plan view. One of the TFTs connected to a photodiode includes an electrically conductive region that connects a drain electrode of the TFT to a source electrode of the TFT.