A reconfigurable all-digital temperature sensor includes a NAND gate and several delay units, the NAND gate comprises two input terminals and an output terminal, one input terminal is used for external starting control signal; a plurality delay units are connected in series, the input end of the first delay unit is connected to the output terminal of the NAND gate, and the output end of the last delay unit is connected to another input terminal of the NAND gate, thereby forming a ring oscillator structure; each delay unit includes a leakage-based inverter and a Schmitt trigger, and the output end of the leakage-based inverter is connected to the input end of the Schmitt trigger. The reconfigurable all-digital temperature sensor can realize the conversion of temperature-leakage-frequency based on the ring oscillator structure in the temperature range of 40125 C., thereby reducing the design complexity and achieving high accuracy.

A noise detection circuit includes a first delay circuit which has a propagation delay of a first delay time when a signal propagates therethrough and a second delay circuit which has a propagation delay of a second delay time when the signal propagates therethrough, and outputs, based on a sum of the first delay time and the second delay time, a detection result indicating the magnitude of noise on power supply voltage applied to the first delay circuit and the second delay circuit. A control unit controls, based on the detection result, a frequency of a clock signal supplied to a circuit unit to which the power supply voltage is applied and the second delay time in such a manner as to exhibit an opposite behavior to a change in the first delay time induced by temperature.

An example delay circuit is described that includes an input node to receive a first signal, a first circuit path, a second circuit path, an output buffer, and an output node. The first circuit path includes at least one first buffer and a first array of switches. The second circuit path includes at least one second buffer and a second array of switches. The output buffer receives a mixed output of the first circuit path and the second circuit path. The output node transmits a second signal equivalent to the first signal with a programmed delay.

Apparatus and associated methods relating to a switch leakage compensation delay circuit include a compensating transistor configured to passively bypass a leakage current around a capacitor that connects in series with a control transistor. In an illustrative example, the capacitor and the compensating transistor may be connected in parallel between a first node and a second node. The compensating transistor gate may be tied, for example, directly to its source and to the second node. The control transistor may connect its drain to the second node. When a control signal turns off the control transistor, a leakage current of the control transistor may be supplied from a leakage current of the compensating transistor such that the voltage across the capacitor may be maintained substantially constant. The delay circuit may advantageously mitigate the capacitor's voltage droop to reduce clock time skew, for example, in low speed interleaved ADC operation.

The present disclosure relates to dynamically updating a delay line code. A method for updating the delay line code may include receiving a strobe input at a coarse delay line. The method may further include receiving a coarse delay cell code at the coarse delay line. The method may also include generating a first clock path based upon a first chain of interleaved logic gates included within the coarse delay line. The method may additionally include generating a second clock path based upon a second chain of interleaved logic gates included within the coarse delay line. The method may further include receiving the first clock path, and the second clock path, and a fine delay cell code at a fine delay cell. The method may also include generating a strobe delayed output based upon the first clock path, and the second clock path, and the fine delay code.

A resistor-capacitor (RC) delay circuit includes a first capacitor at a first level, a resistor at a second level and a second capacitor at a third level. The second capacitor is electrically connected in parallel with the first capacitor. The second capacitor has a footprint within a footprint of the first capacitor. The resistor is coupled in shunt with the first capacitor and the second capacitor.

A method for controlling a load-current zero-crossing of a switching regulator having a high-side switch and a low-side switch includes detecting, by a spike detection circuit, a presence of a spike on an output voltage of the switching regulator, determining, by the spike detection circuit, in the event that a spike is present, whether the spike is a positive spike or a negative spike, and adjusting a turn-off timing of the low-side switch based on a determination result.

A system includes a first park circuit having a signal input, an output, and a control input. The system also includes a first signal path having an input and an output, wherein the input of the first signal path is coupled to the output of the first park circuit. The system also includes a second park circuit having a signal input, an output, and a control input, wherein the signal input of the second park circuit is coupled to the output of the first signal path. The system further includes a second signal path having an input and an output, wherein the input of the second signal path is coupled to the output of the second park circuit.

Current-starving in tunable-length delay (TLD) circuits in adaptive clock distribution (ACD) systems for compensating voltage droops in clocked integrated circuits (ICs) is disclosed. Voltage droops slow propagation of signals in clocked circuits. However, clock delay circuits in a TLD circuit increase a clock period by increasing a clock delay in response to a voltage droop. In large power distribution networks (PDN), impedance can delay and reduce the magnitude of voltage droops experienced at the TLD circuit. If the voltage droop at the TLD circuit is smaller than at the clocked circuit, then the clock period isn't stretched enough to compensate the slowed clocked circuit. A current-starved TLD circuit starves the clock delay circuits of current in response to a voltage droop indication, which further increases the clock signal delay, and further stretches the clock period to overcome a larger voltage droop in clocked circuits in other areas of the IC.

A resistor-capacitor (RC) delay circuit includes a first capacitor at a first level, a resistor at a second level and a second capacitor at a third level. The second capacitor is electrically connected in parallel with the first capacitor. The second capacitor has a footprint within a footprint of the first capacitor. The resistor is coupled in shunt with the first capacitor and the second capacitor.