Patent classifications
H01J49/0077
Ion guide with reduced noding effect
An ion optical arrangement (1) for use in a mass spectrometer comprises electrodes (11, 12, 14) comprising a multipole arrangement defining an ion optical axis, and a voltage source for providing voltages to the electrodes to produce electric fields. The ion optical arrangement is configured for producing a radio frequency electric focusing field for focusing ions on the ion optical axis. The radio frequency electric focusing field has a varying frequency so as to reduce any mass dependence of ion trajectories through the ion optical arrangement. The ion optical arrangement may further be configured for producing a static electric field in response to a DC bias voltage applied to the multipole arrangement. A superimposed varying electric field may be produced by superimposing an AC voltage upon the DC bias voltage.
METHODS IN MASS SPECTROMETRY USING COLLISION GAS AS ION SOURCE
A mass spectrometry method comprising steps of generating an ion beam from an ion source; directing the ion beam into a collision cell; introducing into the collision cell through a gas inlet on the collision cell a charge-neutral analyte gas or reaction gas; ionizing the analyte gas or reaction gas in the collision cell by means of collisions between the analyte gas or reaction gas and the ion beam; transmitting ions from the ionized analyte gas or reaction gas from the collision cell into a mass analyzer; and mass analyzing the transmitted ions of the ionized analyte or reaction gas. The methods can be applied in isotope ratio mass spectrometry to determine the isotope abundance or isotope ratio of a reaction gas used in mass shift reactions between the gas and sample ions, to determine a corrected isotope abundance or ratio of the sample ions.
MASS SPECTROMETER
A mass spectrometer for performing a selected ion monitoring (SIM) measurement and/or multiple reaction monitoring (MRM) measurement on each of one or a plurality of target components contained in a sample under one or a plurality of measurement conditions is provided. The mass spectrometer includes: a storage section 41 in which SIM measurement conditions and/or MRM measurement conditions are previously stored for a plurality of components; a measurement condition selection receiver 43 for performing the following operations when a command to create a method file in which measurement conditions are described is issued by a user: reading the selected ion monitoring measurement conditions and/or multiple reaction monitoring measurement conditions of the plurality of components, displaying the measurement conditions on a screen, and receiving a selection by the user; and a method file creator 48 for creating a method file in which a measurement condition selected by the user is described.
Addition of reactive species to ICP source in a mass spectrometer
Disclosed is a method of inductively coupled plasma mass spectrometry (ICP-MS), comprising steps of introducing at least one sample comprising at least one sample species, and at least one reactive species, into an inductively coupled plasma source, such that at least one molecular adduct ion of the at least one reactive species and the at least one sample species is formed; transferring the at least one molecular adduct ion into a collision cell that is arranged between the inductively coupled plasma source and at least one mass analyzer, transferring the at least one molecular adduct ion, or a product thereof, into the at least one mass analyzer, and analyzing the mass of the at least one molecular adduct ion, or the product thereof, in the at least one mass analyzer. Also disclosed is a mass spectrometer that is adapted to perform the method.
SYSTEMS AND METHODS FOR DETECTION AND QUANTIFICATION OF SELENIUM AND SILICON IN SAMPLES
The present disclosure provides methods and systems for improved detection and/or quantification of selenium (Se) and/or silicon (Si) in samples. In certain embodiment, the methods and systems feature the use of carbon dioxide (CO.sub.2) as a reaction gas in a reaction cell chamber, such as a dynamic reaction cell (DRC), of an inductively coupled plasma mass spectrometer (ICP-MS). It is found that the use of CO.sub.2 as a reaction gas effectively eliminates (or substantially reduces) interfering ionic species for the analytes Se and Si, particularly in samples with complex matrices, and/or in samples with low levels of analyte, thereby enabling more accurate detection of analyte at lower detection limits and in samples having complex matrices.
Mass Spectrometry Device and Analysis Method for Gas Phase Molecule-ion Reaction
A mass spectrometry device and analysis method for a gas phase molecule-ion reaction. The device comprises a reaction gas introduction device and a gas phase molecule-ion reaction mass spectrometry analysis device, wherein the reaction gas introduction device is connected to the gas phase molecule-ion reaction mass spectrometry analysis device; the reaction gas introduction device is configured to introduce reaction gas into the gas phase molecule-ion reaction mass spectrometry analysis device; and the gas phase molecule-ion reaction mass spectrometry analysis device is configured to enable molecules or ions to be subjected to a reaction and carry out mass spectrometry analysis on a reaction result. The reaction gas introduction device comprises a reaction gas container, the reaction gas container being configured to contain gas or volatile liquid or solid and generate gas molecules needed by a reaction; and a reaction gas quantitation device, configured to carry out flow control on the gas molecules.
Determination of metal and metalloid concentrations using ICPMS
A system for determining an analyte by inductively coupled plasma mass spectrometry (ICPMS) includes a sample introduction device having a heated cyclonic spray chamber. The system is configured to introduce sample that includes a metal and/or a metalloid having an organic interferent. The system also includes an inductively coupled plasma mass spectrometry device with a collision/reaction cell configured to receive a mixture of gases including both ammonia and hydrogen. A method includes introducing a sample to plasma to produce a characteristic spectrum associated with an elemental composition of the sample. The method also includes introducing both ammonia and hydrogen to a collision/reaction cell to remove carbon-based interferences to detection of the sample prior to determining the elemental composition of the sample.
Systems and methods for detection and quantification of selenium and silicon in samples
The present disclosure provides methods and systems for improved detection and/or quantification of selenium (Se) and/or silicon (Si) in samples. In certain embodiment, the methods and systems feature the use of carbon dioxide (CO.sub.2) as a reaction gas in a reaction cell chamber, such as a dynamic reaction cell (DRC), of an inductively coupled plasma mass spectrometer (ICP-MS). It is found that the use of CO.sub.2 as a reaction gas effectively eliminates (or substantially reduces) interfering ionic species for the analytes Se and Si, particularly in samples with complex matrices, and/or in samples with low levels of analyte, thereby enabling more accurate detection of analyte at lower detection limits and in samples having complex matrices.
Method and device for ionizing particles of a sample gas flow
A device for ionizing sample particles of a sample gas flow comprises a first flow tube for providing the sample gas flow, and an introducing means for providing H.sub.2SO.sub.4 molecules to an interaction region. In addition the device comprises a generator for producing reagent primary ions from particles of candidate reagent gas flow essentially in a primary ion production region. The device is configured to introduce said reagent primary ions with H.sub.2SO.sub.4 molecules in said interaction region in order to arrange interaction between the reagent primary ions and the H.sub.2SO.sub.4 molecules, thereby producing HSO.sub.4.sup. ions and again to produce HSO4.sup. ion clusters comprising HSO.sub.4.sup. ions and at least two H.sub.2SO.sub.4 molecules via interactions of HSO.sub.4.sup. with other H.sub.2SO.sub.4 molecules in said interaction region. Furthermore the device is configured to introduce said HSO.sub.4.sup. ion clusters with the sample particles of the sample gas flow in order to provide reactions between said HSO.sub.4.sup. ion clusters and the sample particles, and thereby provide a sample cluster comprising the HSO.sub.4.sup. ion clusters and said base sample to be determined.
Systems and methods of suppressing unwanted ions
Certain embodiments described herein are directed to systems including a cell downstream of a mass analyzer. In some instances, the cell is configured as a reaction cell, a collision cell or a reaction/collision cell. The system can be used to suppress unwanted ions and/or remove interfering ions from a stream comprising a plurality of ions.