H03H9/706

Method, System, and Apparatus for Resonator Circuits and Modulating Resonators
20230142184 · 2023-05-11 ·

Embodiments of resonator circuits and modulating resonators and are described generally herein. One or more acoustic wave resonators may be coupled in series or parallel to generate tunable filters. One or more acoustic wave resonances may be modulated by one or more capacitors or tunable capacitors. One or more acoustic wave modules may also be switchable in a filter. Other embodiments may be described and claimed.

ELASTIC WAVE APPARATUS
20170373670 · 2017-12-28 ·

An elastic wave apparatus includes a piezoelectric substrate including a main surface and a polarization axis direction having a tilt angle with respect to the main surface, an IDT electrode provided on the main surface, and at least one line on the main surface and between an end edge of the main surface and the IDT electrode. A relationship a≦316|cos(θ)|μm is satisfied where a denotes a distance from the end edge of the main surface to the IDT electrode and b≧28 μm where a dimension of the line along a direction connecting the end edge to the IDT electrode is defined as a width, b denotes the width of the line when one line is provided, and b denotes the sum of the widths of multiple lines when the multiple lines are provided.

FILTER AND MULTIPLEXER
20170373668 · 2017-12-28 · ·

A filter includes: one or more series resonators connected in series between an input terminal and an output terminal, the one or more series resonators including a series resonator located closest to the output terminal, the series resonator located closest to the output terminal having a resonant frequency that is 99.6% or less of or 102.2% or greater of a center frequency of a passband; one or more parallel resonators connected in parallel between the input terminal and the output terminal; and an inductor connected in parallel to the series resonator located closest to the output terminal.

PIEZOELECTRIC THIN FILM RESONATOR, FILTER, AND MULTIPLEXER

A piezoelectric thin film resonator includes: a substrate; a piezoelectric film located on the substrate; lower and upper electrodes facing each other across at least a part of the piezoelectric film; a first insertion layer located between the lower and upper electrodes and located in at least a part of an outer peripheral region within a resonance region in which the lower and upper electrodes face each other across the piezoelectric film, the first insertion layer being not located in a center region of the resonance region; and a second insertion layer located between the lower and upper electrodes and located in at least a part of the outer peripheral region, the second insertion layer being not located in the center region, a position of an edge of the second insertion layer being different from a position of an edge of the first insertion film in the resonance region.

ACOUSTIC WAVE DEVICE

An acoustic wave device includes: a piezoelectric thin film resonator that is connected between a first node and a second node; and a resonant circuit that is connected in parallel with the piezoelectric thin film resonator between the first node and the second node, and has a resonant frequency f0 that meets a condition of 2×fa×0.92≦f0 where fa represents an antiresonant frequency of the piezoelectric thin film resonator.

ACOUSTIC WAVE DEVICE
20170353173 · 2017-12-07 · ·

An acoustic wave device includes: a support substrate; a first piezoelectric substrate bonded to a first principal surface of the support substrate, the first piezoelectric substrate being a single crystal substrate, a first acoustic wave resonator located on an opposite surface of the first piezoelectric substrate from a surface to which the support substrate is bonded, the first acoustic wave resonator including an IDT; a second piezoelectric substrate bonded to a second principal surface of the support substrate opposite from the first principal surface, the second piezoelectric substrate being a single crystal substrate; and a second acoustic wave resonator located on an opposite surface of the second piezoelectric substrate from a surface to which the support substrate is bonded, the second acoustic wave resonator including an IDT.

Filter device
11677382 · 2023-06-13 · ·

A filter device includes a first path, a second path, and a capacitor. The first path includes at least one ladder filter circuit and connects a first terminal and a second terminal. The at least one ladder filter circuit includes a parallel arm resonator connected to a ground terminal. The second path includes a grounded resonator and is connected in parallel with any of the at least one ladder filter circuit. One end of the capacitor is connected to the second path, and the other end of the capacitor is connected to a third path which connects the parallel arm resonator and the ground terminal.

BAW component, lamination for a BAW component, and method for manufacturing a BAW component
09831851 · 2017-11-28 · ·

A BAW component, a lamination for a BAW component, and a method for manufacturing a BAW component are provided. A lamination for a BAW component includes a first layer with a first piezoelectric material and a second layer with a second piezoelectric material that is different than the first piezoelectric material. The first and the second piezoelectric material can be Sc doped AlN and AlN, respectively.

ACOUSTIC WAVE DEVICES WITH COMMON CERAMIC SUBSTRATE
20220368311 · 2022-11-17 ·

An acoustic wave component is disclosed. The acoustic wave component can include a bulk acoustic wave resonator and a surface acoustic wave device. The bulk acoustic wave resonator can include a first portion of a ceramic substrate, a first piezoelectric layer positioned on the ceramic substrate, and electrodes positioned on opposing sides of the first piezoelectric layer. The surface acoustic wave device can include a second portion of the ceramic substrate, a second piezoelectric layer positioned on the ceramic substrate, and an interdigital transducer electrode on the second piezoelectric layer.

Recess frame structure for a bulk acoustic wave resonator

A film bulk acoustic wave resonator (FBAR) includes a piezoelectric film disposed in a central region defining a main active domain in which a main acoustic wave is generated during operation, and in recessed frame regions disposed laterally on opposite sides of the central region. The piezoelectric film disposed in the recessed frame regions includes a greater concentration of defects than a concentration of defects in the piezoelectric film disposed in the central region.