A circuit includes a control inverter, a first latch circuit, and a second latch circuit. The control inverter receives a control signal to generate a reverse control signal. The first latch circuit is activated by the reverse control signal to convert a first input signal ranging from the first supply voltage to the ground into a first output signal ranging from the second supply voltage to the ground. The second latch circuit is activated by the reverse control signal to convert a second input signal ranging from a first supply voltage to the ground into a second output signal ranging from the second supply voltage to the ground. The first supply voltage and the second supply voltage are different.

A circuit includes a control inverter, a first latch circuit, and a second latch circuit. The control inverter receives a control signal to generate a reverse control signal. The first latch circuit is activated by the reverse control signal to convert a first input signal ranging from the first supply voltage to the ground into a first output signal ranging from the second supply voltage to the ground. The second latch circuit is activated by the reverse control signal to convert a second input signal ranging from a first supply voltage to the ground into a second output signal ranging from the second supply voltage to the ground. The first supply voltage and the second supply voltage are different.

Circuits, systems, and methods are described herein for increasing a hold time of a master-slave flip-flop. A flip-flop includes circuitry configured to receive a scan input signal and generate a delayed scan input signal; a master latch configured to receive a data signal and the delayed scan input signal; and a slave latch coupled to the master latch, the master latch selectively providing one of the data signal or the delayed scan input signal to the slave latch based on a scan enable signal received by the master latch.

This application relates to a synchronization circuit for synchronizing signals used in a threshold implementation operation process performing in an S-box of an encryption circuit. In one aspect, the synchronization circuit includes an enable signal generator configured to generate an enable signal. The synchronization circuit may also include a synchronization unit included in an encryption circuit and located inside an S-box that performs a threshold implementation operation that calculates by dividing bits of an input signal into bits equal to or greater than the number of bits of the input signal. The synchronization unit may be configured to synchronize signals used in a threshold implementation operation process based on the generated enable signal.

This application relates to a synchronization circuit for synchronizing signals used in a threshold implementation operation process performing in an S-box of an encryption circuit. In one aspect, the synchronization circuit includes an enable signal generator configured to generate an enable signal. The synchronization circuit may also include a synchronization unit included in an encryption circuit and located inside an S-box that performs a threshold implementation operation that calculates by dividing bits of an input signal into bits equal to or greater than the number of bits of the input signal. The synchronization unit may be configured to synchronize signals used in a threshold implementation operation process based on the generated enable signal.

Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.

A semiconductor device includes a flip flop cell. The flip flop cell is formed on a semiconductor substrate, includes a flip flop circuit, and comprises a scan mux circuit, a master latch circuit, a slave latch circuit, a clock driver circuit, and an output circuit. Each of the scan mux circuit, the master latch circuit, the slave latch circuit, the clock driver circuit, and the output circuit includes a plurality of active devices which together output a resulting signal for that circuit based on inputs, is a sub-circuit of the flip flop circuit, and occupies a continuously-bounded area of the flip flop circuit from a plan view. At least a first sub-circuit and a second sub-circuit of the sub-circuits overlap from the plan view in a first overlap region, the first overlap region including part of a first continuously-bounded area for the first sub-circuit and part of a second continuously-bounded area for the second sub-circuit.

An error detection and correction method is provided. The method includes: when a pipeline stage error is detected, correcting the pipeline stage error; when it is determined that a plurality of cascaded pipeline stage circuits have continuous pipeline stage errors, stopping all operations of all pipeline stage circuits; flushing the data of the pipeline stage circuits; and re-processing the data of the pipeline stage circuits at a downclocked frequency.

Provided is an integrated circuit. The integrated circuit includes a plurality of clock generators configured to respectively generate a plurality of clock signals, a plurality of logic circuits configured to operate in synchronization with the plurality of clock signals, and controller circuitry configured to identify meta-stability information based on frequencies of the plurality of clock signals, and configured to control at least one clock generator so that at least one of the plurality of clock signals is randomly delayed in response to the meta-stability information.

Provided is an integrated circuit. The integrated circuit includes a plurality of clock generators configured to respectively generate a plurality of clock signals, a plurality of logic circuits configured to operate in synchronization with the plurality of clock signals, and controller circuitry configured to identify meta-stability information based on frequencies of the plurality of clock signals, and configured to control at least one clock generator so that at least one of the plurality of clock signals is randomly delayed in response to the meta-stability information.