Disclosed herein is a photomultiplier comprising: an electron ejector; a detector; a substrate; and a first electrode in the substrate; a second electrode in the substrate; a third electrode in the substrate; wherein each of the first, second and third electrodes comprises a flat or curved surface at an angle to a normal direction of the substrate; wherein each of the first, second and third electrodes comprises a first end and a second end, the first end being closer to the electron ejector than the second end; wherein the first, second and third electrodes are spatially arranged such that the second ends of the first, second and third electrode are on a same plane, or such that a plane the second ends of the first and third electrodes are on crosses the second electrode.

Certain embodiments described herein are directed to detectors and systems using them. In some examples, the detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In some instances, an analog signal from a non-saturated dynode is measured and cross-calibrated with a pulse count signal to extend the dynamic range of the detector.

Certain embodiments described herein are directed to detectors and systems using them. In some examples, the detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In some instances, an analog signal from a non-saturated dynode is measured and cross-calibrated with a pulse count signal to extend the dynamic range of the detector.

Certain embodiments described herein are directed to ion detectors and systems. In some examples, the ion detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In other configurations, each dynode can be coupled to a respective electrometer. Methods using the ion detectors are also described.

Certain embodiments described herein are directed to ion detectors and systems. In some examples, the ion detector can include a plurality of dynodes, in which one or more of the dynodes are coupled to an electrometer. In other configurations, each dynode can be coupled to a respective electrometer. Methods using the ion detectors are also described.

The present embodiment relates to an ion detector provided with a structure for suppressing degradation over time in an electron multiplication mechanism in the ion detector. The ion detector includes a dynode unit, serving as an electron multiplication mechanism, which multiplies secondary electrons which are emitted in response to incidence of ions, and a semiconductor detector having an electron multiplication function. Further, a focus electrode having an opening that allows passage of secondary electrons is disposed on a trajectory of secondary electrons which are directed from the dynode unit toward the semiconductor detector, and the focus electrode functions to guide secondary electrons from the dynode unit onto an electron incidence surface of the semiconductor detector.

The present embodiment relates to an ion detector provided with a structure for suppressing degradation over time in an electron multiplication mechanism in the ion detector. The ion detector includes a dynode unit, serving as an electron multiplication mechanism, which multiplies secondary electrons which are emitted in response to incidence of ions, and a semiconductor detector having an electron multiplication function. Further, a focus electrode having an opening that allows passage of secondary electrons is disposed on a trajectory of secondary electrons which are directed from the dynode unit toward the semiconductor detector, and the focus electrode functions to guide secondary electrons from the dynode unit onto an electron incidence surface of the semiconductor detector.

An apparatus for amplifying an electron signal caused by the impact of a particle with an electron emissive surface. The apparatus includes: a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons, a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces. The bias voltage(s) is sufficient to form the amplified electron signal. The apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s). The apparatus may be used as part of detector in a mass spectrometer, for example.

An apparatus for amplifying an electron signal caused by the impact of a particle with an electron emissive surface. The apparatus includes: a first electron emissive surface configured to receive an input particle and thereby emit one or more secondary electrons, a series of second and subsequent electron emissive surfaces configured to form an amplified electron signal from the one or more secondary electrons emitted by the first electron emissive surface, and one or more power supplies configured to apply bias voltage(s) to one or more of the emissive surfaces. The bias voltage(s) is sufficient to form the amplified electron signal. The apparatus is configured such that the terminal electron emissive surface(s) of the series of second and subsequent electron emissive surfaces draw a higher electrical current than that of the remainder electron emissive surface(s). The apparatus may be used as part of detector in a mass spectrometer, for example.

Disclosed herein is a photomultiplier tube (PMT) comprising: an electron ejector configured for emitting primary electrons in response to an incident photon; a detector configured for collecting electrons and providing an output signal representative of the incident photon; and a series of electrodes between the electron ejector and the detector, wherein each of the electrodes is configured for emitting secondary electrons in response to incident electrons, and each of the electrodes includes a bi-metal arc-shaped sheet.