A system for cooling an inductively coupled plasma (ICP) instrument includes: the ICP instrument; a pump in fluid communication with the instrument via a first conduit; and a micro-channel heat exchanger in fluid communication with the instrument via a second conduit, and in fluid communication with the pump via a third conduit. The pump is configured to generate a pump outlet pressure of coolant that exceeds a back pressure of the instrument such that a pressure of the coolant traveling through the second conduit and into the heat exchanger is less than or equal to 5 pounds per square inch (psi) above atmospheric pressure, as measured at an inlet to the heat exchanger.

Provided is a mass spectrometer including: an ion generation unit configured to provide an ion generation path; an ion selection unit configured to provide an ion selection path connected to the ion generation path; a reaction unit configured to provide a reaction path connected to the ion selection path; a second ion selection unit configured to provide a second ion selection path connected to the reaction path; and an ion detection unit coupled to the second ion selection unit. The ion selection path and the reaction path extend in a first direction, and the reaction unit includes: a reaction pipe extending in the first direction to define the reaction path; and a sample inflow pipe coupled to the reaction pipe. The sample inflow pipe provides a sample inflow path connected to the reaction path, and the sample inflow path includes an inclined path. The inclined path extends to form an acute angle (α) with respect to the first direction.

In some examples, a multi-device removal and installation tool may include a device removal tool including a first side having a first receiver with a first dimension that removably receives a first device, and a second side having a second receiver with a second dimension that removably receives a second device. The first dimension may be different from the second dimension. A torque limit tool may apply, in a first rotation direction of the torque limit tool and the device removal tool, a tightening torque to the first device. Further, the torque limit tool may apply, in a second rotation direction of the torque limit tool and the device removal tool, a loosening torque to the first device. The second rotation direction may be generally opposite to the first rotation direction.

Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.

Systems and methods are described for isolating a sample at a valve prior to introduction to an analysis system, such as sample analysis via ICP-MS. A system embodiment can include, but is not limited to, a valve system including a first valve in fluid communication with a sample reservoir and a second valve configured to permit and block access of a vacuum source to the first valve; a sensor system configured to detect presence or absence of a fluid at the first valve; and a controller configured to control operation of the second valve to block access of the vacuum source to the first valve upon detection of the fluid at the first valve to isolate the fluid within the sample reservoir.

Bubble plasma ionisation probe for analysing liquids by mass spectrometry. A means of a detecting analytes dissolved in a liquid by mass spectrometry is described. Gas flows from a source through a first conduit 105 and thereafter through a coaxial second conduit 103 that also serves as the inlet to the mass spectrometer 102. The coaxial arrangement of conduits is submerged in the liquid to be analysed 301. Using a feedback loop, the gas pressure is adjusted and controlled such that an attached bubble 302 forms at the open end of the first conduit 105. A plasma 305 is provided in the bubble. The plasma is preferably generated by a dielectric barrier discharge between a collar electrode 107 and mass spectrometer inlet 103. Analytes dissolved in the liquid are both desorbed form the gas-liquid interface and ionised by the action of the plasma. Ions formed in this way become entrained in the gas flow and are consequently transferred to the mass spectrometer, where they are analysed.

The present disclosure relates to methods of verifying enhanced rock weathering using immobile trace elements found within a mineral amendment. Further disclosed are mineral amendments that enable enhanced rock weathering.

Provided are a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing an organic substance and having a small variation in signal intensity of an ion of a metal element depending on a measurement position; a standard sample; a method for producing a standard sample film; a sample set; a quantitative analysis method; and a transfer film. The standard sample film of the present invention is a standard sample film for use in laser ablation inductively coupled plasma mass spectrometry, the standard sample film containing a polymer and a metal element, and having a maximum height difference in film thickness of the standard sample film of 0.50 μm or less.

Systems and methods are described for indirect detection of a missed sample from an autosampler. A method embodiment includes, but is not limited to, drawing a fluid through operation of an autosampler; directing the fluid via a fluid line to a valve of a fluid handling system, the valve including or being adjacent to a sensor to detect a presence or absence of liquid sample; directing the fluid from the valve into a holding line coupled to the valve; determining whether a threshold amount of liquid sample is present in the fluid in the holding line; and when it is determined that liquid sample is present in the fluid in the holding line in an amount less than the threshold amount, transferring a carrier fluid having a marker component to an analytic detector, the marker component present in the carrier fluid in an amount indicative of a missed sample.

A method of operating an inductively coupled plasma mass spectrometry apparatus for analyzing an analyte sample, the mass spectrometry apparatus including a plasma ion source, a mass analyzer and an interface arrangement positioned between the plasma ion source and the mass analyzer of the mass spectrometer, the interface arrangement at least including an interface structure, including a sampling or skimmer cone, and at least one passage with an inlet and an outlet into a reaction zone, the method including: generating a plasma using the plasma ion source and forming a plasma flux to flow towards the mass analyzer; supplying the analyte sample into the reaction zone via the passage such that the analyte sample interacts with the plasma flux; and analyzing the analyte sample using the mass analyzer.