A mass spectrometer is disclosed comprising a glow discharge device within the initial vacuum chamber of the mass spectrometer. The glow discharge device may comprise a tubular electrode located within an isolation valve, which is provided in the vacuum chamber. Reagent vapour may be provided through the tubular electrode, which is then subsequently ionised by the glow discharge. The resulting reagent ions may be used for Electron Transfer Dissociation of analyte ions generated by an atmospheric pressure ion source. Other embodiments are contemplated wherein the ions generated by the glow discharge device may be used to reduce the charge state of analyte ions by Proton Transfer Reaction or may act as lock mass or reference ions.

The present invention is directed to a method and device to desorb an analyte using heat to allow desorption of the analyte molecules, where the desorbed analyte molecules are ionized with ambient temperature ionizing species. In various embodiments of the invention a current is passed through a mesh upon which the analyte molecules are present. The current heats the mesh and results in desorption of the analyte molecules which then interact with gas phase metastable neutral molecules or atoms to form analyte ions characteristic of the analyte molecules.

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

Methods and devices for pretreatment of a conducting sampling substrate which enable an electrostatic charge to be used to transfer analyte molecules onto a sampling substrate, where the analyte molecules are in powder or particulate form. In an embodiment of the present invention, the electrostatic charge can be used to transfer powder samples containing nitrogenous bases, nucleosides, food additives, and prescription drugs such as acetaminophen, oxycodone, and dextromethorphan. In an embodiment of the present invention, a powder sample is transferred to a pre-treated sampling substrate using an electrostatic charge. The spatial distribution of the powder on the original surface is retained on the pre-treated sampling substrate using the electrostatic charge transfer. The electrostatic charge transfer can be used to transfer powder samples present on a surface or in the chambers of 96, 384 and 1536 well plate formats to either pins or mesh and analyzed with ambient desorption ionization.

Methods and devices for pretreatment of a conducting sampling substrate which enable an electrostatic charge to be used to transfer analyte molecules onto a sampling substrate, where the analyte molecules are in powder or particulate form. In an embodiment of the present invention, the electrostatic charge can be used to transfer powder samples containing nitrogenous bases, nucleosides, food additives, and prescription drugs such as acetaminophen, oxycodone, and dextromethorphan. In an embodiment of the present invention, a powder sample is transferred to a pre-treated sampling substrate using an electrostatic charge. The spatial distribution of the powder on the original surface is retained on the pre-treated sampling substrate using the electrostatic charge transfer. The electrostatic charge transfer can be used to transfer powder samples present on a surface or in the chambers of 96, 384 and 1536 well plate formats to either pins or mesh and analyzed with ambient desorption ionization.

To correct spectral interference due to a divalent ion of an interfering element on a measurement ion of an analysis element measured by a mass spectrometer using a plasma ion source by accounting for a mass-bias effect of the mass spectrometer, measurement values of ionic strength of divalent ions of two isotopes having different, odd mass numbers among isotopes of the interfering element are used. In measuring to obtain a measurement value where a correction method of the present invention is applied, it is suitable to set a mass resolution of the mass spectrometer to be higher than a time of normal analysis.

To correct spectral interference due to a divalent ion of an interfering element on a measurement ion of an analysis element measured by a mass spectrometer using a plasma ion source by accounting for a mass-bias effect of the mass spectrometer, measurement values of ionic strength of divalent ions of two isotopes having different, odd mass numbers among isotopes of the interfering element are used. In measuring to obtain a measurement value where a correction method of the present invention is applied, it is suitable to set a mass resolution of the mass spectrometer to be higher than a time of normal analysis.

Certain configurations of plasma discharge chambers and plasma ionization sources comprising a plasma discharge chamber are described. In some examples, the discharge chamber comprises a conductive area and is configured to sustain a plasma discharge within the discharge chamber. In other examples, the discharge chamber comprises at least one inlet configured to receive a plasma gas and at least one outlet configured to provide ionized analyte from the discharge chamber. Systems and methods using the discharge chambers are also described.

An apparatus for plating NdFeB magnet includes a cathode and a target source holder defining a predetermined distance of 5 mm to 200 mm therebetween. A pulse bias power supply having a first positive terminal connected to an anode and a first negative terminal connected to the cathode. A DC bias power supply having a second positive terminal connected to the anode and a second negative terminal connected to the target source holder. The anode is connected to the earth ground. A method for plating the NdFeB magnet includes steps of maintaining the predetermined distance of 5 mm to 200 mm between the cleaned NdFeB magnet and the target source material, increasing a first electric potential to the cathode and a second electric potential to the target source holder with the second electric potential greater than the first electric potential, and maintaining a potential differential of 0V to 500V therebetween.