H01J49/0409

Sample support, sample ionization method, and mass spectrometry method

A sample support is a sample support for sample ionization, including: a substrate formed with a plurality of through holes opening to a first surface and a second surface on a side opposite to the first surface; a conductive layer provided not to block the through hole in the first surface; and a reinforcement member disposed inside a part of the plurality of through holes.

Spectrometric analysis

A method of spectrometric analysis comprises obtaining one or more sample spectra for an aerosol, smoke or vapour sample. The one or more sample spectra are subjected to pre-processing and then multivariate and/or library based analysis so as to classify the aerosol, smoke or vapour sample. The results of the analysis are used for various surgical or non-surgical applications.

SUBSTANCE ANALYZER AND SUBSTANCE ANALYSIS METHOD

A substance analyzer that includes, to enhance selectivity of substance analysis, the following: a heater that heats a medium for collecting a chemical substance adhering to a surface of an inspection object; a mass spectrometer that performs tandem mass spectrometry of vapor derived from the chemical substance heated and vaporized by the heater from the medium; and a control device that causes the mass spectrometer to perform, based on a temperature of the medium in the heater, tandem mass spectrometry for the chemical substance that is vaporized at the temperature of the medium using the vapor sent from the heater to the mass spectrometer.

Spectrometric analysis of microbes

A method of analysis using mass spectrometry and/or ion mobility spectrometry is disclosed. The method comprises: using a first device to generate smoke, aerosol or vapour from a target comprising or consisting of a microbial population; mass analysing and/or ion mobility analysing said smoke, aerosol or vapour, or ions derived therefrom, in order to obtain spectrometric data; and analysing said spectrometric data in order to analyse said microbial population.

SAMPLE COLLECTION SYSTEM FOR INTERPLANETARY VEHICLE
20230036455 · 2023-02-02 ·

A sample capture assembly and method of operating is provided. The assembly includes a sampler device configured to retrieve a sample from a surface. A first bellows having a first inlet is fluidly coupled to the sample device, the bellows being selectively movable between a compressed and an extended position. A gate valve having a second inlet is coupled to an end of the first bellows opposite the first inlet. A sample container is fluidly coupled to the gate valve.

SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD

A sample support used for ionizing a component of a sample includes: a substrate having a first surface, a second surface opposite the first surface, and a plurality of through-holes that are open on the first surface and on the second surface; a conductive layer provided on at least the first surface; and a cationizing agent provided in the plurality of through-holes to cationize the component with a predetermined atom.

MASS SPECTROMETER
20220344139 · 2022-10-27 · ·

A mass spectrometer includes: a probe having an electric conductivity; a probe moving unit configured to move the probe; a high voltage application unit configured to apply a high voltage to the probe located at an ion generation position where the tip of the probe is apart from the sample, so as to generate an ion from the sample adhered to the probe, the ion originating from a component in the sample; and a sample holding unit that includes a sample holder having a plurality of concave portions, each configured to hold the sample, and a base configured to hold the sample holder in a removable manner, the base including a mechanical element configured to move the sample holder in order to sequentially move each of the plurality of concave portions of the sample holder to the sample collection position.

Sample collection system for interplanetary vehicle

A system and method of acquiring and delivering samples, such as in association with an interplanetary vehicle is provided. The system includes a gas delivery assembly having a storage tank with a compressed gas. A sampler device is provided having a hollow interior, the hollow interior having a curved and angled surface, an open end and an exit end. A plurality of nozzles are fluidly coupled between the hollow interior and the storage tank, at least one of the plurality of nozzles arranged to direct the compressed gas towards the exit end. A sample capture assembly is further provided having a container fluidly coupled to the exit end.

Ion generation using modified wetted porous materials

The invention generally relates to ion generation using modified wetted porous materials. In certain aspects, the invention generally relates to systems and methods for ion generation using a wetted porous substrate that substantially prevents diffusion of sample into the substrate. In other aspects, the invention generally relate to ion generation using a wetted porous material and a drying agent. In other aspects, the invention generally relates to ion generation using a modified wetted porous substrate in which at least a portion of the porous substrate includes a material that modifies an interaction between a sample and the substrate.

MASS SPECTROMETRY METHOD AND MASS SPECTROMETER
20230162959 · 2023-05-25 · ·

A mass spectrometry method including: focusing an excitation beam by an excitation beam optical system at a predetermined position of the sample stage, and recording a position of a beam irradiation system including the excitation beam optical system and a movable sample stage at that time as a reference position and a temperature of the beam irradiation system at that time as a reference temperature (Steps 1 and 2); acquiring temperature dependency information which is information representing a change in position of the excitation beam optical system and the sample stage with respect to a change in temperature of the beam irradiation system and recording the temperature dependency information (Step 3); and correcting a focusing position of an excitation beam using the moving mechanism based on a difference between a temperature of the beam irradiation system during use and the reference temperature and the temperature dependency information (Step 7).