A RFID reader magnetically attachable to a smart phone includes a circuitry adaptor and a RFID access device. The circuitry adaptor is plugged into a USB connector of the smart phone. The RFID access device is magnetically and detachably connected to the circuitry adaptor, so that electricity and signals from the smart phone are transmitted to the RFID access device, and RFID tag signals picked up by the RFID access device are transmitted to the smart phone. When the RFID access device undergoes external impact, the circuitry adaptor and the RFID access device are detached from each other without damaging the USB connectors.

The present invention discloses a shielding means and a high-speed, electrical connector using the same. The connector includes terminal modules, shielding means and a shell fixing the terminal modules and the shielding means. Each terminal module includes grounding terminals and differential signal pairs embedded within an insulating body. The shielding means has a number of mating tongue and a number of protruding portions formed thereon. Each mating tongue is configured to mechanically and electrically connecting to corresponding grounding terminal. The insulating body defines a number of cutouts and the grounding terminals of the terminal module are partially exposed from the cutouts. The protruding portions of the shielding means are correspondingly retained between the cutouts of the insulating body to securely connecting the shielding means on the terminal module.

Provided is a spring connector, including a base, a plurality of connector female ends and a grounding ring. The base has a surface. The plurality of connector female ends are disposed on the base and exposed on the surface. End portions exposed on the surface are recessed in the surface. The grounding ring is disposed on the base and exposed on the surface, and correspondingly surrounds at least one of the plurality of connector female ends. An end portion of the grounding ring exposed on the surface is flush with the surface or protrudes from the surface.

An electrical connector assembly includes a housing defining an interior space and a slot and a spring pin terminal disposed within the slot of the housing. The spring pin terminal includes a first contact portion, a second contact portion, and an intermediate portion that extends between the first contact portion and the second contact portion. The first contact portion includes a contact point that engages a first electrically conductive structure and a retention force support that engages a portion of the intermediate portion of the spring pin terminal. The second contact portion includes a contact point that engages a second electrically conductive structure and a retention force and alignment support that engages the intermediate portion of the spring pin terminal.

An electrical connector assembly including a first connector and a second connector to be mated with each other is provided. The first connector includes a first body, and at least one first terminal and multiple second terminals disposed therein. The second terminals are symmetrically arranged at opposite sides of the first terminal. The second connector includes a second body, at least one third terminal movably disposed in the second body, multiple fourth terminals disposed in the second body and symmetrically arranged at opposite sides of the third terminal, and a driving module electrically connected to at least one of the fourth terminals and structurally connected to the third terminal. In the mating process of the first and second connector, the second terminals and the fourth terminals are electrically connected firstly, to trigger the driving module to move the third terminal to be structurally and electrically connected to the first terminal.

An arrangement for electrical contacting of a current connector (3) with a circuit arrangement (1) is provided. The current connector (3) includes at least one contact spring wire (5, 6) with an end contact (5a, 6a), which is configured for spring-loading, and the circuit arrangement (1) includes at least one contact point. The end contact (5a, 6a) and the contact point each form a spring pressure contact, and the end contact (5a, 6a) of the contact spring wire (5, 6) is configured as a bracket with an outer contact surface and at least one cutting edge arranged proximate the contact surface, which is engaged with the contact point.

Disclosed is a connector. The connector comprises: an insulation member including a first sidewall portion, a second sidewall portion facing the first sidewall portion, and a bottom portion connecting the first sidewall portion to the second sidewall portion and having an opening formed between the first sidewall portion and the second sidewall portion; and a conductive pin including a fastening portion arranged on the first sidewall portion, a variable portion facing the fastening portion, and a connecting portion connecting the fastening portion to the variable portion and arranged in the opening formed on the bottom portion, wherein the bottom portion further includes a support portion extending inwardly of the opening to support the connecting portion, and the thickness of the support portion may be smaller than the thickness of the bottom portion. In addition, various embodiments understood from the specification can be implemented.

Disclosed is a connector. The connector comprises: an insulation member including a first sidewall portion, a second sidewall portion facing the first sidewall portion, and a bottom portion connecting the first sidewall portion to the second sidewall portion and having an opening formed between the first sidewall portion and the second sidewall portion; and a conductive pin including a fastening portion arranged on the first sidewall portion, a variable portion facing the fastening portion, and a connecting portion connecting the fastening portion to the variable portion and arranged in the opening formed on the bottom portion, wherein the bottom portion further includes a support portion extending inwardly of the opening to support the connecting portion, and the thickness of the support portion may be smaller than the thickness of the bottom portion. In addition, various embodiments understood from the specification can be implemented.

The present invention relates to a test socket having a thin structure that can reduce durability degradation of a contact itself, have excellent electrical characteristics in processing high-speed signals, and can extend a service life thereof, and relates to spring contacts suitable thereto. The test socket according to the present invention includes: a plurality of spring contacts (100) each of which includes an upper contact pin (110) and a lower contact pin (120) that are assembled cross each other, and a spring (130) supporting the upper and lower contact pins (110 and 120); a main plate (1110) having a plurality of accommodating holes (1111) in which the respective spring contacts (100) are accommodated, with first openings (1113); and a film plate (1120) provided on a lower portion of the main plate (1110), and having second openings (1121).

A wafer test device and methods of assembling a wafer test device involve a first laminate structure, and a second laminate structure arranged to interface with a microcircuit of the wafer. The wafer test device includes a compliant layer between the first laminate structure and the second laminate structure. The compliant layer includes an elastomer that exhibits compliance within a limited range of movement.