A semiconductor device includes: a first input to which an input signal is input; a second input to which a reference signal is input; and a comparison stage which includes a current source connected to a first potential and first and second current path parts connected between the current source and a second potential different from the first potential and performing a comparison operation in response to the input signal and the reference signal, wherein the first and second current path parts respectively include first and second input circuits which are connected to the current source and first and second load circuits which are connected between the second potential and the first and second input circuits, wherein the first input circuit includes a first signal transistor and a first reference transistor, and wherein the second input circuit includes a second signal transistor and a second reference transistor.

For example, a signal transmission device includes a transmitter provided in a primary circuit system and configured to generate a transmission signal according to an input signal; at least one first isolating element configured to constitute a first signal transmission path for transmission of the transmission signal from the primary circuit system to the secondary circuit system; at least one second isolating element configured to constitute a second signal transmission path, different from the first signal transmission path, for transmission of the transmission signal from the primary circuit system to the secondary circuit system; and a receiver provided in the secondary circuit system and configured to feed a first reception signal and a second reception signal output respectively from the first and second isolating elements to a logic circuit to generate a single output signal.

One example of the present disclosure is an integrated circuit (IC). The IC includes an inverter with an input and an output, a clock transmission gate coupled to the output of the inverter; and a plurality of storage cells. The clock transmission gate is coupled to each of the plurality of storage cells, wherein each of the plurality of storage cells comprises a plurality of nodes arranged based on a minimum spacing.

One example of the present disclosure is an integrated circuit (IC). The IC includes an inverter with an input and an output, a clock transmission gate coupled to the output of the inverter; and a plurality of storage cells. The clock transmission gate is coupled to each of the plurality of storage cells, wherein each of the plurality of storage cells comprises a plurality of nodes arranged based on a minimum spacing.

A clock generation circuit, a latch using same, and a computing device are provided. The clock generation circuit includes an input end, configured to input a pulse signal; a first output end, configured to output a first clock signal; a second output end, configured to output a second clock signal; and an input drive circuit, a latch circuit, an edge shaping circuit, a feedback delay circuit, and an output drive circuit, where the input drive circuit, the latch circuit, the edge shaping circuit, the feedback delay circuit, and the output drive circuit are sequentially connected between the input end and the first output end as well as the second output end in series. A clock pulse can be effectively shaped, the use of a clock buffer can be reduced, and the correctness and accuracy of data transmission and latching can be improved.

A clock generation circuit, a latch using same, and a computing device are provided. The clock generation circuit includes an input end, configured to input a pulse signal; a first output end, configured to output a first clock signal; a second output end, configured to output a second clock signal; and an input drive circuit, a latch circuit, an edge shaping circuit, a feedback delay circuit, and an output drive circuit, where the input drive circuit, the latch circuit, the edge shaping circuit, the feedback delay circuit, and the output drive circuit are sequentially connected between the input end and the first output end as well as the second output end in series. A clock pulse can be effectively shaped, the use of a clock buffer can be reduced, and the correctness and accuracy of data transmission and latching can be improved.

Examples of input stages of circuits are configured to reduce both negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) in PMOS transistors therein. Current-switched PMOS source follower transistors and a low-side NMOS differential pair is used to process a lower range of a rail-to-rail input signal range of a circuit. A PMOS source follower is disposed between the positive input of the circuit and the positive input of the low-side NMOS differential pair. Another PMOS source follower is disposed between the negative input of the circuit and the negative input of the low-side NMOS differential pair. Various arrangements are provided for generating and maintaining the bias currents of the two PMOS source followers to be approximately the same through the entire lower input signal range.

Examples of input stages of circuits are configured to reduce both negative-bias temperature instability (NBTI) and positive-bias temperature instability (PBTI) in PMOS transistors therein. Current-switched PMOS source follower transistors and a low-side NMOS differential pair is used to process a lower range of a rail-to-rail input signal range of a circuit. A PMOS source follower is disposed between the positive input of the circuit and the positive input of the low-side NMOS differential pair. Another PMOS source follower is disposed between the negative input of the circuit and the negative input of the low-side NMOS differential pair. Various arrangements are provided for generating and maintaining the bias currents of the two PMOS source followers to be approximately the same through the entire lower input signal range.

A flip-flop includes a first master latch in a first row, a second master latch in a second row, a first slave latch in the first row, and a second slave latch in the second row. The first master latch and the second master latch are adjacently disposed in the second direction, and the first slave latch and the second slave latch are adjacently disposed in the second direction.

A high-speed comparator circuit is provided. The circuit includes an amplifier portion, a latch portion, and a negative capacitance portion. The amplifier portion includes an input coupled to receive an analog signal and an output. The latch portion is coupled to the amplifier portion. The latch portion is configured to provide at the output a digital value based on the analog signal. The negative capacitance portion is coupled to the output. The negative capacitance portion is configured to cancel parasitic capacitance coupled at the first output.