Patent classifications
H03H2003/025
Method of making a piezoelectric device
This disclosure relates generally to a method of making a piezoelectric device. In some embodiments, a foundation structure is provided and a first metal is deposited over at least a first area of a top surface of the foundation structure to form a plurality of metal islands such that the plurality of metal islands self-assemble in a distributed manner over the at least the first area of the top surface of the foundation structure. Additionally, a piezoelectric material is deposited over the at least the first area of the top surface of the foundation structure to form a piezoelectric film over the at least the first area of the top surface of the foundation structure. The piezoelectric material is deposited over the first area of the top surface of the foundation structure to form the piezoelectric film and the piezoelectric film is polarity patterned into at least one non-piezoelectric portion.
Acoustic resonator
An integrated circuit (IC) resonator module for an IC package includes an acoustic resonator having a surface and a Bragg reflector adhered to the surface of the acoustic resonator. The Bragg reflector includes low impedance layers formed of a first material with a first acoustic impedance and a high impedance layer formed of a second material with a second acoustic impedance. The second acoustic impedance is greater than the first acoustic impedance. The Bragg reflector further includes a Bragg grating layer formed of randomly or periodically spaced patches of the second material separated by vias filled with the first material.
5.5 GHz Wi-Fi 5G coexistence acoustic wave resonator RF filter circuit
An RF circuit device using modified lattice, lattice, and ladder circuit topologies. The devices can include four resonator devices and four shunt resonator devices. In the ladder topology, the resonator devices are connected in series from an input port to an output port while shunt resonator devices are coupled the nodes between the resonator devices. In the lattice topology, a top and a bottom serial configurations each includes a pair of resonator devices that are coupled to differential input and output ports. A pair of shunt resonators is cross-coupled between each pair of a top serial configuration resonator and a bottom serial configuration resonator. The modified lattice topology adds baluns or inductor devices between top and bottom nodes of the top and bottom serial configurations of the lattice configuration. These topologies may be applied using single crystal or polycrystalline bulk acoustic wave (BAW) resonators.
METHOD OF MAKING A PIEZOELECTRIC DEVICE
A piezoelectric device includes a foundation structure and a plurality of metal islands distributed over a first area of a top surface of the foundation structure. A piezoelectric film resides over the foundation structure and is formed from a piezoelectric material. The piezoelectric film has a non-piezoelectric portion over the first area and a piezoelectric portion over a second area of the top surface of the foundation structure. Within the non-piezoelectric portion, the piezoelectric film is polarity patterned to have pillars and a mesh. The pillars of the piezoelectric material have a first polar orientation residing over corresponding ones of the plurality of metal islands. The mesh of the piezoelectric material has a second polar orientation, which is opposite that of the first polar orientation, and surrounds the pillars. In one embodiment, the metal islands are self-assembled islands.
Resonator and manufacturing method thereof, filter, and electronic device
Disclosed are a resonator and a manufacturing method thereof, a filter, and an electronic device. The resonator includes a substrate, a Bragg reflection layer, and a piezoelectric layer that are sequentially stacked. A first electrode is disposed on a surface that is of the piezoelectric layer and that faces the Bragg reflection layer, a second electrode is disposed on a surface that is of the piezoelectric layer and that is away from the Bragg reflection layer, a border ring is disposed on a surface that is of the second electrode and that is away from the piezoelectric layer, and the resonator has a first resonance region and a second resonance region corresponding to the border ring.
Bulk acoustic wave (BAW) device with oppositely polarized piezoelectric layers for higher order resonance and method of manufacture
A bulk acoustic wave (BAW) device comprises a layer stack including first and second electrodes, a first piezoelectric layer between the electrodes, and a second piezoelectric layer between the first piezoelectric layer and the second electrode. A polarization of a crystal structure of the second piezoelectric layer is opposite to a polarization of a crystal structure of the first piezoelectric layer to achieve higher order resonant frequencies in the BAW device by means other than merely thinning layers in the layer stack. In some examples, the BAW device is a two-terminal device and does not include a metal layer configured to be a third electrode. In some examples, the BAW device includes at least one intermediate layer between the first and second piezoelectric layers, and a total combined thickness of the at least one intermediate layer is less than 4% of a total thickness of the layer stack.
Method for manufacturing acoustic resonator in lateral excitation shear mode
The present disclosure relates to a method for fabricating a laterally excited shear mode acoustic resonator. The method includes: providing a piezoelectric layer including monocrystalline lithium niobate and/or monocrystalline lithium tantalate; forming an acoustic mirror on a first surface of the piezoelectric layer; the acoustic mirror including at least one first acoustic reflection layer and at least one second acoustic reflection layer, the first acoustic reflection layers and the second acoustic reflection layers being alternately superimposed, and acoustic impedance of each of the first acoustic reflection layers being less than that of each of the second acoustic reflection layers; bonding a bearing wafer on a first surface of the acoustic mirror; and forming an electrode unit and a lateral reflector on a second surface of the piezoelectric layer.
PIEZOELECTRIC ELEMENT AND ELECTRONIC DEVICE
A piezoelectric element according to the present invention includes: a first electrode, a piezoelectric layer containing a piezoelectric material doped with Mg, and a second electrode, which are laminated in this order on a support substrate; and an Mg deficiency preventing layer configured to reduce an outflow of Mg from the piezoelectric layer, the Mg deficiency preventing layer being provided at at least one of a location between the first electrode and the piezoelectric layer, and a location between the piezoelectric layer and the second electrode.
5.5 GHz Wi-Fi 5G COEXISTENCE ACOUSTIC WAVE RESONATOR RF FILTER CIRCUIT
An RF circuit device using modified lattice, lattice, and ladder circuit topologies. The devices can include four resonator devices and four shunt resonator devices. In the ladder topology, the resonator devices are connected in series from an input port to an output port while shunt resonator devices are coupled the nodes between the resonator devices. In the lattice topology, a top and a bottom serial configurations each includes a pair of resonator devices that are coupled to differential input and output ports. A pair of shunt resonators is cross-coupled between each pair of a top serial configuration resonator and a bottom serial configuration resonator. The modified lattice topology adds baluns or inductor devices between top and bottom nodes of the top and bottom serial configurations of the lattice configuration. These topologies may be applied using single crystal or polycrystalline bulk acoustic wave (BAW) resonators.
ACOUSTIC WAVE DEVICE FOR ASYMMETRIC FREQUENCY BANDS AND MANUFACTURING METHOD, CHARGE WHEN COMPRESSED, TWISTED, OR DISTORTED, AND SIMILARLY COMPRESS, TWIST, OR DISTORT WHEN A CHARGE IS APPLIED
The present disclosure relates to an acoustic wave device for asymmetric frequency bands and a manufacturing process for making the same. The disclosed acoustic wave device includes at least one first electrode (102:152), at least one second electrode (104:152), a first piezoelectric layer (114) with a recess (116), and a second piezoelectric layer (118) fully covering the recess. Herein, the at least one first electrode is formed over the first piezoelectric layer, and the at least one second electrode is formed over the second piezoelectric layer and confined within the recess. The second piezoelectric layer does not cover a portion of the first piezoelectric layer, which is vertically underneath the at least one first electrode. The first piezoelectric layer and the second piezoelectric layer are formed of different piezoelectric materials.