An ion detector includes a first stage dynode configured to receive an ion beam and generate electrons, a photon source arranged to provide photons to the first stage dynode, the photons of sufficient energy to cause the first stage dynode to emit photoelectrons, an electron multiplier configured to receive the electrons or the photoelectrons from the first stage dynode and generate an output proportional to the number of electrons or photoelectrons, and a controller. The controller is configured to receive the output generated in response to the photoelectrons; calculate a gain curve of the detector based on the output; and set a voltage of the electron multiplier or the first stage dynode to achieve a target gain for the ion beam.

A channel electron multiplier having a high aspect ratio and differential coatings along its channel length is disclosed. The elongated tube has an input end, an output end, and an interior surface extending along the length of the tube between the input end and the output end. The channel electron multiplier also has first and second conductive layers formed on the interior surface of the tube. The first conductive layer is selected to provide a first electrical resistance, a first electron emission characteristic, or both, and the second conductive layer is selected to provide a second electrical resistance, a second electron emission characteristic, or both. A method of making a channel electron multiplier having two or more different conductive layers is also disclosed.

Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

Provided is a time-of-flight mass spectrometer including: an ionization part receiving electron beams to thereby emit ions; a cold electron supply part injecting the electron beams to the ionization part; an ion detection part detecting the ions emitted from the ionization part; and an ion separation part connecting the ionization part and the ion detection part, wherein the cold electron supply part includes a microchannel plate receiving ultraviolet rays to thereby emit the electron beams, the ions emitted from the ionization part pass through the ion separation part to thereby reach the ion detection part, and the ion separation part has a straight tube shape.

An apparatus for generating and focusing electrons is provided. The apparatus has an emissive material configured to emit an electron, an electron target, and an electrical potential gradient generator configured to generate an electrical potential gradient within the emissive material. The electrical potential gradient is oriented so as to vary from positive to negative in the general direction toward the electron target. In operation, an electron emitted from the emissive materials is deflected away from the emissive material and generally toward the electron target. The apparatus may be incorporated in scientific analytical equipment such as an electron multiplier.

An apparatus for generating and focusing electrons is provided. The apparatus has an emissive material configured to emit an electron, an electron target, and an electrical potential gradient generator configured to generate an electrical potential gradient within the emissive material. The electrical potential gradient is oriented so as to vary from positive to negative in the general direction toward the electron target. In operation, an electron emitted from the emissive materials is deflected away from the emissive material and generally toward the electron target. The apparatus may be incorporated in scientific analytical equipment such as an electron multiplier.

An apparatus for generating and focusing electrons is provided. The apparatus has an emissive material configured to emit an electron, an electron target, and an electrical potential gradient generator configured to generate an electrical potential gradient within the emissive material. The electrical potential gradient is oriented so as to vary from positive to negative in the general direction toward the electron target. In operation, an electron emitted from the emissive materials is deflected away from the emissive material and generally toward the electron target. The apparatus may be incorporated in scientific analytical equipment such as an electron multiplier.

An apparatus for generating and focusing electrons is provided. The apparatus has an emissive material configured to emit an electron, an electron target, and an electrical potential gradient generator configured to generate an electrical potential gradient within the emissive material. The electrical potential gradient is oriented so as to vary from positive to negative in the general direction toward the electron target. In operation, an electron emitted from the emissive materials is deflected away from the emissive material and generally toward the electron target. The apparatus may be incorporated in scientific analytical equipment such as an electron multiplier.