Patent classifications
H03K3/03
Voltage Controlled Oscillator and Control Method Thereof, P2P Interface Circuit, Electronic Device
This disclosure provides a voltage controlled oscillator and a control method thereof, a P2P interface circuit, an electronic device, and relates to the field of voltage controlled oscillation technology. The voltage controlled oscillator includes N stages of delay units, and the delay unit of each stage includes: a first inverter, a second inverter, a third inverter, and a fourth inverter; both the second inverter and the third inverter are electrically connected to a frequency control terminal, and whether to activate the second inverter and the third inverter is controlled by the frequency control terminal.
Oscillator closed loop frequency control
An electronic device comprises a regulator, and an oscillator and a resistor coupled to the regulator. The electronic device further comprises a feedback controller that includes a differential amplifier coupled between the oscillator, the resistor, and the regulator. The feedback controller is configured to apply a control voltage to the regulator in response to a resistor voltage upon the resistor and an oscillator voltage upon the oscillator. The feedback controller can be coupled to control a substantially equal voltage upon the resistor and the oscillator.
Process corner detection circuit and process corner detection method
The present disclosure provides a process corner detection circuit and a process corner detection method. The process corner detection circuit includes: M ring oscillators disposed inside a chip, M≥1, where types of N-type transistors in the M ring oscillators are not exactly the same, and types of P-type transistors in the M ring oscillators are not exactly the same; transistor types of the M ring oscillators include all transistor types used in the chip; the ring oscillators include symmetric ring oscillators and asymmetric ring oscillators; types of N-type transistors and P-type transistors in the symmetric ring oscillators are the same; and types of N-type transistors and P-type transistors in the asymmetric ring oscillators are different.
Circuit Apparatus and Oscillator
A circuit apparatus includes an oscillation circuit that generates an oscillation signal, a first buffer circuit that outputs a first clock signal based on the oscillation signal, a second buffer circuit that outputs a second clock signal based on the first clock signal, a first terminal electrically couplable to a first node via which the first buffer circuit outputs the first clock signal, and a second terminal electrically coupled to a second node via which the second buffer circuit outputs the second clock signal, and the rise period of the first clock signal is shorter than the rise period of the second clock signal.
Circuit Apparatus and Oscillator
A circuit apparatus includes an oscillation circuit that generates an oscillation signal, a first buffer circuit that outputs a first clock signal based on the oscillation signal, a second buffer circuit that outputs a second clock signal based on the first clock signal, a first terminal electrically couplable to a first node via which the first buffer circuit outputs the first clock signal, and a second terminal electrically coupled to a second node via which the second buffer circuit outputs the second clock signal, and the rise period of the first clock signal is shorter than the rise period of the second clock signal.
CIRCUIT STRUCTURE TO MEASURE OUTLIERS OF PROCESS VARIATION EFFECTS
Embodiments of the invention provide for integrated circuits for testing one or more transistors for process variation effects. According to an embodiment, the integrated circuit can include: a plurality of ring oscillator macro circuits, wherein each ring oscillator macro circuit includes two ring oscillators, a first multiplexer, and a first divide-by-two circuit; a multiplexer stage; a divide-by-two circuit stage; a second multiplexer; a second divide-by-two circuit; and frequency measurement circuit. According to another embodiment, the integrated circuit can include: a first shift register including a plurality of devices-under-test; a second shift register including a plurality of static latches; a first multiplexer configured to receive outputs from each of the plurality of DUTs; a second multiplexer configured to receive outputs from each of the plurality of static latches; and a comparator configured to compare an output from the first multiplexer with an output from the second multiplexer.
GATED RING OSCILLATOR LINEARIZATION
Aspects of the disclosure provide for an apparatus comprising a time-to-digital converter (TDC) and a processor coupled to the TDC. In some examples, the TDC may be configured to receive a signal and generate a measurement result indicating a time between start and stop events of the signal. The processor may be configured to receive the measurement result, compare the measurement result to a target value, and determine a non-linearity model configured to correct a variance of the measurement result from the target value.
Circuit device and oscillator
A circuit device includes an oscillation circuit generating an oscillation signal by oscillating a vibrator, a temperature sensor circuit performing an intermittent operation, a logic circuit performing temperature compensation processing based on an output of the temperature sensor circuit, and a power supply circuit supplying power to the oscillation circuit. The oscillation circuit is disposed in a circuit region, the temperature sensor circuit and the logic circuit are disposed in a circuit region, and the power supply circuit is disposed in a circuit region, which is positioned between the circuit region and the circuit region.
Circuit device and oscillator
A circuit device includes an oscillation circuit generating an oscillation signal by oscillating a vibrator, a temperature sensor circuit performing an intermittent operation, a logic circuit performing temperature compensation processing based on an output of the temperature sensor circuit, and a power supply circuit supplying power to the oscillation circuit. Further, the logic circuit or the power supply circuit is disposed between the oscillation circuit and the temperature sensor circuit.
OSCILLATOR AND CLOCK GENERATION CIRCUIT
Embodiments of the present application provide an oscillator and a clock generation circuit. The oscillator includes: a first ring topology, including a plurality of first inverters connected end to end, and configured to transmit an oscillation signal at a first transmission speed; and a second ring topology, including a plurality of second inverters connected end to end, and configured to transmit the oscillation signal at a second transmission speed, wherein the present application, the first ring topology is electrically connected to the second ring topology, and the second transmission speed is less than the first transmission speed.