The invention relates to the field of physics and relates to an impulse-resolving photo-electron spectrometer, by means of which the physical properties can be determined. The aim of the invention is to provide an impulse-resolving photo-electron spectrometer enabling the device components to have a simple structure with a significantly reduced overall volume. The aim of the invention is achieved by means of an impulse-resolving photo-electron spectrometer comprising components arranged one behind the other in the direction of the optical axis at least in a vacuum and which are each at least one electron emission sample and a focusing system, wherein the focusing system consists of at least one electron lens and at least one detector, wherein the electron lens consists of three cylindrical elements, wherein the first cylindrical element has a potential=0 and the two subsequently arranged cylindrical elements have a potential of ≠0, and wherein the detector is one or more spatially resolved detectors which are arranged in the focal plane of the electron lens.

Provided is a compact two-dimensional electron spectrometer that is capable of variably adjusting the deceleration ratio over a wide range, and performing simultaneous measurement of the two-dimensional emission angle distribution with a high energy resolution over a wide solid angle of acquisition. The two-dimensional electron spectrometer is configured from: a variable deceleration ratio spherical aberration correction electrostatic lens; a cylindrical mirror type energy analyzer or a wide angle energy analyzer; and a projection lens. The variable deceleration ratio spherical aberration correction electrostatic lens is configured from: an electrostatic lens that consists of an axially symmetric spherical mesh having a concave shape with respect to a point source, and one or a plurality of axially symmetrical electrodes, and that adjusts the spherical aberration of charged particles generated from the point source; and an axially symmetric deceleration field generating electrode that is placed coaxially with the electrostatic lens.

The invention relates to the field of physics and relates to an impulse-resolving photo-electron spectrometer, by means of which the physical properties can be determined. The aim of the invention is to provide an impulse-resolving photo-electron spectrometer enabling the device components to have a simple structure with a significantly reduced overall volume. The aim of the invention is achieved by means of an impulse-resolving photo-electron spectrometer comprising components arranged one behind the other in the direction of the optical axis at least in a vacuum and which are each at least one electron emission sample and a focusing system, wherein the focusing system consists of at least one electron lens and at least one detector, wherein the electron lens consists of three cylindrical elements, wherein the first cylindrical element has a potential=0 and the two subsequently arranged cylindrical elements have a potential of0, and wherein the detector is one or more spatially resolved detectors which are arranged in the focal plane of the electron lens.

A high-resolution electron energy analyzer is disclosed. In one embodiment, the electron energy analyzer includes an electrostatic lens configured to generate an energy-analyzing field region, decelerate electrons of an electron beam generated by an electron source, and direct the decelerated electrons of the electron beam to the energy-analyzing field region. In another embodiment, the electron energy analyzer includes an electron detector configured to receive one or more electrons passed through the energy-analyzing field region. In another embodiment, the electron detector is further configured to generate one or more signals based on the one or more received electrons.

A high-resolution electron energy analyzer is disclosed. In one embodiment, the electron energy analyzer includes an electrostatic lens configured to generate an energy-analyzing field region, decelerate electrons of an electron beam generated by an electron source, and direct the decelerated electrons of the electron beam to the energy-analyzing field region. In another embodiment, the electron energy analyzer includes an electron detector configured to receive one or more electrons passed through the energy-analyzing field region. In another embodiment, the electron detector is further configured to generate one or more signals based on the one or more received electrons.

An electrostatic linear ion trap has first and second axially aligned ion minors separated by a charge detection cylinder axially aligned with each ion minor. Electric fields are selectively established within the first and second ion minors in a manner which causes an ion in the trap to oscillate back and forth through the charge detection cylinder between the first and second ion minors with a duty cycle, corresponding to a ratio of time spent by the ion passing through the charge detection cylinder and total time spent traversing a combination of the first and second ion mirrors and the charge detection cylinder during one complete oscillation cycle, of approximately 50%.

A mass analyzing apparatus and system are disclosed for time-of-flight (TOF) mass spectrometry analysis. A representative system includes a first electrostatic mirror prism to reflect a first ion beam and provide an intermediate ion beam having an intermediate TOF focus and having a spatial dispersion of ions proportional to ion kinetic energies; and a second electrostatic mirror prism to reflect the second ion beam and converge the spatial dispersion of ions to provide a third, recombined ion beam having an output TOF focus; and an ion detector arranged at the output TOF focus to receive and detect the ions of the third ion beam. A bandpass filter may be arranged at the intermediate TOF focus to selectively allow propagation of ions of the second ion beam having a selected range of ion kinetic energies. Configurations having additional electrostatic mirror prisms are disclosed, including for tandem MS-MS and selectable time-of-flight.

Provided is a compact device which captures, over a large solid angle range, electrically charged particles emitted from a point source and parallelizes the trajectories of said charged particles. The present invention is configured from: an electrostatic lens comprising a plurality of axisymmetric electrodes (10-14) and an axisymmetric aspherical mesh (2) which has a surface that is concave away from the point source; and a flat collimator plate (3) positioned coaxially with the electrostatic lens. The acceptance angle for the electrically charged particles generated from a point source (7) is 30 or greater. The shape of the aspherical mesh (2), and the potentials and the positions of a ground electrode (10) and application electrodes (11-15) are adjusted so that the trajectories of the electrically charged particles are substantially parallelized by the electrostatic lens. The electrostatic lens and the flat collimator plate are positioned on a common axis.

An electrostatic analyzer (ESA) includes a coaxial structure having an outer conductive cylinder, an inner conductive cylinder, and one or more pathways disposed therebetween and extending from a first end to a second end of the coaxial structure. The outer conductive cylinder and the inner conductive cylinder may each be structurally configured to receive a bias voltage for creation of a predetermined electric field therebetween that allows for passage of charged particles with a predetermined energy/charge band along a helical path through the coaxial structure. The ESA may further include an entrance filter on the first end of the coaxial structure that defines a plurality of openings aligned at a predetermined angle thereby limiting one or more fields of view between a pathway through the ESA and the external environment to filter particles, by their trajectory, from entering the pathway for analysis by the ESA.

An electrostatic analyzer (ESA) includes a coaxial structure having an outer conductive cylinder, an inner conductive cylinder, and one or more pathways disposed therebetween and extending from a first end to a second end of the coaxial structure. The outer conductive cylinder and the inner conductive cylinder may each be structurally configured to receive a bias voltage for creation of a predetermined electric field therebetween that allows for passage of charged particles with a predetermined energy/charge band along a helical path through the coaxial structure. The ESA may further include an entrance filter on the first end of the coaxial structure that defines a plurality of openings aligned at a predetermined angle thereby limiting one or more fields of view between a pathway through the ESA and the external environment to filter particles, by their trajectory, from entering the pathway for analysis by the ESA.