A slew rate control device for controlling a slew rate, includes: a setting part configured to set a voltage value used to determine the slew rate, and a control part configured to control the slew rate, based on the voltage value set by the setting part, so that the slew rate becomes slower as an output voltage of a power supply approaches from a transition starting voltage to a target voltage.

A slew rate control device for controlling a slew rate, includes: a setting part configured to set a voltage value used to determine the slew rate, and a control part configured to control the slew rate, based on the voltage value set by the setting part, so that the slew rate becomes slower as an output voltage of a power supply approaches from a transition starting voltage to a target voltage.

Examples may include techniques for dual-range clock duty cycle tuning of a clock signal used for an input/output data bus. A clock duty cycle of the clock signal is monitored to determine whether the clock duty cycle falls within a threshold of a 50 percent duty cycle. A dual-range tuning is then implemented until the clock duty cycle of the clock signal falls within the threshold.

Examples may include techniques for dual-range clock duty cycle tuning of a clock signal used for an input/output data bus. A clock duty cycle of the clock signal is monitored to determine whether the clock duty cycle falls within a threshold of a 50 percent duty cycle. A dual-range tuning is then implemented until the clock duty cycle of the clock signal falls within the threshold.

A method for providing a stitchable clock mesh, a dual operation mode system, and a method for providing a master clock stratum are, in turn, provided for a 3D chip stack having two or more strata. The method for providing a stitchable clock mesh includes providing, by at least one clock mesh disposed on each stratum and having multiple sectors, a global clock signal to various chip locations. The method further includes collecting, by mesh data sensors on each stratum, mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The method also includes selectively performing, by joining circuitry, a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.

A method for providing a stitchable clock mesh, a dual operation mode system, and a method for providing a master clock stratum are, in turn, provided for a 3D chip stack having two or more strata. The method for providing a stitchable clock mesh includes providing, by at least one clock mesh disposed on each stratum and having multiple sectors, a global clock signal to various chip locations. The method further includes collecting, by mesh data sensors on each stratum, mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The method also includes selectively performing, by joining circuitry, a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.

A PWM signal generator circuit includes a multiphase clock generator that generates a number n of phase-shifted clock phases having the same clock period and being phase shifted by a time corresponding to a fraction 1/n of the clock period. The PWM signal generator circuit determines for each switch-on duration first and second integer numbers, and for each switch-off duration third and fourth integer numbers. The first integer number is indicative of the integer number of clock periods of the switch-on duration and the second integer number is indicative of the integer number of the additional fractions 1/n of the clock period of the switch-on duration. The third integer number is indicative of the integer number of clock periods of the switch-off duration, and the fourth integer number is indicative of the integer number of the additional fractions 1/n of the clock period of the switch-off duration.

A PWM signal generator circuit includes a multiphase clock generator that generates a number n of phase-shifted clock phases having the same clock period and being phase shifted by a time corresponding to a fraction 1/n of the clock period. The PWM signal generator circuit determines for each switch-on duration first and second integer numbers, and for each switch-off duration third and fourth integer numbers. The first integer number is indicative of the integer number of clock periods of the switch-on duration and the second integer number is indicative of the integer number of the additional fractions 1/n of the clock period of the switch-on duration. The third integer number is indicative of the integer number of clock periods of the switch-off duration, and the fourth integer number is indicative of the integer number of the additional fractions 1/n of the clock period of the switch-off duration.

A memory controller according to an example embodiment of the present disclosure may include a duty ratio adjusting circuit which generates adjusted clock signals in response to a clock signal for strobing data, and a selection circuit which outputs one of the clock signal and the adjusted clock signals to a memory device as an output clock signal. Each of the adjusted clock signals may have a different duty ratio.

A memory controller according to an example embodiment of the present disclosure may include a duty ratio adjusting circuit which generates adjusted clock signals in response to a clock signal for strobing data, and a selection circuit which outputs one of the clock signal and the adjusted clock signals to a memory device as an output clock signal. Each of the adjusted clock signals may have a different duty ratio.