Photoelectric conversion apparatus includes pixel array having effective pixel, a readout circuit configured to read out signal of the pixel array, and signal processing unit configured to perform correlated double sampling process and correction process on signals read out from the effective pixel by the readout circuit. The readout circuit has function of reading out signal of the pixel array with first gain, and function of reading out signal of the pixel array with second gain. Correction value for the correction process is generated based on difference between signal read out from the pixel array with the first gain when noise level is output from the pixel array, and signal read out from the pixel array with the second gain when noise level is output from the pixel array.

An image capturing apparatus includes an image sensor configured to set an exposure period and a gain individually for each of a plurality of pixel groups, a diaphragm or a neutral density filter configured to adjust a quantity of light incident on the image sensor, at least one processor, and a memory coupled to the at least one processor, the memory having instructions that, when executed by the at least one processor, performs operations as a first control unit configured to control an exposure parameter including at least one of the exposure period and the gain for each of the plurality of pixel groups, and a second control unit configured to control the quantity of light incident on the image sensor by controlling the diaphragm or the neutral density filter based on the exposure parameter controlled by the first control unit.

An image capturing apparatus includes an image sensor configured to set an exposure period and a gain individually for each of a plurality of pixel groups, a diaphragm or a neutral density filter configured to adjust a quantity of light incident on the image sensor, at least one processor, and a memory coupled to the at least one processor, the memory having instructions that, when executed by the at least one processor, performs operations as a first control unit configured to control an exposure parameter including at least one of the exposure period and the gain for each of the plurality of pixel groups, and a second control unit configured to control the quantity of light incident on the image sensor by controlling the diaphragm or the neutral density filter based on the exposure parameter controlled by the first control unit.

Disclosed is an image sensor including a pixel array including a plurality of pixels, each of the pixels including a first photodiode and a second photodiode, each of which outputs a first pixel signal based on a first conversion gain using the second photodiode in a first period, outputs a second pixel signal based on a second conversion gain using the second photodiode in a second period, outputs a third pixel signal based on the first conversion gain using the first photodiode in a third period, and outputs a fourth pixel signal based on the second conversion gain using the first photodiode in a fourth period, an ADC circuit that performs sampling on a reset signal and an image signal of each of the first to fourth pixel signal. A sampling count and the number of sampling bits are adjusted differently from each of the first to fourth period.

A solid-state imaging apparatus includes a pixel circuit, a detection and selection circuit, and an AD conversion circuit. The pixel circuit outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit compares one or more of the plurality of pixel signals with a reference value to generate a signal selection signal that instructs selection of a pixel signal among the plurality of pixel signals. The detection and selection circuit includes a sample and hold circuit that holds the plurality of pixel signals, and selects at least one pixel signal among the plurality of pixel signals held in the sample and hold circuit based on the signal selection signal. The detection and selection circuit is arranged in a stage before the AD conversion circuit that AD converts the at least one pixel signal selected.

An image sensor includes a first pixel group, a second pixel group arranged in a same column and row as the first pixel group, a first analog-to-digital converter and a second analog-to-digital converter corresponding to the first pixel group and the second pixel group, respectively and configured to process pixel signals output from the first pixel group and the second pixel group, and a switching circuit configured to selectively transmit a first pixel signal output from the first pixel group and a second pixel signal output from the second pixel group to the first analog-to-digital converter or the second analog-to-digital converter. While the first analog-to-digital converter is connected to the first pixel group to process the first pixel signal, the second analog-to-digital converter is connected to the second pixel group to process the second pixel signal. Accordingly, auto-focus information may be more effectively obtained.

An image sensor includes a first pixel group, a second pixel group arranged in a same column and row as the first pixel group, a first analog-to-digital converter and a second analog-to-digital converter corresponding to the first pixel group and the second pixel group, respectively and configured to process pixel signals output from the first pixel group and the second pixel group, and a switching circuit configured to selectively transmit a first pixel signal output from the first pixel group and a second pixel signal output from the second pixel group to the first analog-to-digital converter or the second analog-to-digital converter. While the first analog-to-digital converter is connected to the first pixel group to process the first pixel signal, the second analog-to-digital converter is connected to the second pixel group to process the second pixel signal. Accordingly, auto-focus information may be more effectively obtained.

An object of the present invention is to reduce time required for calibration between gains in a level control circuit. The level control circuit performs, using any of first and second gains that differ from each other, level control of an analog signal output to a vertical signal line that corresponds to each column of a pixel array. An analog-digital converter converts the level-controlled analog signal into a digital signal. A test signal generating unit generates first and second test signals that differ from each other. A gain ratio acquiring unit simultaneously supplies one of the vertical signal lines with the first test signal and supplies another of the vertical signal lines with the second test signal to acquire a gain ratio between the first gain and the second gain of the level control circuit.

An object of the present invention is to reduce time required for calibration between gains in a level control circuit. The level control circuit performs, using any of first and second gains that differ from each other, level control of an analog signal output to a vertical signal line that corresponds to each column of a pixel array. An analog-digital converter converts the level-controlled analog signal into a digital signal. A test signal generating unit generates first and second test signals that differ from each other. A gain ratio acquiring unit simultaneously supplies one of the vertical signal lines with the first test signal and supplies another of the vertical signal lines with the second test signal to acquire a gain ratio between the first gain and the second gain of the level control circuit.

An imaging device capable of reducing erroneous detection of a luminance change is provided.

According to one embodiment of the present disclosure, there is provided an imaging device including: a photoelectric conversion element configured to generate an optical current acquired by photoelectrically converting incident light; a current-voltage conversion circuit configured to convert the optical current into a voltage signal; a threshold monitoring circuit configured to monitor the optical current; a plurality of capacitance elements including a variable capacitance element of which a capacitance value changes on the basis of a monitoring result of the threshold monitoring circuit; and an event detecting circuit configured to detect a luminance change of the incident light on the basis of a result of comparison between an amplified voltage acquired by amplifying the voltage signal on the basis of a capacitance ratio of the plurality of capacitance elements and a threshold voltage.