An acoustic wave device includes a piezoelectric substrate and an IDT electrode provided on the piezoelectric substrate. In the IDT electrode, a central region, first and second low acoustic velocity regions and first and second high acoustic velocity regions are disposed in this order. A duty ratio in the first low acoustic velocity region of first electrode fingers and the second low acoustic velocity region of second electrode fingers is larger than a duty ratio in the central region. When acoustic velocity of a transversal bulk wave propagating in metal that is a main component of a main electrode layer is defined as v (m/s), v≤3299 m/s, and when a wave length defined by an electrode finger pitch of the IDT electrode is defined as λ, and a film thickness of the main electrode layer normalized by the wave length λ is defined as T, then T≥0.00018e.sup.0.002V+0.014.

An acoustic wave device includes an antenna terminal, a signal terminal, and a plurality of resonators that are provided on a piezoelectric substrate. The plurality of resonators include a plurality of series arm resonators on a series arm, and the duty of an IDT electrode of the series arm resonator closest to the antenna terminal among the plurality of series arm resonators is smaller than the duty of an IDT electrode of at least one series arm resonator among the other series arm resonators.

An elastic wave device includes a piezoelectric substrate mainly including lithium niobate, an interdigital transducer electrode provided on the piezoelectric substrate, and a dielectric film, provided on the piezoelectric substrate and covering the interdigital transducer electrode, and mainly including silicon oxide. The elastic wave device uses a Rayleigh wave. The interdigital transducer electrode includes main electrode layers that include one or more first main electrode layer made of a metal with a C11.sup.2/C12 ratio greater than the C11.sup.2/C12 ratio of the silicon oxide with regard to the elastic constants C11 and C12. The sum of the thicknesses of the one or more first main electrode layers is about 55% or more based on the thickness of the whole interdigital transducer electrode is about 100%.

Acoustic wave devices, and particularly piezoelectric layer arrangements in acoustic wave devices and related methods are disclosed. Acoustic wave devices may include a piezoelectric layer on a carrier substrate. The piezoelectric layer is formed with a thickness that is varied or shaped across different portions of the carrier substrate. Different piezoelectric layer thicknesses on a common carrier substrate may be provided for different surface acoustic wave (SAW) filter structures that are formed monolithically, for different sets of resonators within a single filter structure, and for different regions within a single SAW device in one or more of the transverse direction or the propagation directions. Shaping piezoelectric layers may include selectively removing or adding portions of the piezoelectric layer. In this manner, piezoelectric layer thicknesses at different hierarchy levels within SAW devices and filters may be tailored to provide different acoustic resonator properties without requiring separately formed devices on separate substrates.

Aspects of this disclosure relate to an elastic wave device. The elastic wave device includes a sub-wavelength thick piezoelectric layer, an interdigital transducer electrode on the piezoelectric layer, and a high velocity layer configured to inhibit an elastic wave from leaking from the piezoelectric layer at anti-resonance.

An acoustic wave device includes an antenna terminal, a signal terminal, and a plurality of resonators that are provided on a piezoelectric substrate. The plurality of resonators include a plurality of series arm resonators on a series arm, and the duty of an IDT electrode of the series arm resonator closest to the antenna terminal among the plurality of series arm resonators is smaller than the duty of an IDT electrode of at least one series arm resonator among the other series arm resonators.

An elastic wave device includes a piezoelectric substrate and an interdigital transducer electrode on the piezoelectric substrate, the piezoelectric substrate including a piezoelectric layer and a high-acoustic-velocity member layer, the piezoelectric layer being stacked on the high-acoustic-velocity member layer. The piezoelectric layer is made of lithium tantalate. Denoting an elastic wave propagation direction as a first direction, and a direction perpendicular or substantially perpendicular to the first direction as a second direction, a central region, low-acoustic-velocity regions, and high-acoustic-velocity regions are provided in the interdigital transducer electrode in the second direction. The low-acoustic-velocity regions include mass-adding films on electrode fingers. Denoting a film thickness normalized to a wavelength determined by the electrode finger pitch of the interdigital transducer electrode as a wavelength-normalized film thickness (%), a product of the wavelength-normalized film thickness of the mass-adding films and the density (g/cm.sup.3) of the mass-adding films is about 13.4631 or less.

To provide an acoustic wave device capable of reducing or preventing fluctuations in electrical characteristics and reducing or preventing higher-order modes. An acoustic wave device of the present invention includes a support including a support substrate, a piezoelectric layer provided on the support and having a first principal surface and a second principal surface facing each other, a first IDT electrode provided on the first principal surface and including a plurality of electrode fingers, and a second IDT electrode provided on the second principal surface and including a plurality of electrode fingers. The second IDT electrode is embedded in the support. A dielectric film is provided on the first principal surface of the piezoelectric layer to cover the first IDT electrode. When a wavelength defined by an electrode finger pitch of the first IDT electrode is represented by , a thickness of the dielectric film is equal to or less than 0.15.

An elastic wave device includes, when a region of a main surface of a piezoelectric substrate in which a first functional electrode including a comb-shaped or substantially comb-shaped electrode and reflectors and a second functional electrode including a comb-shaped or substantially comb-shaped electrode and reflectors are provided is referred to as a first region, and the remaining region of the main surface is referred to as a second region, first metal members provided in the second region so as to be adjacent to the first functional electrode and second metal members provided in the second region so as to be adjacent to the second functional electrode. The first and second metal members are not electrically connected to any of the functional electrodes. A dielectric film is provided on the main surface of the piezoelectric substrate so as to cover the functional electrodes and the first and second metal members.

A multiplexer includes a transmission-side filter, a reception-side filter, and a cancel circuit connected between a node M and a node N to cancel out a component in a predetermined frequency band that flows along first and second paths. The cancel circuit includes at least one longitudinally-coupled resonator. An average pitch between electrode fingers of interdigital transducer electrodes of the at least one longitudinally-coupled resonator is narrower than an average pitch between electrode fingers of interdigital transducer electrodes of each of series arm resonators and parallel arm resonators that determine the pass band of the transmission-side filter and an average pitch between electrode fingers of interdigital transducer electrodes of each of series arm resonators and parallel arm resonators that determine the pass band of the reception-side filter.