A vacuum sample chamber for a particle and optical device includes on one surface thereof, an aperture through which a particle beam to be focused along an optical axis of particles such as electrons, ions and neutral particles is incident; and on the opposite surface thereof, a detachable sample holder through which light penetrates, thereby enabling a sample to be observed and analyzed by means of the particle beam and light. A sample chamber is capable of reducing observation time by maintaining a vacuum therein even when a sample is put into or taken out from a sample chamber of an electron microscope or focused ion beam observation equipment, and capable of obtaining an optical image on the outside thereof without inserting a light source or an optical barrel into the sample chamber. A light-electron fusion microscope comprising the sample chamber.

An object of the present invention is to provide a charged particle beam device that suppresses the influence of an external electromagnetic wave, even when a shielding member, such as a vacuum valve, is in the open state. To achieve the above object, a charged particle beam device including a vacuum chamber (111) having an opening (104) that surrounds a sample delivery path is proposed. The charged particle beam device includes a conductive material (118) surrounding the opening (104) for conduction between the vacuum chamber (111) and a conductive member (106) disposed on the atmosphere side. According to an embodiment of the present invention, it is possible to restrict an electromagnetic wave (117) from reaching the sample chamber via the delivery path.

A nozzle-type electron beam irradiation device includes a vacuum chamber, an electron beam generator disposed in the vacuum chamber, and a vacuum nozzle that is connected to the vacuum chamber so as to guide an electron beam from the electron beam generator and emit the electron beam to the outside. The nozzle-type electron beam irradiation device includes a high-vacuum pump capable of sucking gas from the vicinity of the connecting part of the vacuum nozzle in the vacuum chamber.

Sterilization apparatus for sterilizing packaging containers, the sterilization apparatus comprising a first carousel for supporting a plurality of sterilization devices, the sterilization devices being adapted to sterilize an interior of the packaging containers by electron beam irradiation, and a transport system for transporting the packaging containers, the transport system comprising a second carousel coaxial with the first carousel, wherein the first carousel comprises a first rotatable shaft and the second carousel comprises a separate second rotatable shaft coaxial with the first rotatable shaft.

An XRF analyzer can include an x-ray source and an x-ray detector; an x-ray source heat-sink adjacent a side of the x-ray source; and an x-ray detector heat-sink adjacent a side of the x-ray detector. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a material having a thermal conductivity of less than 20 W/(m*K). In another embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by at least 3 millimeters of a thermally insulating material. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a segment of the engine component casing. Separation of the heat sinks can help avoid heat from the x-ray source adversely affecting resolution of the x-ray detector.

A control mechanism for a high-voltage generator that provides voltage and current to an electronic radiation source in a high-temperature environment is provided, the control mechanism including at least an intermediate enveloping ground plane, and a ground-plane potential monitoring system that provides an input to a control processor that in turn drives the high-voltage generator. A method of controlling a high-voltage generator that powers an electronic radiation source is also provided, the method including at least: measuring an enveloping ground plane potential such that a change in the potential of said enveloping ground plane surrounding the generator is monitored and used to determine the beginning of one or more of a partial discharge and flash-over event.

An XRF analyzer can include an x-ray source and an x-ray detector; an x-ray source heat-sink adjacent a side of the x-ray source; and an x-ray detector heat-sink adjacent a side of the x-ray detector. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a material having a thermal conductivity of less than 20 W/(m*K). In another embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by at least 3 millimeters of a thermally insulating material. In one embodiment, the x-ray source heat-sink can be separated from the x-ray detector heat sink by a segment of the engine component casing. Separation of the heat sinks can help avoid heat from the x-ray source adversely affecting resolution of the x-ray detector.

A vacuum sample chamber for a particle and optical device includes on one surface thereof, an aperture through which a particle beam to be focused along an optical axis of particles such as electrons, ions and neutral particles is incident; and on the opposite surface thereof, a detachable sample holder through which light penetrates, thereby enabling a sample to be observed and analyzed by means of the particle beam and light. A sample chamber is capable of reducing observation time by maintaining a vacuum therein even when a sample is put into or taken out from a sample chamber of an electron microscope or focused ion beam observation equipment, and capable of obtaining an optical image on the outside thereof without inserting a light source or an optical barrel into the sample chamber. A light-electron fusion microscope comprising the sample chamber.

An apparatus for thermal ablation testing is provided. The apparatus comprises a chamber; an optically transparent window in the chamber; a sample holder inside the chamber; a test sample in the sample holder; a number of bare-wire thermocouples connected to the test sample, wherein the thermocouples generate temperature data in the form of voltage; a mass balance inside the chamber, wherein the mass balance is configured to hold the sample holder and dynamically detect changes in mass of the test sample; an external radiant heat source configured to heat the test sample through the window; a plasma source configured to generate a number of atomic species in the chamber; and a pyrometer directed at the test sample.

A portable XRF analyzer includes a hand shield and a handle. In one embodiment, the XRF analyzer further comprises a power component spaced-apart from an engine component. The handle and the hand shield extend in parallel between the engine component and the power component, attaching the engine component to the power component. In another embodiment, the XRF analyzer further comprises two housing portions, each integrally formed in a single, monolithic body formed together at the same time. The two housing portions are joined together to form an XRF analyzer housing. In another embodiment, the hand shield is shorter than the handle.