A low power mass spectrometer assembly includes at least an ionization component, an electrostatic analyzer, a lens assembly, a magnet assembly and at least one detector located in a same plane as the entrance to the magnet assembly for detecting the deflected sample ions and/or fragments of sample ions, including ions or ion fragments indicative of the Vitamin D metabolite within the sample.

The present invention provides an accelerator mass spectrometry device for simultaneously measuring isotopes. In one embodiment, the device comprises a sputtering negative ion source for generating negative ions; the sputtering negative ion source being connected to an accelerating tube for simultaneously accelerating a plurality of isotopic ions; an output end of the accelerating tube being connected to an isotope mass resolution system; the isotope mass resolution system being connected to a charge conversion analysis and multi-receiving measurement system; the charge conversion analysis and multi-receiving measurement system being connected to an ion detection system. The present invention is capable of accelerating a plurality of isotopic negative ions simultaneously. The accelerated isotopic negative ions are separated. Stable isotopic negative ions are measured by a stable isotope receiver. Unstable isotope negative ions are converted to positive ions and then measured by a detector.

The present invention provides an accelerator mass spectrometry device for simultaneously measuring isotopes. In one embodiment, the device comprises a sputtering negative ion source for generating negative ions; the sputtering negative ion source being connected to an accelerating tube for simultaneously accelerating a plurality of isotopic ions; an output end of the accelerating tube being connected to an isotope mass resolution system; the isotope mass resolution system being connected to a charge conversion analysis and multi-receiving measurement system; the charge conversion analysis and multi-receiving measurement system being connected to an ion detection system. The present invention is capable of accelerating a plurality of isotopic negative ions simultaneously. The accelerated isotopic negative ions are separated. Stable isotopic negative ions are measured by a stable isotope receiver. Unstable isotope negative ions are converted to positive ions and then measured by a detector.

Electrons excited by irradiation of a visible light to a sample is at an energy level lower than a vacuum level, thus photoelectrons are not emitted from the sample and energy of excited electrons cannot be measured. The visible light is irradiated to the sample through a mesh electrode. A surface film for reducing the vacuum level is formed on a surface of the sample. With the surface film being formed, photoelectrons are obtained by the visible light, and these photoelectrons are accelerated by the mesh electrode toward a photoelectron spectrometer. Ultraviolet light may be irradiated to the sample and metal having same potential therewith. In this case, the mesh electrode is set at a retracted position to prohibit interaction of the mesh electrode and the ultraviolet light. A difference between the valence band and the Fermi level of the sample can be measured.

An electrostatic particle beam combiner for creating a single source combining the properties of two particle beams which form a high brightness source of a selected mixture of ions of varying element types and energies. An electrostatic spherical lens is arranged to bend a low energy second particle beam along a circular path and thereafter to impinge on a surface of a sample, e.g., within a transmission electron microscope. A beam of high energy is injected into the electrostatic spherical lens through an aperture in the outer shell and steered by two spaced apart electrostatic deflectors so that the angle of entry and the point of entry can be independently adjusted so that the high energy beam leaves the spherical lens along a path which is coaxial and coincident with the second particle beam of low energy.

An electrostatic particle beam combiner for creating a single source combining the properties of two particle beams which form a high brightness source of a selected mixture of ions of varying element types and energies. An electrostatic spherical lens is arranged to bend a low energy second particle beam along a circular path and thereafter to impinge on a surface of a sample, e.g., within a transmission electron microscope. A beam of high energy is injected into the electrostatic spherical lens through an aperture in the outer shell and steered by two spaced apart electrostatic deflectors so that the angle of entry and the point of entry can be independently adjusted so that the high energy beam leaves the spherical lens along a path which is coaxial and coincident with the second particle beam of low energy.

A retarding potential type energy analyzer including a front grid electrode, reference grid electrode and rear grid electrode sequentially arranged, with a predetermined amount of potential difference given between the reference grid electrode and the front grid electrode to form an upward potential gradient as well as a potential difference given between the reference grid electrode and the rear grid electrode to form a downward potential gradient, the grid electrodes are arranged so that the distance between the reference grid electrode and the rear grid electrode is shorter than the distance between the reference grid electrode and the front grid electrode, or the potential difference between the reference grid electrode and the rear grid electrode is made to be greater than the potential difference between the reference grid electrode and the front grid electrode.

An electron spectroscopy system and method are disclosed. In another aspect, an ultrabright and ultrafast angle-resolved electron spectroscopy system is provided. A further aspect of the present system employs an electron gun, a radio frequency cavity and multiple spectrometers. Yet another aspect uses spectrometers in an aligned manner to deflect and focus electrons emitted by the electron gun. Moreover, an ultrafast laser is coupled to an electron spectroscopy system. A bunch of monochromatic electrons have their energy compressed and reoriented in an additional aspect of the present system. A further aspect of the present electron spectroscopy system employs adaptive and/or adjustable optics to optimize both time and energy compression. Another aspect provides at least two RF lenses or cavities, one before a specimen and one after the specimen.

An electron spectroscopy system and method are disclosed. In another aspect, an ultrabright and ultrafast angle-resolved electron spectroscopy system is provided. A further aspect of the present system employs an electron gun, a radio frequency cavity and multiple spectrometers. Yet another aspect uses spectrometers in an aligned manner to deflect and focus electrons emitted by the electron gun. Moreover, an ultrafast laser is coupled to an electron spectroscopy system. A bunch of monochromatic electrons have their energy compressed and reoriented in an additional aspect of the present system. A further aspect of the present electron spectroscopy system employs adaptive and/or adjustable optics to optimize both time and energy compression. Another aspect provides at least two RF lenses or cavities, one before a specimen and one after the specimen.

A static magnetic field is applied in the same direction using a first magnet and a second magnet. The magnetic field is applied to a gap of uniform thickness between the first and second magnets. Voltages are applied to three or more electrodes located in the gap using a switchable voltage source. The voltages are applied to create a static electric field perpendicular to the static magnetic field in an input channel and at least one channel of two or more output channels. The channels are defined by gaps between the three or more electrodes. The simultaneous application of the static magnetic field and the static electric field causes ions from an ion beam of a mass spectrometer to move into and through the input channel and through at least one channel of the two or more output channels to another location in the mass spectrometer.