A vibration device includes a base including a semiconductor substrate and through electrodes that pass through the portion between first and second surfaces of the semiconductor substrate, and a vibrator fixed to the first surface via an electrically conductive joining member. The following components are placed at the second surface: an oscillation circuit that is electrically coupled to the vibrator via the through electrodes and generates an oscillation signal by causing the vibrator to oscillate, a temperature sensor circuit, a temperature compensation circuit that performs temperature compensation on the oscillation signal, and an output buffer circuit that outputs a clock signal based on the oscillation signal. Dsx1<Dbx1, a distance between the output buffer circuit and one of the through electrodes is Dbx1, a distance between the temperature sensor circuit and the other through electrode is Dsx1.

A watch includes a chargeable power supply, a crystal oscillation circuit including a crystal oscillator and an oscillation circuit and configured to stop oscillating when a power supply voltage falls below an oscillation stop voltage and to start oscillating when the power supply voltage exceeds an oscillation start voltage, which is higher than the oscillation stop voltage, and a divider circuit that outputs a reference signal by dividing an oscillation signal output from the oscillation circuit. The watch also includes a temperature compensation circuit that performs a temperature compensation function operation that compensates for variation of the reference signal due to a temperature, a first voltage detection circuit that detects that the power supply voltage exceeded a first voltage that is set higher than the oscillation start voltage, and a control circuit that starts the temperature compensation function operation of the temperature compensation circuit when the first voltage detection circuit detects that the power supply voltage exceeded the first voltage, and subsequently continues the temperature compensation function operation even when the power supply voltage falls below the first voltage.

Provided is a semiconductor integrated circuit including an oscillation circuit configured to output an oscillation signal, a heater configured to heat the oscillation circuit, a temperature sensor configured to detect a temperature of the oscillation circuit, and a nonvolatile memory configured to store temperature correction data. The oscillation circuit controls a frequency of the oscillation signal based on an output signal of the temperature sensor and the temperature correction data.

The present disclosure provides a real-time correction method for an Oven Controlled Crystal (Xtal) Oscillator (OCXO) and an electromagnetic receiver. The real-time correction method for an OCXO includes: performing frequency multiplication on a reference clock signal to generate a first measurement signal and a second measurement signal; identifying a rising edge of each pulse per second on the basis of the first measurement signal to obtain a gate time T; obtaining a frequency of the second measurement signal according to the gate time T; and adjusting a frequency of the reference clock signal at least on the basis that an absolute value of a difference between two adjacent frequencies obtained of the second measurement signal is greater than a standard frequency difference.

Provided is a semiconductor integrated circuit including an oscillation circuit configured to output an oscillation signal, a heater configured to heat the oscillation circuit, a temperature sensor configured to detect a temperature of the oscillation circuit, and a nonvolatile memory configured to store temperature correction data. The oscillation circuit controls a frequency of the oscillation signal based on an output signal of the temperature sensor and the temperature correction data.

A vibrating element includes a quartz crystal substrate having a first vibrating portion having a pair of first excitation electrodes, a second vibrating portion having a pair of second excitation electrodes, and a third vibration portion having a pair of third excitation electrodes, in which at least one second excitation electrode of the pair of second excitation electrodes is formed into a first inclined surface inclined with respect to both main surfaces of the quartz crystal substrate, and at least one third excitation electrode of the pair of third excitation electrodes is formed into a second inclined surface inclined with respect to both the main surfaces and the first inclined surface.

A shared pair of input/output cells configured to be able to be connected to a first external resonator or a second external resonator. A first oscillator and a second oscillator are coupled to the shared pair input/output cells by a switching circuit. The switching circuit is configured to be able to connect either the first oscillator or the second oscillator to the pair of input/output cells.

An oscillator assembly includes a scribe seal, an oscillator circuit, and a calibration circuit. The oscillator circuit includes an output. The calibration circuit is coupled to the oscillator circuit. The calibration circuit includes a reference frequency terminal, a conductor coupled to the reference frequency terminal, and an oscillator input terminal. The conductor extends to an edge of the oscillator circuit assembly and penetrates the scribe seal. The oscillator input terminal is coupled to the output of the oscillator circuit.

An embodiment of the present disclosure relates to a device comprising an electronic circuit; an oscillation circuit comprising a quartz crystal, configured to provide a clock signal to the electronic circuit; and a heater configured to increase the temperature of the quartz crystal.

A method for temperature compensation of a test tone used in meter verification is provided. The method uses a drive amplifier to provide a drive signal to a drive circuit, wherein the drive circuit includes a drive mechanism in a meter assembly of a vibratory meter. The method measures a first maximum amplitude of the drive signal at a first temperature of the drive circuit, and measures a second maximum amplitude of the drive signal at a second temperature of the drive circuit. The method also determines a maximum amplitude-to-temperature relationship for the drive circuit based on the first maximum amplitude at the first temperature and the second maximum amplitude at the second temperature.