Patent classifications
H05B47/21
MULTIPLE-OUTPUT LOAD DRIVING DEVICE
A multiple-output load driving device includes a plurality of output terminals (OUT1 to OUT4) for outputting an output current to each of a plurality of loads (Z1 to Z4), a control portion (8) configured to select either a non-DC current mode in which a non-DC current is used as the output current or a DC current mode in which a DC current is used as the output current, and a first terminal (MSET2). In a case where a low-level signal is supplied to the first terminal, in the non-DC current mode, the non-DC current is outputted from all of the plurality of output terminals. In a case where a high-level signal is supplied to the first terminal, in the non-DC current mode, the DC current is outputted from a predetermined one (OUT4) of the output terminals, while the non-DC current is outputted from the other output terminals (OUT1 to OUT3).
Test architecture for light emitting diode arrays
Apparatuses and methods are presented relating to a plurality of current sources for generating a plurality of first bias currents to drive a plurality of LEDs and a plurality of measurement circuits for obtaining a plurality of first voltage measurements for the LEDs during a first test cycle. The current sources are further configurable to generate a plurality of second bias currents for driving the LEDs, and the measurement circuits are further configurable to obtain a plurality of second voltage measurements for the plurality of LEDs, during a second test cycle. A memory device is configured to store the first and second bias currents and first and second voltage measurements as a current-voltage (I-V) performance characteristic.
Test architecture for light emitting diode arrays
Apparatuses and methods are presented relating to a plurality of current sources for generating a plurality of first bias currents to drive a plurality of LEDs and a plurality of measurement circuits for obtaining a plurality of first voltage measurements for the LEDs during a first test cycle. The current sources are further configurable to generate a plurality of second bias currents for driving the LEDs, and the measurement circuits are further configurable to obtain a plurality of second voltage measurements for the plurality of LEDs, during a second test cycle. A memory device is configured to store the first and second bias currents and first and second voltage measurements as a current-voltage (I-V) performance characteristic.
Test Architecture for Light Emitting Diode Arrays
Apparatuses and methods are presented relating to a plurality of current sources for generating a plurality of first bias currents to drive a plurality of LEDs and a plurality of measurement circuits for obtaining a plurality of first voltage measurements for the LEDs during a first test cycle. The current sources are further configurable to generate a plurality of second bias currents for driving the LEDs, and the measurement circuits are further configurable to obtain a plurality of second voltage measurements for the plurality of LEDs, during a second test cycle. A memory device is configured to store the first and second bias currents and first and second voltage measurements as a current-voltage (I-V) performance characteristic.
Backlight test circuit, backlight test method and backlight module using the same
Disclosed is a backlight test circuit including N circuit blocks. Each circuit block includes M mini-LED circuits, and each mini-LED circuit includes L mini-LEDs and a switching circuit. The L mini-LEDs are connected in parallel or in serial as a mini-LED set. The switching circuit controls the turning on and the turning off of the mini-LED set according to a control signal. N, M and L are positive integers. During a backlight test, in each circuit block, at least one of the mini-LED sets is turned on. By using this backlight test circuit, the abnormal mini-LED circuit can be found. Thus, a producer can only execute a rework process for the abnormal mini-LED circuit without extra cost.
Backlight test circuit, backlight test method and backlight module using the same
Disclosed is a backlight test circuit including N circuit blocks. Each circuit block includes M mini-LED circuits, and each mini-LED circuit includes L mini-LEDs and a switching circuit. The L mini-LEDs are connected in parallel or in serial as a mini-LED set. The switching circuit controls the turning on and the turning off of the mini-LED set according to a control signal. N, M and L are positive integers. During a backlight test, in each circuit block, at least one of the mini-LED sets is turned on. By using this backlight test circuit, the abnormal mini-LED circuit can be found. Thus, a producer can only execute a rework process for the abnormal mini-LED circuit without extra cost.
Carrier controlled light-emitting diode light and light-emitting diode light string having the same
A carrier-controlled LED light includes at least one LED and a drive unit. The drive unit is coupled to the at least one LED, and receives a carrier light signal to control the at least one LED to proceed to light. The drive unit includes a light control unit and a comparison unit. The light control unit drives a light action of the at least one LED according to a light command content of the carrier light signal. The comparison unit receives a DC working electricity and compares the DC working electricity with a reference voltage value. When a voltage value of the DC working electricity is less than the reference voltage value, the light control unit enters a sleep mode.
Carrier controlled light-emitting diode light and light-emitting diode light string having the same
A carrier-controlled LED light includes at least one LED and a drive unit. The drive unit is coupled to the at least one LED, and receives a carrier light signal to control the at least one LED to proceed to light. The drive unit includes a light control unit and a comparison unit. The light control unit drives a light action of the at least one LED according to a light command content of the carrier light signal. The comparison unit receives a DC working electricity and compares the DC working electricity with a reference voltage value. When a voltage value of the DC working electricity is less than the reference voltage value, the light control unit enters a sleep mode.
CARRIER CONTROLLED LIGHT-EMITTING DIODE LIGHT AND LIGHT-EMITTING DIODE LIGHT STRING HAVING THE SAME
A carrier-controlled LED light includes at least one LED and a drive unit. The drive unit is coupled to the at least one LED, and receives a carrier light signal to control the at least one LED to proceed to light. The drive unit includes a light control unit and a comparison unit. The light control unit drives a light action of the at least one LED according to a light command content of the carrier light signal. The comparison unit receives a DC working electricity and compares the DC working electricity with a reference voltage value. When a voltage value of the DC working electricity is less than the reference voltage value, the light control unit enters a sleep mode.
CHAINED FLASHLIGHT SYSTEM
A chained flashlight system includes: plural flashlights; plural lighting control devices that control lighting of the plural flashlights, respectively; a communication wire; and a traffic control device. The plural lighting control devices include receiving units, controlling units, activating units, and power supply units, respectively and are coupled to the traffic control device by the communication wire. The traffic control device simultaneously sends an activating signal to the plural lighting control devices via the communication wire. The receiving units receive the activating signal. The controlling units activate the activating units based on a time from reception of the activating signal to activation of the activating units, set for the flashlights, respectively. When the power supply units are turned ON in an activated state of the activating units, respectively, the flashlights are lit by a lighting signal from the traffic control device, respectively.