H04N25/76

IMAGING DEVICE AND ELECTRONIC DEVICE

An imaging device which has a stacked-layer structure and can be manufactured easily is provided. The imaging device includes a signal processing circuit, a memory device, and an image sensor. The imaging device has a stacked-layer structure in which the memory device is provided above the signal processing circuit, and the image sensor is provided above the memory device. The signal processing circuit includes a transistor formed on a first semiconductor substrate, the memory device includes a transistor including a metal oxide in a channel formation region, and the image sensor includes a transistor formed on a second semiconductor substrate.

IMAGING SYSTEM AND METHOD OF CREATING COMPOSITE IMAGES

An imaging system and a method of creating composite images are provided. The imaging system includes one or more lens assemblies coupled to a sensor. When reflected light from an object enters the imaging system, incident light on the metalens filter systems creates filtered light, which is turned into composite images by the corresponding sensors. Each metalens filter system focuses the light into a specific wavelength, creating the metalens images. The metalens images are sent to the processor, wherein the processor combines the metalens images into one or more composite images. The metalens images are combined into a composite image, and the composite image has reduced chromatic aberrations.

Imaging system and imaging device

An imaging system according to the present disclosure includes: an imaging device that is mounted in a vehicle, and captures and generates an image of a peripheral region of the vehicle; and a processing device that is mounted in the vehicle, and executes processing related to a function of controlling the vehicle on the basis of the image. The imaging device includes: a first control line, a first voltage generator that applies a first voltage to the first control line, a first signal line, a plurality of pixels that applies a pixel voltage to the first signal line, a first dummy pixel that applies a voltage corresponding to the first voltage of the first control line to the first signal line in a first period, a converter including a first converter that performs AD conversion on the basis of a voltage of the first signal line in the first period to generate a first digital code, and a diagnosis section that performs diagnosis processing on the basis of the first digital code. The above-described processing device restricts the function of controlling the vehicle on the basis of a result of the diagnosis processing.

Event-driven image sensor and method of reading the same

The present disclosure relates to an event-driven sensor comprising: a pixel array (102); a column readout circuit (104) comprising, for each of the column output lines, a column register cell (108) configured to activate a column event output signal (addrx) when it receives a first token while the detection of an event is indicated on the column output line; and a row readout circuit (106) comprising, for each of the row output lines, or for each of a plurality of sub-groups of the row output lines, a row register cell (108) configured to activate a row event output signal (addry) when it receives a second token while an event is indicated on the row output line, or on one of the row output lines of the sub-group.

Event-driven image sensor and method of reading the same

The present disclosure relates to an event-driven sensor comprising: a pixel array (102); a column readout circuit (104) comprising, for each of the column output lines, a column register cell (108) configured to activate a column event output signal (addrx) when it receives a first token while the detection of an event is indicated on the column output line; and a row readout circuit (106) comprising, for each of the row output lines, or for each of a plurality of sub-groups of the row output lines, a row register cell (108) configured to activate a row event output signal (addry) when it receives a second token while an event is indicated on the row output line, or on one of the row output lines of the sub-group.

Image sensor with voltage supply grid clamping

An image sensing device includes an image sensing circuit, a voltage supply grid, bitlines, and a control circuit. The image sensing circuit includes pixels arranged in rows and columns. Each one of the bitlines is coupled to a corresponding one of the columns. The voltage supply grid is coupled to the pixels. The control circuit is coupled to output at least a row select signal and a transfer signal to the rows. Each one of the rows is selectively coupled to the bitlines to selectively output image data signals in response to the row select signal and the transfer signal. Each one of the rows is further selectively coupled to the bitlines to selectively clamp the bitlines in response to the row select signal and the transfer signal. Each one of the rows is selectively decoupled from the bitlines in response to the row select signal.

Image sensor with voltage supply grid clamping

An image sensing device includes an image sensing circuit, a voltage supply grid, bitlines, and a control circuit. The image sensing circuit includes pixels arranged in rows and columns. Each one of the bitlines is coupled to a corresponding one of the columns. The voltage supply grid is coupled to the pixels. The control circuit is coupled to output at least a row select signal and a transfer signal to the rows. Each one of the rows is selectively coupled to the bitlines to selectively output image data signals in response to the row select signal and the transfer signal. Each one of the rows is further selectively coupled to the bitlines to selectively clamp the bitlines in response to the row select signal and the transfer signal. Each one of the rows is selectively decoupled from the bitlines in response to the row select signal.

LIGHT RECEIVING DEVICE, METHOD OF CONTROLLING LIGHT RECEIVING DEVICE, AND ELECTRONIC APPARATUS
20230014474 · 2023-01-19 ·

A light receiving device of the present disclosure includes an imaging section in which a pixel including a light receiving element is disposed, a read processing section that reads a pixel signal from the imaging section, a signal processing section that executes predetermined signal processing on the pixel signal read by the read processing section, and a system controller, and has a short distance mode that is freely settable. The system controller has a function of calculating, when the short distance mode is set, a distance to a distance measurement target with use of the pixel signal in a partial region within a pixel region of the imaging section, and a function of determining whether or not the distance calculated satisfies a detection condition that is set in advance.

IMAGE SENSOR WITH CONTROLLED SPAD AVALANCHE
20230013026 · 2023-01-19 ·

There is provided an image sensor employing an avalanche diode. The image sensor includes a plurality of pixel circuits arranged in a matrix, a plurality of pulling circuits and a global current source circuit. Each of the plurality of pixel circuits includes a single photon avalanche diode (SPAD) and a floating diffusion. Each of the plurality of pulling circuits is arranged corresponding to one pixel circuit column. The global current source circuit is used to form a current mirror with each of the plurality of pulling circuits. The floating diffusion is used to record a voltage of one photon event detected by the SPAD in an exposure period.

IMAGING ELEMENT

The present technology relates to an imaging element that can reduce noise. The imaging element includes: a photoelectric conversion element; a first amplification element that amplifies a signal from the photoelectric conversion element; a second amplification element that amplifies an output from the first amplification element; an offset element provided between the first amplification element and the second amplification element; a first reset element that resets the first amplification element; and a second reset element that resets the second amplification element. The offset element is a capacitor. A charge is accumulated in the offset element via a feedback loop of an output from the second amplification element, and an offset bias is generated. The present technology can be applied to an imaging element.