Some embodiments include a system, comprising: an enclosure configured to enclose a vacuum; a cathode disposed within the enclosure; an anode disposed within the enclosure configured to receive a beam of electrons from the cathode; a motor disposed within the enclosure and configured to rotate the anode in response to a drive input; and a circuit electrically connected to the drive input, and configured to generate a phase signal based on a voltage of the drive input and a current of the drive input, the phase signal indicating a phase difference between the voltage of the drive input and the current of the drive input.

An x-ray imaging apparatus 10 comprising a support 30 having two arms, wherein on one arm an x-ray emitter 50 is arranged, and on the other arm a flat panel digital detector 60 is arranged, the emitter and detector arranged opposite each other providing a space therebetween for the positioning of an object for x-ray imaging by the apparatus, the x-ray emitter comprising an array of emitters, the apparatus arranged such that in use different emitters are energisable independently from one another such that 3-dimensional tomosynthesis images are obtainable of the object, with the object, emitter and detector maintained stationary relative to one another.

The invention relates to an x-ray source (100; 100a; 100b; 100c), comprising an electron source (110) for providing electrons (e) in the form of an electron beam (es) and a target element (120), on which the electrons (e) of the electron beam (es) of the electron source (110) are able to impinge, and at least one deflection device (140) enabling the electron beam (es) to be deflected from a propagation direction produced by the electron source (110), wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently with a trajectory (180) incident on the target element (120), but outside a center of the target element (120) or a region (150) of the target element (120) on which the electron beam (es) is incident in the case of a propagation direction without deflection, or wherein the at least one deflection device (140) is configured to deflect the electron beam (es) at least intermittently in such a way that the electron beam (es) is not incident on the target element (120).

Systems and methods for improving x-ray sources with switchable electron emitters. Improved systems may use the functionality of the switchable electron emitters in various configurations to provide power regulation, multidimensional analysis, and electron beam forming so as to increase the durability and the reliability of the system. Cooling mechanisms may be used to further protect the anode from deterioration over time.

According to one embodiment, an X-ray diagnostic apparatus includes an X-ray tube, a driver, a supporter, and processing circuitry. The X-ray tube including a rotating anode. The driver rotates the rotating anode. The supporter supports the X-ray tube in an inclinable manner. The processing circuitry acquires information indicating an attitude of the supporter and controls the driver based on information indicating the acquired attitude.

According to one embodiment, an X-ray diagnostic apparatus includes an X-ray tube, a driver, a supporter, and processing circuitry. The X-ray tube including a rotating anode. The driver rotates the rotating anode. The supporter supports the X-ray tube in an inclinable manner. The processing circuitry acquires information indicating an attitude of the supporter and controls the driver based on information indicating the acquired attitude.

A method is described for measuring a moving property of a target. The method includes: forming a remaining plasma that at least partially coincides with an extended target region, the remaining plasma being a plasma formed from an interaction between a prior target and a prior radiation pulse in a target space; releasing a current target along a trajectory toward the target space that is at least partly overlapping the extended target region; determining one or more moving properties of the current target when the current target is within the extended target region and after a prior and adjacent target has interacted with a prior radiation pulse in the target space; and if any of the determined one or more moving properties of the current target are outside an acceptable range, then adjusting one or more characteristics of a radiation pulse directed toward the target space.

Systems and methods for improving x-ray sources with pulsed x-ray sources arranged in a movable arc around a central axis. Improved systems may use the functionality of the switchable x-ray sources in various configurations to provide imaging with controlled exposure of a subject to x-rays.

Provided is an X-ray apparatus and a method of controlling an X-ray apparatus capable of detecting a sign of breakage of a filament. A method of controlling an X-ray apparatus for performing control involving controlling a filament current flowing through a filament of a cathode part to maintain constant a tube current flowing between the cathode part and an anode part with a target, includes: monitoring the current value of at least one of the filament current and the tube current; detecting the mode of change in the current value; determining the presence or absence of a sign of breakage of the filament based on the mode of change in the current value; and issuing a warning based on the determination.

Provided is an X-ray apparatus and a method of controlling an X-ray apparatus capable of detecting a sign of breakage of a filament. A method of controlling an X-ray apparatus for performing control involving controlling a filament current flowing through a filament of a cathode part to maintain constant a tube current flowing between the cathode part and an anode part with a target, includes: monitoring the current value of at least one of the filament current and the tube current; detecting the mode of change in the current value; determining the presence or absence of a sign of breakage of the filament based on the mode of change in the current value; and issuing a warning based on the determination.