A lower electrode of a PIN diode and a second protective layer covering the PIN diode are formed not using separate mask processes, but using the same mask process using the same mask, thereby reducing the number of mask processes and thus increasing process efficiency. Further, the lower electrode of the PIN diode is patterned and then the second protective film covering the PIN diode is patterned such that both the former patterning and the latter patterning are carried out using a single mask process, thereby reduce increase in defects due to foreign materials or stains.

An X-ray system includes an X-ray generation unit configured to generate X-rays; an X-ray detection unit including at least one X-ray sensor that includes an indirect bandgap, perovskite semiconductor material, the X-ray sensor being configured to record the X-rays; and a control unit that controls a generation of the X-rays and a detection of the X-rays at the X-ray detection unit.

An is disclosed. The apparatus comprises a two-dimensional perovskite having a polaronic emission Stokes' shifted by at least 50 nm to minimise loss due to re-absorption.

An is disclosed. The apparatus comprises a two-dimensional perovskite having a polaronic emission Stokes' shifted by at least 50 nm to minimise loss due to re-absorption.

A lower electrode of a PIN diode and a second protective layer covering the PIN diode are formed not using separate mask processes, but using the same mask process using the same mask, thereby reducing the number of mask processes and thus increasing process efficiency. Further, the lower electrode of the PIN diode is patterned and then the second protective film covering the PIN diode is patterned such that both the former patterning and the latter patterning are carried out using a single mask process, thereby reduce increase in defects due to foreign materials or stains.

A lower electrode of a PIN diode and a second protective layer covering the PIN diode are formed not using separate mask processes, but using the same mask process using the same mask, thereby reducing the number of mask processes and thus increasing process efficiency. Further, the lower electrode of the PIN diode is patterned and then the second protective film covering the PIN diode is patterned such that both the former patterning and the latter patterning are carried out using a single mask process, thereby reduce increase in defects due to foreign materials or stains.

A photodetector array (1) is provided comprising a plurality of pixels (10.sub.ij) between a supply line (4j) and a common electrode (2). Respective pixels (10.sub.ij) comprise a photon radiation sensitive element (11.sub.ij) arranged in a series connection with a switching element (20.sub.ij) characterized in that the series connection further includes a resistive element (30ij).

According to one embodiment, a radiation detector includes a detecting part, and a transmitting part. The detecting part is configured to output a signal. The signal corresponds to radiation incident on the detecting part. The transmitting part includes a first conductive layer, a second conductive layer, and an organic layer. The first conductive layer is electrically connected with the detecting part, and is configured to transmit the signal. The second conductive layer is separated from the first conductive layer. At least a portion of the organic layer is between the first conductive layer and the second conductive layer.

Electronic devices comprising a first layer, said first layer comprising a perovskite material; and a coating layer disposed on a surface of said first layer; wherein said coating layer comprises a coating oxysalt. Also provided herein are perovskite materials comprising: a coating layer on at least a portion of a surface of said perovskite material; wherein said coating layer comprises a coating oxysalt. Further provided herein are methods for forming a coating layer on a surface of a perovskite material comprising steps of: exposing said surface to a fluid having a precursor oxysalt dissolved therein such that said coating layer forms on said surface via a chemical reaction between said perovskite material and said precursor oxysalt; wherein said coating layer comprises a coating oxysalt.

According to one embodiment, a radiation detector includes a base body, a first radiation detection element, and a second radiation detection element. The base body includes a first surface. The first surface includes first and second partial regions. A first direction from the first partial region toward the second partial region is along the first surface. The first radiation detection element is fixable to the first partial region. The second radiation detection element includes a first detecting part fixable to the second partial region. The first detecting part includes first and second end portions. A second direction from the first end portion toward the second end portion crosses the first surface. The second end portion is between the first end portion and the second partial region in the second direction. The first radiation detection element does not overlap the first end portion in the first direction.